View GSIONIRUH33PA13B20K_8305090.PDF datasheet online --- IC-ON-LINE

Datasheet File OCR Text:

iruh33pa13b20k total ionizing dose test report december 2005 international rectifier currently does not have a dscc approved radiation hardness assurance program for mil-prf-38534.
tid test report iruh33pa13b20k december 2005 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 2 table of contents introduction .??????????????????. 3 summary of results ??????????????... 3 test method .?????????????????? 3 test plan .???????????????????. 3 test facility ??????????????????. 4 test results ...?????????????????. 5 conclusion .??????????????????...8 appendix a ? electrical data appendix b ? radiation test specification
tid test report iruh33pa13b20k december 2005 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 3 introduction this test report covers the total ionizi ng dose tests performed on the iruh33pa13b20k adjustable low dropout linear regul ator in a hermetic package. the total ionizing dose test was performed on ten samples of t he device from production lot h 903185, which had completed mil- prf-38534 ?h? level assembly and screening. on december 21, 2005 international rectifier tested this device for total ionizing dose hardness at the university of massachusetts, nuclear research facility using their co 60 source. summary of results all of the test samples passed the post radiation te st requirements for total ionizing dose levels up to 200k rad(si). the results show more degradati on on the off-bias state devices for all tests parameters as a function of radiat ion, but never fell out of the specification limits. the ?on? biased samples passed the post radiation test requi rements for all of the required dose levels as well. test method the test method used as a guide in the developm ent of the test plan was mil-std-883, method 1019 ionizing radiation, condition a. this met hod establishes the basic requirements for the performance and execution of the tests. test plan the samples were exposed to co 60 irradiation in both an ?on? and ?off? biased state per the requirements of the test plan and the radiation test specification. post radiation testing of the devices occurred at the umass facility after each dose step was complete. the devices were tested on december 21, 2005 for post radiation e ffects for dose levels up to 200k rad(si). on biased serial numbers: 80, 75, 102, 81, 115 off biased serial numbers: 100, 106, 91, 92, 73 control samples: 71 and 107. 71 used for this test. the radiation test specification is included in appendix b. the testing occurred in the following manner: 1.0 purpose the purpose of this test is to characterize and qu alify the total ionizing dose effects for international rectifier?s hybrid low dropout regulator devices. the data resulting from the tests may be incorporated in the ir data sheet for the product. 2.0 test responsibility international rectifier shall be responsible for cond ucting the tests, which shall be performed at the university of massachusetts research reactor facility. in ternational rectifier shall be responsible for the final test report.
tid test report iruh33pa13b20k december 2005 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 4 3.0 test facility 3.1 nuclear reactor the university of massachusetts research reactor shall be used to provide the source for gamma radiation. umrr will also prov ide information on dose rate, total dose, irradiation test times and dosimetry for this evaluation. 3.2 test equipment the necessary test equipment including interface board , cables, power supplies, measurement system, etc. shall be provided by international rectifier. 