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rev. 1.2 12/14 copyright ? 2014 by silicon laboratories SI1132 SI1132 uv i ndex and a mbient l ight s ensor ic with i 2 c i nterface features applications description the SI1132 is a low-power, ultraviolet (uv) index, and ambient light sensor with i 2 c digital interface and programmable-event interrupt output. this sensor ic includes an analog-to -digital converter, integrated high- sensitivity visible and infrared photodiodes, and digital signal processor. the SI1132 offers excellent performance under a wide dynamic range and a variety of light sources including direct sunlight. the SI1132 can also work under dark glass covers. the photodiode response and associated digital conversion circuitry provide excellent immunity to artificial light flicker noise and na tural light flutter noise. the SI1132 devices are provided in a 10-lead 2x2 mm qfn package and are capable of operation from 1.71 to 3.6 v over the ?40 to +85 c temperature range. ? integrated uv index sensor ?? digital uv index register that can be read through i 2 c interface ?? factory calibration to address part-to-part variation ? integrated ambient light sensor ?? 100 mlx resolution possible, allowing operation under dark glass ?? 1 to 128 klx dynamic range possible across two adc range settings ?? accurate lux measurements with ir correction algorithm ? industry's lowest power consumption ?? 1.71 to 3.6 v supply voltage ?? < 500 na standby current ?? internal and external wake support ?? built-in voltage supply monitor and power-on reset controller ? i 2 c serial communications ?? up to 3.4 mbps data rate ?? slave mode hardware address decoding ? small-outline 10-lead 2x2 mm qfn ? temperature range ?? ?40 to +85 c ? fitness/health electronics ? smart watches ? smartphone handsets ? ta b l e ts ? portable consumer electronics ? display-backlighting control pin assignments v dd v dd scl gnd int 2 3 4 9 8 7 6 qfn-10 v dd v dd sda 1 dnc 10 5 dnc
SI1132 2 rev. 1.2 functional block diagram figure 1. SI1132 application visible vdd sda scl regulator i 2 c gnd int infrared registers a m u x adc temp filter oscillator digital sequencer & control logic sda scl vdd int vdd gnd vdd vdd SI1132 3.3 v 0.1 uf host sda scl int
SI1132 rev. 1.2 3 t able of c ontents 1. electrical specificat ions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4 1.1. performance tables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4 1.2. typical performance graphs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8 2. functional description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9 2.1. introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9 2.2. ambient light . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9 2.3. ultraviolet (uv) i ndex . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 2.4. host interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13 3. operational modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 3.1. off mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15 3.2. initialization mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 5 3.3. standby mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 3.4. forced conversion mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15 3.5. autonomous operation mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16 4. programming guide . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .17 4.1. command and response stru cture . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 4.2. command protocol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 4.3. resource summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 4.4. signal path software model . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 4.5. i 2 c registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 4.6. parameter ram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .35 5. pin descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 6. ordering guide . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43 7. package outline: 10-pin qfn . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44 8. suggested pcb land pattern . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46 document change list . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48 contact information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .49
SI1132 4 rev. 1.2 1. electrical specifications 1.1. performance tables table 1. recommended operating conditions parameter symbol test condition min typ max unit v dd supply voltage v dd 1.71 ? 3.6 v v dd off supply voltage v dd_off off mode ?0.3 1.0 v v dd supply ripple voltage v dd =3.3v 1khz?10mhz ??50mvpp operating temperature t ?40 25 85 c scl, sda, input high logic voltage i 2 c vih v dd x0.7 ? v dd v scl, sda input low logic voltage i 2 c vil 0?v dd x0.3 v operation under direct sunlight edc ? ? 128 klx start-up time v dd above 1.71 v 25 ? ? ms table 2. performance characteristics 1 parameter symbol test condition min typ max unit i dd off mode i off v dd < v dd_off (leakage from scl, sda, and int not included) ? 240 1000 na i dd standby mode i sb no als conversions no i 2 c activity v dd =1.8v ?150500na i dd standby mode i sb no als conversions no i 2 c activity v dd =3.3 v ?1.4?a i dd actively measuring i active v dd =3.3v ? 4.3 5.5 ma int, scl, sda leakage current v dd =3.3v ?1 ? 1 a actively measuring time 2 uv or als vis + als ir ? 285 ? s notes: 1. unless specifically stated in "conditions", electrical data assumes ambient light levels < 1 klx. 2. represents the time during which the device is drawing a current equal to i active for power estimation purposes. assumes default settings.
SI1132 rev. 1.2 5 visible photodiode response sunlight als_vis_adc_gain=0 vis_range=0 ? 0.282 ? adc counts/ lux 2500k incandescent bulb als_vis_adc_gain=0 vis_range=0 ? 0.319 ? adc counts/ lux ?cool white? fluorescent als_vis_adc_gain=0 vis_range=0 ? 0.146 ? adc counts/ lux infrared led (875 nm) als_vis_adc_gain=0 vis_range=0 ? 8.277 ? adc counts. m 2 /w small infrared photodiode response sunlight als_ir_adc_gain=0 ir_range=0 ? 2.44 ? adc counts/ lux 2500k incandescent bulb als_ir_adc_gain=0 ir_range=0 ? 8.46 ? adc counts/ lux ?cool white? fluorescent als_ir_adc_gain=0 ir_range=0 ? 0.71 ? adc counts/ lux infrared led (875 nm) als_ir_adc_gain=0 ir_range=0 ? 452.38 ? adc counts. m 2 /w visible photodiode noise all gain settings ? 7 ? adc counts rms small infrared photodiode noise all gain settings ? 1 ? adc counts rms table 2. performance characteristics 1 (continued) parameter symbol test condition min typ max unit notes: 1. unless specifically stated in "conditions", electrical data assumes ambient light levels < 1 klx. 2. represents the time during which the device is drawing a current equal to i active for power estimation purposes. assumes default settings.
SI1132 6 rev. 1.2 visible photodiode offset drift vis_range=0 als_vis_adc_gain=0 als_vis_adc_gain=1 als_vis_adc_gain=2 als_vis_adc_gain=3 als_vis_adc_gain=4 als_vis_adc_gain=5 als_vis_adc_gain=6 als_vis_adc_gain=7 ? ?0.3 ?0.11 ?0.06 ?0.03 ?0.01 ?0.008 ?0.007 ?0.008 ? adc counts/ c small infrared photodiode offset drift ir_range=0 ir_gain=0 ir_gain=1 ir_gain=2 ir_gain=3 ? ?0.3 ?0.06 ?0.03 ?0.01 ? adc counts/ c scl, sda, int output low voltage v ol i=4ma, v dd > 2.0 v i=4ma, v dd < 2.0 v ? ? ? ? v dd x0. 2 0.4 v v temperature sensor offset 25 c ? 11136 ? adc counts temperature sensor gain ? 35 ? adc counts/ c table 2. performance characteristics 1 (continued) parameter symbol test condition min typ max unit notes: 1. unless specifically stated in "conditions", electrical data assumes ambient light levels < 1 klx. 2. represents the time during which the device is drawing a current equal to i active for power estimation purposes. assumes default settings.
SI1132 rev. 1.2 7 table 3. i 2 c timing specifications parameter symbol min typ max unit clock frequency f scl 95 ? 3400 khz clock pulse width low t low 160 ? ? ns clock pulse width high t high 60 ? ? ns rise time t r 10 ? 40 ns fall time t f 10 ? 40 ns start condition hold time t hd.sta 160 ? ? ns start condition setup time t su.sta 160 ? ? ns input data setup time t su.dat 10 ? ? ns input data hold time t hd.dat 0??ns stop condition setup time t su.sto 160 ? ? ns table 4. absolute maximum limits parameter test condition min typ max unit v dd supply voltage ?0.3 ? 4 v operating temperature ?40 ? 85 c storage temperature ?65 ? 85 c int, scl, sda voltage at v dd =0v, t a < 85 c ?0.5 ? 3.6 v esd rating human body model machine model charged-device model ? ? ? ? ? ? 2 225 2 kv v kv
SI1132 8 rev. 1.2 1.2. typical performance graphs figure 2. als variability with different light sources
SI1132 rev. 1.2 9 2. functional description 2.1. introduction the SI1132 is a uv index and ambient light sensor wh ose operational state is controlled through registers accessible through the i 2 c interface. the host can command the SI1132 to initiate on-demand uv index sensing or ambient light sensing. the host can also place the SI1132 in an autonomous operational state where it performs measurements at set intervals and interrupts the host af ter each measurement is comp leted. this results in an overall system power saving allowing th e host controller to operate longer in its sleep state instead of polling the SI1132. for more details, refer to ?an498: si114x designer?s guide?. 2.2. ambient light the SI1132 has photodiodes capable of measuring both vi sible and infrared light. howe ver, the visible photodiode is also influenced by infrared light. the measurement of illuminance require s the same spectral response as the human eye. if an accurate lux measurement is desired, the extra ir response of the vi sible-light photodiode must be compensated. therefore, to allow the host to make corrections to the infrared light?s influence, the SI1132 reports the infrared light measurement on a separate channel. the separate visible and ir photodiodes lend themselves to a variety of algorithmic solutions. the host can then take these two measurements and run an algorithm to derive an equivalent lux level as perceive d by a human eye. having the ir correction algorithm running in the host a llows for the most flexibility in adjusting for system-dependent variables. for example, if the glass used in the system blocks visibl e light more than infrared light, the ir correction needs to be adjusted. if the host is not making any infrared corrections, th e infrared measurement can be turned off in the chlist parameter. by default, the measurement parameters are optimized for indoor ambient light levels where it is possible to detect light levels as low as 6 lx. for operation under direct sunlight, the adc can be programmed to operate in a high signal operation so that it is possible to measure di rect sunlight without overflowing the 16-bit result. for low-light applications, it is possi ble to increase the adc integration time. normally, the integration time is 25.6 s. by increasing this integration time to 410 s, the adc can detect light levels as low as 1 lx. the adc can be programmed with an integration time as high as 3.28 ms, allowing measurement to 100 mlx light levels. the adc integration time for the visible light ambient measurement can be programmed independently of the adc integration time of the infrared light ambient measur ement. the independent adc parameters allow operation under glass covers having a higher transmit tance to infrared light than visible light. when operating in the lower signal range, or when the integr ation time is increased, it is possible to saturate the adc when the ambient light su ddenly increases. an y overflow condition is report ed in the response register, and the corresponding data registers report a value of 0xffff. based on either of these two overflow indicators, the host can adjust the adc sensitivity. however, the overflow condition is not sticky. if th e light levels return to a range within the capabilities of th e adc, the correspondin g data registers begin to operate normally. the response register will continue to hold the overflow condition until a nop command is rece ived. even if the response register has an overfl ow condition, commands are still accepted and processed. the SI1132 can initiate als measurements either when ex plicitly commanded by the host or periodically through an autonomous process. refer to "3. operational modes" on page 15 for additional details of the SI1132's operational modes.