3.3 sample size sample size shall be determined based on device type, characterization parameters. as a minimum, the sample size shall meet the requirements of mil- pr f-38534. sample size for this tid evaluation equals 12 devices. five of the samples shall be biased with the worst-case input voltage of 6.8 volts and five samples shall be biased ?in-circuit? with the power supply turned off. two samples shall be maintained as controls of which one shall be tested at each dose step. 4.0 test devices 4.1 the following device is planned for total ionizing dose characterization: a. iruh33pa13b20k 4.2 all devices shall be tested after each radiation exposure per t090104g within 1 hour and placed back on to radiation exposure within 2 hours. 5.0 test method mil-std-883, method 1019 condition a shall be used to establish the procedure for all testing described herein. 6.0 record keeping the reactor facility shall prov ide dosimetry data for the co 60 source. each exposure run shall be cataloged with the appropriate number in order to maintain correl ation to the appropriate data set. ir will be responsible for collecting and compiling the test data. 7.0 test report the test report shall include the following information: a. device type(s), serial numbers, wafer lot identification (per active component) b. test dates c. facility, source type d. bias conditions e. comments and observations f. pre and post electrical data g. summary descriptive includ ing graphs (when applicable) test facility the university of massachusetts, lowell, nuclear research reactor is a 1 mega-watt, uranium 235 enhanced core reactor. the umass lowell r adiation laboratory pr ovides controlled radiation environments and analytic al measurement services to government organizations and to industry. the laboratory provides facilities for proton, neutron, and gamma environments. the gamma cave is an irradiation room inside this facility having an equi-dimensional volume of 512
tid test report iruh33pa13b20k december 2005 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 5 cubic feet. a wide range of dose rates, 1gray (100 rad) per hour to 10,000 gray (1 mrad) per hour, is available. several small ports penetra te one shielding wall to provide access for instrumentation cables. test results the key pre and post radiation test results are show n in figures 1 thru 10. the raw test data for all the parameters tested is shown in appendix a. as outlined in the test plan, five of the devices exposed to total ionizing dose irradiation were biased ?on? with the maximum input voltage and five samples were placed in the bias circuit with the power supply off or biased ?off?. all samples passed the post radiati on test requirements up to 200k rad(si). the parameters affected the most by the ionizi ng radiation were output voltage, ripple rejection, and shutdown threshold voltage with the worst-ca se condition being the ?off? bias. figure 1 ?on? biased samples, vout, vin=3.3v @1.5a t#1 vout krad level limits serial # 0 30 50 100 200 min max u/m cntrl1 2.506 2.512 2.505 2.509 2.513 2.375 2.625 v 75 2.498 2.509 2.523 2.552 2.593 2.375 2.625 v 80 2.501 2.515 2.529 2.558 2.602 2.375 2.625 v 81 2.499 2.514 2.529 2.563 2.609 2.375 2.625 v 102 2.495 2.511 2.527 2.56 2.603 2.375 2.625 v 115 2.499 2.513 2.529 2.562 2.606 2.375 2.625 v max 2.501 2.515 2.529 2.563 2.609 2.375 2.625 v avg 2.498 2.512 2.527 2.559 2.602 2.375 2.625 v min 2.495 2.509 2.523 2.552 2.593 2.375 2.625 v figure 2 ?off? biased samples, vout, vin=3.3v @1.5a t#1 vout krad level limits serial # 0 30 50 100 200 min max u/m cntrl1 2.506 2.512 2.505 2.509 2.513 2.375 2.625 v 73 2.497 2.513 2.529 2.564 2.618 2.375 2.625 v 91 2.496 2.514 2.53 2.564 2.617 2.375 2.625 v 92 2.502 2.519 2.533 2.564 2.612 2.375 2.625 v 100 2.496 2.514 2.529 2.561 2.611 2.375 2.625 v 106 2.498 2.516 2.532 2.565 2.615 2.375 2.625 v max 2.502 2.519 2.533 2.565 2.618 2.375 2.625 v avg 2.498 2.515 2.531 2.564 2.615 2.375 2.625 v min 2.496 2.513 2.529 2.561 2.611 2.375 2.625 v