SI1132 10 rev. 1.2 figure 3. photodiode spectral response to visible and infrared light (indicative)
SI1132 rev. 1.2 11 2.3. ultraviolet (uv) index the uv index is a number linearly relate d to the intensity of sunlight reaching the earth and is weighted according to the cie erythemal action spectrum as shown in figure 4. this weighting is a standardized measure of human skin's response to different wavelengths of sunlight from uvb to uva. the uv index has been standardized by the world health organization and includes a simplified cons umer uv exposure level as shown in figures 5 and 6. figure 4. cie erythemal action spectrum figure 5. uv index scale figure 6. uv levels
SI1132 12 rev. 1.2 to enable uv reading, set the en_uv bit in chlist, and configure ucoef [0:3] to the default values of 0x7b, 0x6b, 0x01, and 0x00. also set the vi s_range and ir_range bits. if the sensor will be under an overlay that is not 100% transmissive to sunlight, contact silicon labs for more inform ation on adjusting these coefficients. typically, after 285 s, aux_data will contain a 16-bit valu e representing 100 times th e sunlight uv index. host software must divide the results from aux_data by 100. the accuracy of uv readings can be improved by using calibration parameters that are programmed into the SI1132 at silicon labs' production fac ilities to adjust for norma l part-to-part variation. the calibration parameters are recovered from the SI1132 by writing command register @ address 0x18 with the value 0x12. when the calibration parameters are recovered, they show up at i 2 c registers 0x22 to 0x2d. these are the same registers used to report the vis, ir, and aux measurements. the use of calibration parameters is documented in the file, si114x_functions.h, which is part of the si114x programmer's toolkit example source code and is downl oadable from silabs.com. the host code is expected to allocate memory for the si114x_cal_s structure. the si114x_calibration routine will then fill it up with the appropriate values. once the calibration parameters have been recovered the routine si114x_set_u coef is used to modify the default values that go into the ucoef0 to uc oef3 uv configuration registers to remove normal part-to-part variation. the typical calibrated uv sensor response vs. calculated ideal uv index is shown in figure 7 for a large database of sunlight spectra from cloudy to sunny days and at various angles of the sun/time of day. figure 7. calibrated uv sensor response vs. calculated ideal uv index (aux_data measurement / 100)
SI1132 rev. 1.2 13 2.4. host interface the host interface to the SI1132 consists of three pins: ? scl ? sda ? int scl and sda are standard open-drain pins as required for i 2 c operation. the SI1132 asserts the int pin to interrupt the host proc essor. the int pin is an open-drain output. a pull-up resistor is needed for proper operation. as an open-dra in output, it can be shared with other open-drain interrupt sources in the system. for proper operation, the SI1132 is expected to fully comple te its initialization mode prio r to any activity on the i 2 c. the int, scl, and sda pins are designed so that it is possible for the SI1132 to en ter the off mode by software command without interfering with normal operation of other i 2 c devices on the bus. the SI1132 i 2 c slave address is 0x60. the SI1132 also responds to the global address (0x00) and the global reset command (0x06). only 7-bit i 2 c addressing is supported; 10-bit i 2 c addressing is not supported. conceptually, the i 2 c interface allows access to the SI1132 internal register s. table 11 on page 24 is a summary of these registers. an i 2 c write access always begins with a star t (or restart) condition. the first byte after the start condition is the i 2 c address and a read-write bit. the second byte specifies t he starting address of the SI1132 internal register. subsequent bytes are written to the SI1132 internal register sequentially until a stop condition is encountered. an i 2 c write access with only two bytes is typically used to se t up the SI1132 internal address in preparation for an i 2 c read. the i 2 c read access, like the i 2 c write access, begins with a start or restart condition. in an i 2 c read, the i 2 c master then continues to clock sck to allow the SI1132 to drive the i 2 c with the internal register contents. the SI1132 also supports burst reads and burst writes. the burst read is useful in collecting contiguous, sequential registers. the SI1132 register map was designed to optimize for burst reads for interrupt handlers, and the burst writes are designed to fa cilitate rapid programming of commonly used fields. the internal register address is a six-bit (bit 5 to bit 0) plus an autoincrement disable (on bit 6). the autoincrement disable is turned off by default. disabling the autoincrementing feature allows the host to poll any single internal register repeatedly without having to keep updating the SI1132 internal address every time the register is read. it is recommended that the host should read measurements (in the i 2 c register map) when the SI1132 asserts int. although the host can read any of the SI1132's i 2 c registers at any time, care must be taken when reading 2-byte measurements outside the context of an interrupt han dler. the host could be reading part of the 2-byte measurement when the internal sequencer is updating th at same measurement coincidentally. when this happens, the host could be reading a hybrid 2-byte quantity whose high byte and low byte are parts of different samples. if the host must read these 2-byte registers outside the co ntext of an interrupt handler, the host should ?double- check? a measurement if the measurement devia tes significantly from a previous reading. i 2 c broadcast reset: the i 2 c broadcast reset should be sent prior to any i 2 c register access to the SI1132. if any i 2 c register or parameter has already been written to the SI1132 when the i 2 c broadcast reset is issued, the host must send a reset command and reinitialize the si 1132 completely. figure 8. i 2 c bit timing diagram sla6 sda sla5-0 r/w d7 d6-0 scl slave address + r/w data byte start ack nack stop
SI1132 14 rev. 1.2 figure 9. host interface single write figure 10. host interface single read figure 11. host interface burst write figure 12. host interface burst read figure 13. SI1132 reg address format notes: ?? gray boxes are driven by the host to the SI1132 ?? white boxes are driven by the SI1132 to the host ?? a = ack or ?acknowledge? ?? n = nack or ?no acknowledge? ?? s = start condition ?? sr = repeat start condition ?? p = stop condition ?? ai = disable auto increment when set
SI1132 rev. 1.2 15 3. operational modes the SI1132 can be in one of many operational modes at an y one time. it is important to consider the operational mode since the mode has an impact on the overall po wer consumption of the SI1132. the various modes are: ? off mode ? initialization mode ? standby mode ? forced conversion mode ? autonomous mode 3.1. off mode the SI1132 is in the off mode when v dd is either not connected to a power supply or if the v dd voltage is below the stated vdd_off voltage described in the electrical spec ifications. as long as the parameters stated in table 4, ?absolute maximum limits,? on page 7 ar e not violated, no current will flow through the SI1132. in the off mode, the SI1132 scl and sda pins do not interfere with other i 2 c devices on the bus. keeping v dd less than vdd_off is not intended as a method of achieving lowest system current draw. the reason is that the esd protection devices on the scl, sda and int pins also from a current path through v dd . if v dd is grounded for example, then, current flow from system power to system ground through the scl, sd a and int pull-up resistors and the esd protection devices. allowing v dd to be less than vdd_off is intended to serve as a hardware method of resetting the SI1132 without a dedicated reset pin. the SI1132 can also reenter the off mode upon receipt of either a general i 2 c reset or if a software reset sequence is initiated. when one of these soft ware methods is used to enter the off mode, the SI1132 typically proceeds directly from the off mode to the initialization mode. 3.2. initialization mode when power is applied to v dd and is greater than the minimum v dd supply voltage stated in table 1, ?recommended operating conditions,? on page 4, the si11 32 enters its initialization mode. in the initialization mode, the SI1132 performs its initial startup sequence. since the i 2 c may not yet be active, it is recommended that no i 2 c activity occur during this brief in itialization mode period. the ?start-up time? specification in table 1 is the minimum recommended time the host nee ds to wait before sending any i 2 c accesses following a power-up sequence. after initialization mode ha s completed, the SI1132 enters standby mode. the host must write 0x17 to the hw_key register fo r proper operation. 3.3. standby mode the SI1132 spends most of its time in standby mode. after the SI1132 completes the initialization mode sequence, it enters standby mode. while in standby mode, the SI1132 does not perform any measurements. however, the i 2 c interface is active and ready to accept reads and writ es to the SI1132 registers. the internal digital sequence controller is in its sleep state and does not draw much powe r. in addition, the int output retains its state until it is cleared by the host. i 2 c accesses do not necessarily cause the SI1132 to exit the standby mode. for example, reading SI1132 registers is accomplished without needing the digital seque nce controller to wake from its sleep state. 3.4. forced conversion mode the SI1132 can operate in forced conversion mode under the specific command of the host processor. the forced conversion mode is entered if the als_force command is sent. upon completi on of the conversion, the SI1132 can generate an interrupt to the host if the corresponding interrupt is enabled.
SI1132 16 rev. 1.2 3.5. autonomous operation mode the SI1132 can be placed in the autonomous operati on mode where measurements are performed automatically without requiring an explicit host co mmand for every measurement. the als_auto command is used to place the SI1132 in the autonomous operation mode. the SI1132 updates the i 2 c registers for als automatically. each measurement is allocated a 16-bit register in the i 2 c map. it is possible to operate the SI1132 without interrupts. when doing so, the host poll rate must be at least twice the frequency of the conversion rates for the host to always receive a new measurement. the host can also choose to be notified when these new measurements are available by enabling interrupts. the conversion frequencies for the als measurements are set up by the host prior to the als_auto command.
SI1132 rev. 1.2 17 4. programming guide 4.1. command and response structure all SI1132 i 2 c registers (except writes to the command register) are read or written without waking up the internal sequencer. a complete list of the i 2 c registers can be found in "4.5. i2c registers" on page 24. in addition to the i 2 c registers, ram parameters are memory locations maintained by the internal sequencer. these ram parameters are accessible through a command protocol (see "4.6. parameter ram" on page 35). a complete list of the ram parameters can be found in "4.6. parameter ram" on page 35. the SI1132 can operate either in fo rced measurement or autonomous m ode. when in forced measurement mode, the SI1132 does not make any measurements unless the host specifically requests the SI1132 to do so via specific commands (refer to the secti on 3.2). the chlist parameter needs to be written so that the SI1132 would know which measurements to make. the parameter meas_rate, when zero, places the intern al sequencer in forced measurement mode. when in forced measurement mode, the internal sequencer wakes up only when the host writes to the command register. the power co nsumption is lowest in forced measurement mode (meas_rate = 0). the SI1132 operates in au tonomous operation mode when meas_rate is non-zero. the meas_rate represents the time interval at which the SI1132 wakes up periodically. up to three measurements are made (als_vis, als_ir and aux) depending on which measurements are enabled via the upper bits of the chlist parameter. all three measurements are made in the following sequence: al s_vis, als_ir and aux. the als measurement group consists of the visible ligh t ambient measurement (als_vis), the infrared light ambient measurement (als_i r) and the auxiliary measurement (aux ). each measurement group has three measurements each. the channel list (chlist) para meter enables the specific measurements for that measurement grouping. each measurement (als_vis, als_ir, aux) are controlled through a combination of i2c register or parameter ram. tables 7 to 9 below summarize the prope rties and resources used for each measurement.
SI1132 18 rev. 1.2 4.2. command protocol the i 2 c map implements a bidirectional message box between the host and the SI1132 sequencer. host-writable i 2 c registers facilitate host-to-SI1132 communication, wh ile read-only i 2 c registers are used for SI1132-to-host communication. unlike the other host-writable i 2 c registers, the command register causes the internal sequencer to wake up from standby mode to process the host request. when a command is executed, the response register is up dated. typically, w hen there is no error, the upper four bits are zeros. to allow command tracking, the lower four bits implement a 4-bit circular counter. in general, if the upper nibble of the response register is non-zero, this indicates an error or the need for special processing. the param_wr and param_rd registers are additional mailbox registers. in addition to the registers in the i 2 c map, there are environmental parameters accessible through the command/ response interface. these parameters are stored in th e internal ram space. these parameters generally take more i 2 c accesses to read and write. the parameter ram is described in "4.6. parameter ram" on page 35. for every write to the command register, the following sequence is required: 1. write 0x00 to command register to clear the response register. 2. read response register and verify contents are 0x00. 3. write command value from table 5 into command register. 4. read the response register and veri fy contents are now non- zero. if contents are st ill 0x00, repeat this step. the response register will be incr emented upon the successful completion of a command. if the response register remains 0x00 for over 25 ms after the command write, the entire command process should be repeated from step 1. step 4 above is not applicable to the reset command because the device will re set itself and does not increment the response register after reset. no commands should be issued to the device for at least 1 ms after a reset is issued. table 5. command register summary command register param_w r register param_rd register error code in response register description name encoding param_query 100 aaaaa ? nnnn nnnn ? reads the parameter pointed to by bitfield [4:0] and writes value to param_rd. see table 12 for parameters. param_set 101 aaaaa dddd dddd nnnn nnnn ? sets parameter pointed by bitfield [4:0] with value in param_wr, and writes value out to param_rd. see table 12 for parameters. nop 000 00000 ? ? ? forces a zero into the response register reset 000 00001 ? ? ? performs a software reset of the firmware busaddr 000 00010 ? ? ? modifies i 2 c address reserved 000 00011 ? ? ? ? reserved 000 00100 ? ? ? ? reserved 000 00101 ? ? ? ?