tid test report iruh33pa13b20k december 2005 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 6 figure 3 ?on? biased samples, vdrop, iout=3a t#8 vdrop krad level limits serial # 0 30 50 100 200 min max u/m cntrl1 0.194 0.203 0.195 0.199 0.204 0 0.4 v 75 0.187 0.233 0.221 0.241 0.230 0 0.4 v 80 0.194 0.225 0.229 0.252 0.230 0 0.4 v 81 0.191 0.225 0.225 0.248 0.264 0 0.4 v 102 0.194 0.229 0.229 0.252 0.230 0 0.4 v 115 0.194 0.233 0.240 0.259 0.238 0 0.4 v max 0.194 0.233 0.240 0.259 0.264 0 0.4 v avg 0.192 0.229 0.229 0.250 0.238 0 0.4 v min 0.187 0.225 0.221 0.241 0.230 0 0.4 v figure 4 ?off? biased samples, vdrop, iout=3a t#8 vdrop krad level limits serial # 0 30 50 100 200 min max u/m cntrl1 0.194 0.203 0.195 0.199 0.204 0 0.4 v 73 0.187 0.233 0.229 0.248 0.226 0 0.4 v 91 0.187 0.225 0.229 0.252 0.234 0 0.4 v 92 0.194 0.233 0.229 0.252 0.234 0 0.4 v 100 0.194 0.233 0.229 0.256 0.234 0 0.4 v 106 0.198 0.233 0.236 0.263 0.241 0 0.4 v max 0.198 0.233 0.236 0.263 0.241 0 0.4 v avg 0.192 0.231 0.230 0.254 0.234 0 0.4 v min 0.187 0.225 0.229 0.248 0.226 0 0.4 v figure 5 ?on? biased samples, current limit, vin=3.3 t#9 current limit krad level limits serial # 0 30 50 100 200 min max u/m cntrl1 8.502 9.128 8.759 8.982 9.143 3 10 a 75 8.477 8.629 8.532 8.483 8.507 3 10 a 80 8.432 8.492 8.214 8.392 8.371 3 10 a 81 8.387 8.447 8.486 8.165 8.462 3 10 a 102 8.477 8.810 8.532 8.528 8.462 3 10 a 115 8.387 8.447 8.168 8.483 8.507 3 10 a max 8.477 8.810 8.532 8.528 8.507 3 10 a avg 8.432 8.565 8.386 8.410 8.462 3 10 a min 8.387 8.447 8.168 8.165 8.371 3 10 a
tid test report iruh33pa13b20k december 2005 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 7 figure 6 ?off? biased samples, current limit, vin=3.3 t#9 current limit krad level limits serial # 0 30 50 100 200 min max u/m cntrl1 8.502 9.128 8.759 8.982 9.143 3 10 a 73 8.114 8.447 8.123 8.029 8.507 3 10 a 91 8.432 8.765 8.395 8.437 8.144 3 10 a 92 8.114 8.447 8.486 8.483 8.371 3 10 a 100 8.114 8.447 8.259 8.210 8.507 3 10 a 106 8.069 8.447 8.077 8.165 8.189 3 10 a max 8.432 8.765 8.486 8.483 8.507 3 10 a avg 8.169 8.511 8.268 8.265 8.344 3 10 a min 8.069 8.447 8.077 8.029 8.144 3 10 a figure 7 ?on? biased samples, ripple rejection = 120hz. t#10 ripple rejection 1 krad level limits serial # 0 30 50 100 200 min max u/m cntrl1 54.771 98.054 98.690 98.094 99.189 40 db 75 97.132 98.624 99.850 97.597 88.063 40 db 80 54.720 100.427 101.902 95.511 87.004 40 db 81 101.123 100.384 102.772 94.403 63.243 40 db 102 98.141 100.427 101.944 93.802 63.286 40 db 115 98.098 99.184 100.493 94.787 63.286 40 db max 101.123 100.427 102.772 97.597 88.063 40 db avg 89.843 99.809 101.392 95.220 72.976 40 db min 54.720 98.624 99.850 93.802 63.243 40 db figure 8 ?off? biased samples, ripple rejection = 120hz t#10 ripple rejection 1 krad level limits serial # 0 30 50 100 200 min max u/m cntrl1 54.771 98.054 98.690 98.094 99.189 40 db 73 98.624 100.427 101.189 91.619 61.990 40 db 91 99.784 100.427 100.451 92.375 61.990 40 db 92 98.141 98.624 98.690 95.511 63.286 40 db 100 98.624 98.097 99.250 96.301 61.947 40 db 106 98.624 98.097 100.493 92.375 61.862 40 db max 99.784 100.427 101.189 96.301 63.286 40 db avg 98.759 99.134 100.015 93.636 62.215 40 db min 98.141 98.097 98.690 91.619 61.862 40 db 1 a test equipment anomaly caused the low reading for ripple rej ection at the 0k test step fo r serial 80 and the cntrl1 sample. the problem was fixed prior to the completion of the 30k rad(si) dose step.