SI1132 rev. 1.2 19 get_cal 0001 0010 ? ? reports calibration data to i 2 c regis- ters 0x22?0x2d als_force 000 00110 ? ? ? forces a single als measurement reserved 000 00111 ? ? ? ? reserved 000 01000 ? ? ? ? reserved 000 01001 ? ? ? ? als_pause 000 01010 ? ? ? pauses autonomous als reserved 000 01011 ? ? ? ? reserved 000 01100 ? ? ? ? reserved 000 01101 ? ? ? ? als_auto 000 01110 ? ? ? starts/restarts an autonomous als loop reserved 000 01111 ? ? ? ? reserved 000 1xxxx ? ? ? ? table 6. response register error codes response register description 0000 cccc no_error. the lower bit is a circular counter and is incremented every time a command has completed. this allows the host to keep track of commands sent to the SI1132. the circular counter ma y be cleared using the nop command. 1000 0000 invalid_setting. an in valid setting wa s encountered. clear using the nop command. 1000 1100 als_vis_adc_overflow. indicates visible ambient light channel conversion overflow. 1000 1101 als_ir_adc_overflow. indicates infrared ambient light channel conversion overflow. 1000 1110 aux_adc_overflow. indicates au xiliary channel conversion overflow. table 5. command register summary (continued) command register param_w r register param_rd register error code in response register description name encoding
SI1132 20 rev. 1.2 4.3. resource summary table 7. resource summary for interrupts measurement channel channel enable interrupt status output interrupt enable als visible en_als_vis in chlist[4] als_int[1:0] in irq_ status[1:0] als_ie[1:0] in irq_enable[1:0] als ir en_als_ir in chlist[5] auxiliary measurement en_aux in chlist[6] ??
SI1132 rev. 1.2 21 table 8. resource summary for adc parameters measurement channel adc output adc input source adc reco very count adc high signal mode adc clock divider adc alignment als visible als_vis_data1 / als_vis_data0 vis_adc_rec in als_vis_adc_counter [6:4] vis_range in als_vis_adc_misc[5] als_vis_ adc_gain [3:0] als_vis_ align in als_ encoding[4] als ir als_ir_data1[7:0] / als_ir_data0[7:0] ir_adc_rec in als_ir_adc_counter [6:4] ir_range in als_ir_adc_misc[5] als_ir_ adc_gain [3:0] als_ir_ align in als_ encoding[5] auxiliary measurement aux_data1[7:0] / aux_data0[7:0] aux_adcmux[7:0] ? ? ? ?
SI1132 22 rev. 1.2 the interrupts of the SI1132 are controlled through the int_cfg, irq_enable, irq_mode1, irq_mode2 and irq_status registers. the int hardware pin is enabled through the int_oe bit in the int_cfg register. the hardware essentially performs an and function between the ir q_enable register and irq_status register. after this and function, if any bits are set, the int pin is asserted. the host is responsible for clearing the interrupt by writing to the irq_status register. when the specif ic bits of the irq_status register is written with 1, that specific irq_status bit is cleared. typically, the host software is expected to read the irq_st atus register, stores a local copy, and then writes the same value back to the irq_status to clear the interrupt source. the int_cfg register is normally written with 1. the irq_mode1, irq_mode2 and irq_enable registers wo rk together to define how the internal sequencer sets bits in the irq_status register (and as a consequence, asserting the int pin). the als interrupts are described in table 10. table 9. resource summary for hardware pins pin name output drive disable analog voltage input enable int int_oe in int_cfg[0] ana_in_key[31:0] table 10. ambient light sensing interrupt resources irq_enable[1:0] description als_ie[1:0] 0 0 no als interrupts 0 1 als_int set after every als_vis or uv sample
SI1132 rev. 1.2 23 4.4. signal path software model the following diagram gives an overview of the signal paths, along with the i 2 c register and ram parameter bit fields that control them. sections with detailed descriptions of the i 2 c registers and parameter ram follow. figure 14. signal path programming model als_ir_align 16 16 16 aux_adcmux vis_range als_vis_adc_gain als_vis_adc_rec als_rate ir_range als_ir_adc_gain als_ir_adc_rec als_rate als_vis_align 16 en_aux en_als_ir en_als_vis als_ir_adcmux als_vis_data als_ir_data aux_data vdd gnd gnd small visible small visible select out 0x65 0x75 range analog digital gain recov. time rate align in sum offset enable analog digital temperature sensor temperature sensor range analog digital gain recov. time rate align in sum offset enable select out 0 small ir small ir in sum offset enable
SI1132 24 rev. 1.2 4.5. i 2 c registers table 11. i 2 c register summary i 2 c register name address 7 6 5 4 3 2 1 0 part_id 0x00 part_id rev_id 0x01 rev_id seq_id 0x02 seq_id int_cfg 0x03 int_oe irq_enable 0x04 als_ie hw_key 0x07 hw_key meas_rate0 0x08 meas_rate0 meas_rate1 0x09 meas_rate1 reserved 0x0a reserved 0x0b reserved 0x0c reserved 0x0d reserved 0x0e reserved 0x0f reserved 0x10 reserved 0x11 reserved 0x12 ucoef0 0x13 ucoef0 ucoef1 0x14 ucoef1 ucoef2 0x15 ucoef2 ucoef3 0x16 ucoef3 param_wr 0x17 param_wr command 0x18 command response 0x20 response irq_status 0x21 cmd_int als_int als_vis_ data0 0x22 als_vis_data0
SI1132 rev. 1.2 25 als_vis_ data1 0x23 als_vis_data1 als_ir_data0 0x24 als_ir_data0 als_ir_data1 0x25 als_ir_data1 reserved 0x26 reserved 0x27 reserved 0x28 reserved 0x29 reserved 0x2a reserved 0x2b aux_data0/ uvindex0 0x2c aux_data0/uvindex0 aux_data1/ uvindex1 0x2d aux_data1/uvindex1 param_rd 0x2e param_rd chip_stat 0x30 running suspend sleep ana_in_key 0x3b? 0x3e ana_in_key table 11. i 2 c register summary (continued) i 2 c register name address 7 6 5 4 3 2 1 0
SI1132 26 rev. 1.2 reset value = 0011 0010 reset value = 0000 0000 reset value = 0000 1000 part_id @ 0x00 bit 76543210 name part_id type r rev_id @ 0x1 bit 76543210 name rev_id type r seq_id @ 0x02 bit 76543210 name seq_id type r bit name function 7:0 seq_id sequencer revision. 0x08 SI1132-a10 (major_seq=1, minor_seq=0)
SI1132 rev. 1.2 27 reset value = 0000 0000 reset value = 0000 0000 int_cfg @ 0x03 bit 765432 1 0 name int_oe type rw rw bit name function 7:2 reserved reserved. 0int_oe int output enable. int_oe controls the int pin drive 0: int pin is never driven 1: int pin driven low whenever an irq_status and its corresponding irq_enable bits match irq_enable @ 0x04 bit76543210 name als_ie type rw bit name function 7:1 reserved reserved. 0als_ie als interrupt enable. enables interrupts when vis bit or uv bit in chlist is enabled. 0: int never asserts due to vis or uv activity 1: assert int pin whenever vis or uv measurements are ready
SI1132 28 rev. 1.2 reset value = 0000 0000 reset value = 0000 0000 hw_key @ 0x07 bit 76543210 name hw_key type rw bit name function 7:0 hw_key the system must write the value 0x17 to this register for proper SI1132 operation. meas_rate0: meas_rate data word low byte @ 0x08 bit 76543210 name meas_rate[7:0] type rw bit name function 7:0 meas_rate[7:0] meas_rate1 and meas_rate0 together form a 16-bit value: meas_rate [15:0]. the 16-bit value, when multiplied by 31.25 s, represents the time duration between wake-up periods where measurements are made. once the device wakes up, all measurements specified in chlist are made. note that for the SI1132 with seq_id=0x01, there is a code error that places meas_rate0 at 0x0a with meas_rate1 at 0x08 instead. this will be fixed in future revisions of the SI1132.
SI1132 rev. 1.2 29 reset value = 0000 0000 reset value = 0000 0000 meas_rate1: meas_rate data word high byte @ 0x09 bit 76543210 name meas_rate[15:8] type rw bit name function 7:0 meas_rate[15:8] meas_rate1 and meas_rate0 together fo rm a 16-bit value: meas_rate[15:0]. the 16-bit value, when multiplied by 31.2 5 s, represents the time duration between wake-up periods where measurements are made. once the device wakes up, all measurements specified in chlist are made. note that for the SI1132 with seq_id= 0x01, there is a code error that places meas_rate0 at 0x0a and meas_rate1 at 0x08 instead. th is will be fixed in future revisions of the SI1132. param_wr @ 0x17 bit 76543210 name param_wr type rw bit name function 7:0 param_wr mailbox register for passing para meters from the host to the sequencer.
SI1132 30 rev. 1.2 reset value = 0000 0000 reset value = 0000 0000 command @ 0x18 bit 7 6543210 name command type rw bit name function 7:0 command command register. the command register is the primary mailbox register into the internal sequencer. writing to the command register is the only i 2 c operation that wakes the device from standby mode. response @ 0x20 bit 76543210 name response type rw bit name function 7:0 response the response register is used in conjunction with co mmand processing. when an error is encountered, the response register will be loaded with an error code. all error codes will have the msb is set. the error code is retained until a reset or nop command is received by the sequencer. other commands other than reset or nop will be ignored. however, any autonomous operation in progress continues normal operation despite any error. 0x00?0x0f: no error. bits 3:0 form an incrementing roll-over counter. the roll over counter in bit 3:0 increments when a command has been executed by the SI1132. once autonomous measurements have started, the execution timing of any command becomes non-deterministic since a measurement could be in progress when the command register is written. the host software must make use of the rollover counter to ensure that commands are processed. 0x80: invalid command encountered during command processing 0x8c: adc overflow encountered during als-vis measurement 0x8d: adc overflow encountered during als-ir measurement 0x8e: adc overflow encountered during aux measurement
SI1132 rev. 1.2 31 reset value = 0000 0000 reset value = 0000 0000 irq_status @ 0x21 bit76543210 name cmd_int als_int type rw rw bit name function 7:6 reserved reserved. 5cmd_int command interrupt status. 4:2 reserved reserved. 1:0 als_int als interrupt status. (refer to table 13 for encoding.) note: if the corresponding irq_enable bit is also set when the irq_status bit is set, the int pin is asserted. als_vis_data0: als_vis_data data word low byte @ 0x22 bit76543210 name als_vis_data[7:0] type rw bit name function 7:0 als_vis_data[7:0] als vis data lsb. once autonomous measurements have started, this register must be read after int has asserted but before the next measurement is made. refer to ?an498: si114x designer?s gu ide?, section ?5.6.2 host interrupt latency?.
SI1132 32 rev. 1.2 reset value = 0000 0000 reset value = 0000 0000 reset value = 0000 0000 als_vis_data1: als_vis_data data word high byte @ 0x23 bit 76543210 name als_vis_data[15:8] type rw bit name function 7:0 als_vis_data[15:8] als vis data msb. once autonomous measurements have started, this register must be read after int has asserted but before the next measurement is made. refer to ?an498: si114x designer?s guide?, section ?5.6.2 host interrupt latency?. als_ir_data0: als_ir_data data word low byte@ 0x24 bit76543210 name als_ir_data[7:0] type rw bit name function 7:0 als_ir_data[7:0] als ir data lsb. once autonomous measurements have started, this register must be read after int has asserted but before the next measurement is made. refer to ?an498: si114x designer?s gu ide?, section ?5.6.2 host interrupt latency?. als_ir_data1: als_ir_data data word high byte @ 0x25 bit76543210 name als_ir_data[15:8] type rw bit name function 7:0 als_ir_data[15:8] als ir data msb. once autonomous measurements have started, this register must be read after int has asserted but before the next measurement is made. refer to ?an498: si114x designer?s guide? , section ?5.6.2 host interrupt latency?.