tid test report iruh33pa13b20k december 2005 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 8 figure 9 ?on? biased samples, voltage shutdown t#11 vshdn krad level limits serial # 1 30 50 100 200 min max u/m cntrl1 1.353 1.322 1.318 1.337 1.339 1 1.7 v 75 1.367 1.343 1.401 1.505 1.631 1 1.7 v 80 1.325 1.343 1.381 1.505 1.610 1 1.7 v 81 1.325 1.343 1.401 1.505 1.631 1 1.7 v 102 1.346 1.343 1.401 1.547 1.631 1 1.7 v 115 1.325 1.363 1.422 1.547 1.631 1 1.7 v max 1.367 1.363 1.422 1.547 1.631 1 1.7 v avg 1.338 1.347 1.401 1.522 1.627 1 1.7 v min 1.325 1.343 1.381 1.505 1.610 1 1.7 v figure 10 ?off? biased samples, voltage shutdown t#11 vshdn krad level limits serial # 0 30 50 100 200 min max u/m cntrl1 1.353 1.322 1.318 1.337 1.339 1 1.7 v 73 1.325 1.322 1.381 1.526 1.589 1 1.7 v 91 1.325 1.343 1.381 1.505 1.610 1 1.7 v 92 1.346 1.363 1.422 1.505 1.631 1 1.7 v 100 1.325 1.343 1.422 1.526 1.610 1 1.7 v 106 1.325 1.363 1.401 1.526 1.631 1 1.7 v max 1.346 1.363 1.422 1.526 1.631 1 1.7 v avg 1.329 1.347 1.401 1.518 1.614 1 1.7 v min 1.325 1.322 1.381 1.505 1.589 1 1.7 v conclusion the iruh33pa13b20k has demonstrated hardness to high dose rate ionizing radiation exposure up to 200 krad(si) with no parametri c failures when device is in the ?on? or ?off? bias condition and the results show it to meet all the post radiation test requirements. there are parametric shifts for output voltage, dropout voltage, ripple re jection, and shutdown threshold voltage, which need to be considered in designs w here tight tolerances over the life of the product need to be maintained.
tid test report iruh33pa13b20k december 2005 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 9 appendix a electrical data
tid test report iruh33pa13b20k december 2005 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 10 electrical test data (pre-radiation) test vout1 vout2 vout3 vout4 vout5 line reg load reg vdrop current limit ripple* rej. vshdn vout shdn ishdn** max limit 2.625 2.625 2.625 2.625 2.625 12.5 147.6 0.4 10 200 1.6 0.1 ---- min limit 2.375 2.375 2.375 2.375 2.375 -12.5 -147.6 0 3 65 1 -0.1 ---- serial # (v) (v) (v) (v) (v) (mv) (mv) (v) (a) (db) (v) (mv) (ma) cntrl 2.506 2.506 2.507 2.507 1.269 -0.904 1.183 0.194 8.502 54.77 1.353 -0.716 0.147 75 2.498 2.496 2.500 2.497 1.263 -0.451 6. 043 0.187 8.477 97.13 1.367 -1.407 0.149 80 2.501 2.502 2.502 2.502 1.269 -0.722 -1 .76 0.194 8.432 54.72 1.325 -0.201 0.146 81 2.499 2.501 2.503 2.501 1.267 -0.09 3. 996 0.191 8.387 101.12 1.325 -0.010 0.145 91 2.496 2.497 2.498 2.498 1.264 -1.852 3.321 0.187 8.432 99.78 1.325 1.29 0.146 92 2.502 2.500 2.503 2.503 1.267 -1.175 2. 067 0.194 8.114 98.14 1.346 -0.79 0.147 100 2.496 2.496 2.498 2.497 1.265 -0.497 1. 5 0.194 8.114 98.62 1.325 -0.46 0.145 102 2.495 2.495 2.497 2.496 1.265 -0.361 1.795 0.194 8.477 98.14 1.346 0.3 0.148 106 2.498 2.497 2.499 2.497 1.263 -0.135 4. 791 0.198 8.069 98.62 1.325 -0.962 0.15 73 2.497 2.494 2.499 2.496 1.265 -0.407 7. 