SI1132 rev. 1.2 33 reset value = 0000 0000 reset value = 0000 0000 reset value = 0000 0000 aux_data0/uvindex0: aux_data data word low byte @ 0x2c bit76543210 name aux_data[7:0] type rw bit name function 7:0 aux_data[7:0] aux data lsb. once autonomous measurements have started, this register must be read after int has asserted but before the next measurement is made. refer to ?an498: si114x designer?s guide?, section ?5.6.2 host interrupt latency?. aux_data1/uvindex1: aux_data data word high byte @ 0x2d bit76543210 name aux_data[15:8] type rw bit name function 7:0 aux_data[15:8] aux data msb. once autonomous measurements have started, this register must be read after int has asserted but before the next measurement is made. refer to ?an498: si114x designer?s guide?, sect ion ?5.6.2 host interrupt latency?. param_rd @ 0x2e bit76543210 name param_rd type rw bit name function 7:0 param_rd mailbox register for passing parameters from the sequencer to the host.
SI1132 34 rev. 1.2 reset value = 0000 0000 reset value = 0000 0000 chip_stat @ 0x30 bit 76543 2 1 0 name running suspend sleep type rrr bit name function 7:3 reserved reserved 2 running device is awake. 1 suspend device is in a low-power state, waiting for a measurement to complete. 0 sleep device is in its lowest power state. ana_in_key @ 0x3b to 0x3e bit 765432 1 0 0x3b ana_in_key[31:24] 0x3c ana_in_key[23:16] 0x3d ana_in_key[15:8] 0x3e ana_in_key[7:0] type rw bit name function 31:0 ana_in_key[31:0] reserved.
SI1132 rev. 1.2 35 4.6. parameter ram parameters are located in internal memory and are not directly addressable over i 2 c. they must be indirectly accessed using the param_query and param_set commands described in "4.2. command protocol" on page 18. . table 12. parameter ram summary table parameter name offset bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0 i2c_addr 0x00 i 2 c address chlist 0x01 en_uv en_aux en_als_ir en_als_vis reserved 0x02 reserved 0x03 reserved 0x04 reserved (always set to 0) reserved 0x05 reserved (always set to 0) als_encoding 0x06 als_ir_ align als_vis_ align reserved (always set to 0) reserved 0x07 reserved 0x08 reserved 0x09 reserved 0x0a reserved 0x0b reserved 0x0c reserved 0x0d reserved (do not modify from default setting of 0x02) als_ir_adcmux 0x0e als_ir_adcmux aux_adcmux 0x0f aux adc input selection als_vis_ adc_counter 0x10 vis_adc_rec reserved (always set to 0) als_vis_adc_gain 0x11 als_vis_ adc_gain als_vis_adc_misc 0x12 reserved (always set to 0) vis_range reserved (always set to 0) reserved 0x13 reserved (do not modify from default setting of 0x40) reserved 0x14? 0x15 reserved (do not modify from default setting of 0x00) reserved 0x1b reserved (do not modify from default setting of 0x00) reserved 0x1c als_ir_ adc_counter 0x1d ir_adc_rec reserved (always set to 0) als_ir_adc_gain 0x1e als_ir_ adc_gain als_ir_adc_misc 0x1f reserved (always set to 0) ir_range reserved (always set to 0)
SI1132 36 rev. 1.2 reset value = 0000 0000 reset value = 0000 0000 i2c @ 0x00 bit 76543210 name i 2 c address[7:0] type rw bit name function 7:0 i 2 c address[7:0] specifies a new i 2 c address for the device to respond to. the new address takes effect when a busaddr command is received. chlist @ 0x01 bit76 5 43210 name en_uv en_aux en_als_ir en_als_vis type rw bit name function 7 en_uv enables uv index, data stored in aux_data1[7:0] and aux_data0[7:0] 6 en_aux enables auxiliary channel, data stored in aux_data1[7:0] and aux_data0[7:0]. 5 en_als_ir enables als ir channel, data stored in als_ir_data1[7:0] and als_ir_data0[7:0]. 4 en_als_vis enables als visible channel, data st ored in als_vis_data1[ 7:0] and als_vis_da- ta0[7:0]. 3:0 reserved note: for proper operation, chlist must be written with a non-zero value before forced measurements or autonomous operation is requested.
SI1132 rev. 1.2 37 reset value = 0000 0000 als_encoding @ 0x06 bit 7 6 5 4 3 2 1 0 name als_ir_align als_vis_align type rw rw bit name function 7:6 reserved 5 als_ir_align when set, the adc reports the least significant 16 bits of the 17-bit adc when performing als vis measurement. r eports the 16 msbs when cleared. 4 als_vis_align when set, the adc reports the leas t significant 16 bits of the 17-bit adc when performing als ir measurement. reports the 16 msbs when cleared. 3:0 reserved always set to 0. als_ir_adcmux @ 0x0e bit76543210 name als_ir_adcmux type rw bit name function 7:0 als_ir_adcmux selects adc input for als_ir measurement. 0x00: small ir photodiode
SI1132 38 rev. 1.2 reset value = 0110 0101 reset value = 0111 0000 aux_adcmux @ 0x0f bit76543210 name aux_adcmux[7:0] type rw bit name function 7:0 aux_adcmux[7:0] selects input for aux measur ement. these measurements are referenced to gnd. 0x65: temperature (should be used only for relative temperature measurement. absolute temperature not guaranteed) 0x75: v dd voltage als_vis_adc_counter @ 0x10 bit76543210 name vis_adc_rec[2:0] type rw r/w r/w bit name function 7 reserved 6:4 vis_adc_rec[2:0] recovery period the adc ta kes before making a als-vis measurement. 000: 1 adc clock (50 ns times 2 als_vis_adc_gain ) 001: 7 adc clock (350 ns times 2 als_vis_adc_gain ) 010: 15 adc clock (750 ns times 2 als_vis_adc_gain ) 011: 31 adc clock (1.55 s times 2 als_vis_adc_gain ) 100: 63 adc clock (3.15 s times 2 als_vis_adc_gain ) 101: 127 adc clock (6.35 s times 2 als_vis_adc_gain ) 110: 255 adc clock (12.75 s times 2 als_vis_adc_gain ) 111: 511 adc clock (25.55 s times 2 als_vis_adc_gain ) the recommended vis_adc_rec value is the one?s complement of als_vis_adc_gain. 3:0 reserved always set to 0.
SI1132 rev. 1.2 39 reset value = 0000 0000 reset value = 0000 0000 als_vis_adc_gain @ 0x11 bit76543210 name als_vis_adc_gain[2:0] type rw r/w rw bit name function 7:3 reserved 2:0 als_vis_adc_gain[2:0] increases the adc integr ation time for als visible measurements by a factor of (2 ^ als_vis_ adc_gain). this allows visible light measure- ment under dark glass. the maximum gain is 128 (0x7). for example: 0x0: adc clock is divided by 1 0x4: adc clock is divided by 16 0x6: adc clock is divided by 64 als_vis_adc_misc @ 0x12 bit76 5 43210 name vis_range type rw bit name function 7:6 reserved 5 vis_range when performing als-vis measurements, the adc can be programmed to operate in high sensitivity operation or high signal range. the high signal range is useful in operation under direct sunlight. 0: normal signal range 1: high signal range (gain divided by 14.5) 4:0 reserved
SI1132 40 rev. 1.2 reset value = 0111 0000 als_ir_adc_counter @ 0x1d bit76543210 name ir_adc_rec[2:0] type rw bit name function 7 reserved 6:4 ir_adc_rec[2:0] recovery period the adc takes before making a als-ir measurement. 000: 1 adc clock (50 ns times 2 als_ir_adc_gain ) 001: 7 adc clock (350 ns times 2 als_ir_adc_gain ) 010: 15 adc clock (750 ns times 2 als_ir_adc_gain ) 011: 31 adc clock (1.55 s times 2 als_ir_adc_gain ) 100: 63 adc clock (3.15 s times 2 als_ir_adc_gain ) 101: 127 adc clock (6.35 s times 2 als_ir_adc_gain ) 110: 255 adc clock (12.75 s times 2 als_ir_adc_gain ) 111: 511 adc clock (25.55 s times 2 als_ir_adc_gain ) the recommended ir_adc_rec value is the one?s complement of als_ir_adc_gain. 3:0 reserved always set to 0.
SI1132 rev. 1.2 41 reset value = 0000 0000 reset value = 0000 0000 als_ir_adc_gain @ 0x1e bit76543210 name als_ir_adc_gain[2:0] type r/w r/w r/w bit name function 7:3 reserved 2:0 als_ir_adc_gain[2:0] increases the adc integrat ion time for ir ambient measurements by a fac- tor of (2 ^ als_ir_adc_gain). the maximum gain is 128 (0x7). for example: 0x0: adc clock is divided by 1 0x4: adc clock is divided by 16 0x6: adc clock is divided by 64 als_ir_adc_misc @ 0x1f bit76543210 name ir_range type rw bit name function 7:6 reserved 5 ir_range when performing als-ir measurements, the adc can be programmed to operate in high sensitivity operation or high signal range. the high signal range is useful in operation under direct sunlight. 0: normal signal range 1: high signal range (gain divided by 14.5) 4:0 reserved write operations to this ram parameter must preserve this bit-field value using read-modify-write.
SI1132 42 rev. 1.2 5. pin descriptions table 13. pin descriptions pin name type description 1 sda bidirectional i 2 c data. 2 scl input i 2 c clock. 3v dd power power supply. voltage source. 4 int bidirectional interrupt output. open-drain interrupt output pin. must be at logic level high during power-up sequence to enable low power operation. 5 dnc do not connect. this pin is electrically connected to an internal SI1132 node. it should remain unconnected. 6v dd power power supply. voltage source. 7v dd power power supply. voltage source. 8 gnd power ground. reference voltage. 9v dd power power supply. voltage source. 10 dnc do not connect. this pin is electrically connected to an internal SI1132 node. it should remain unconnected. v dd v dd scl gnd int 2 3 4 9 8 7 6 qfn-10 v dd v dd sda 1 dnc 10 5 dnc
SI1132 rev. 1.2 43 6. ordering guide part number package SI1132-a10-gmr qfn-10
SI1132 44 rev. 1.2 7. package outline: 10-pin qfn figure 15 illustrates the package details for the SI1132 qfn package. table 14 lists the values for the dimensions shown in the illustration. figure 15. qfn package diagram dimensions pin 1 indication top view ?
SI1132 rev. 1.2 45 figure 16. photodiode centers table 14. package diagram dimensions dimension min nom max a 0.55 0.65 0.75 b 0.20 0.25 0.30 d 2.00 bsc. e 0.50 bsc. e 2.00 bsc. l 0.30 0.35 0.40 aaa 0.10 bbb 0.10 ccc 0.08 ddd 0.10 notes: 1. all dimensions shown are in millimeters (mm). 2. dimensioning and tolerancing per ansi y14.5m-1994. 0.66 0.415 0.12 small ir photodiode and visible photodiode (stacked) pin 1 0.115 die offset to package
SI1132 46 rev. 1.2 8. suggested pcb land pattern figure 17 illustrates the pcb land patter n details for the si 1132. table 15 lists the values for the dimensions shown in the illustration. figure 17. pcb land pattern ?
SI1132 rev. 1.2 47 table 15. pcb land pattern dimensions dimension mm c1 1.90 c2 1.90 e0 . 5 0 x0 . 3 0 y0 . 8 0 notes: general 1. all dimensions shown are in millimeters (mm). 2. this land pattern design is bas ed on the ipc-7351 guidelines. 3. all dimensions shown are at maximum material condition (mmc). least material condition (lmc) is calculated based on a fabrication allowance of 0.05 mm. solder mask design 4. all metal pads are to be non-solder mask defined (nsmd). clearance between the solder mask and the metal pad is to be 60 mm minimum, all the way around the pad. stencil design 5. a stainless steel, laser-cut and electro-polished stencil with trapezoidal walls should be used to assure good solder paste release. 6. the stencil thickness should be 0.125 mm (5 mils). 7. the ratio of stencil aperture to land pad size should be 1:1 for all pads. card assembly 8. a no-clean, type-3 solder paste is recommended. 9. the recommended card reflow profile is per the jedec/ipc j-std-020d specification for small body components.
SI1132 48 rev. 1.2 d ocument c hange l ist revision 1.0 to revision 1.1 ? updated recommended uv coefficients. ? updated photodiode spectral response. revision 1.1 to revision 1.2 ? clarified usage of command register and parameter ram. ? clarified how to enable uv index. ? corrected typo in description of meas_rate1.
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