235 0.187 8.114 98.62 1.325 -0.704 0.148 115 2.499 2.497 2.502 2.497 1.265 -1.039 6. 42 0.194 8.387 98.09 1.325 -0.919 0.146 ** a test equipment anomaly caused the low reading for ripple rejection at the 0k test step for serial 80 and the cntrl1 sample. the problem was fixed prior to the completion of the 30k rad(si) dose step. * data collected for information purposes only parameter not specified for post radiation. electrical test data (post radiation ? 30k rad(si)) test vout1 vout2 v out3 vout4 vout5 line reg load reg vdrop current limit ripple rej. vshdn vout shdn ishdn* max limit 2.625 2.625 2.625 2.625 2.625 12.5 147.6 0.4 10 200 1.7 0.1 ---- min limit 2.375 2.375 2.375 2.375 2.375 -12.5 - 147.6 0 3 40 1 -0.1 ---- serial # (v) (v) (v) (v) (v) (mv) (mv) (v) (a) (db) (v) (mv) (ma) cntrl 2.512 2.505 2.512 2.505 1.269 -0.316 7.963 0.203 9.128 98.05 1.322 -2.179 0.149 75 2.509 2.507 2.511 2.508 1.269 -1.22 0. 517 0.233 8.629 98.62 1.343 -1.777 0.144 80 2.515 2.512 2.516 2.513 1.272 0.09 0. 382 0.225 8.492 100.42 1.343 -1.748 0.142 81 2.514 2.513 2.517 2.512 1.272 -0.135 0. 317 0.225 8.447 100.38 1.343 -1.834 0.138 91 2.514 2.512 2.514 2.512 1.272 -0.225 0. 317 0.225 8.765 100.42 1.343 -1.23 0.144 92 2.519 2.516 2.519 2.516 1.274 -1.988 0. 389 0.233 8.447 98.62 1.363 -2.539 0.143 100 2.514 2.512 2.515 2.512 1.273 0.451 0. 219 0.233 8.447 98.09 1.343 -0.482 0.142 102 2.511 2.510 2.512 2.511 1.270 -1.039 0. 329 0.229 8.810 100.42 1.343 -2.338 0.141 106 2.516 2.514 2.519 2.514 1.272 -1.446 0. 586 0.233 8.447 98.09 1.363 -1.518 0.144 73 2.513 2.511 2.513 2.510 1.270 -0.723 4. 778 0.233 8.447 100.43 1.322 -1.072 0.144 115 2.513 2.510 2.513 2.511 1.271 -1.581 0. 444 0.233 8.447 99.18 1.363 -1.777 0.142 * data collected for information purposes only parameter not specified for post radiation.
tid test report iruh33pa13b20k december 2005 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 11 electrical test data (post radiation ? 50k rad(si)) test vout1 vout2 v out3 vout4 vout5 line reg load reg vdrop current limit ripple rej. vshdn vout shdn ishdn* max limit 2.625 2.625 2.625 2.625 2.625 12.5 147.6 0.4 10 200 1.7 0.1 ---- min limit 2.375 2.375 2.375 2.375 2.375 -12.5 -147.6 0 3 40 1 -0.1 ---- serial # (v) (v) (v) (v) (v) (mv) (mv) (v) (a) (db) (v) (mv) (ma) cntrl 2.505 2.503 2.505 2.503 1.267 -0.045 1.433 0.195 8.759 98.69 1.318 -0.301 0.146 75 2.529 2.526 2.529 2.525 1.278 -0.813 4. 386 0.229 8.123 101.18 1.381 -0.790 0.140 80 2.523 2.521 2.525 2.522 1.277 -0.09 3. 635 0.221 8.532 99.85 1.401 -0.258 0.141 81 2.529 2.527 2.529 2.527 1.280 -0.813 3.004 0.229 8.214 101.9 1.381 0.030 0.139 91 2.529 2.529 2.530 2.528 1.280 -0.316 2. 556 0.225 8.486 102.77 1.401 -0.661 0.136 92 2.530 2.528 2.530 2.528 1.279 -0.948 2. 162 0.229 8.395 100.45 1.381 -1.639 0.140 100 2.533 2.530 2.534 2.530 1.281 0.135 3. 502 0.229 8.486 98.69 1.422 -0.388 0.141 102 2.529 2.528 2.529 2.526 1.280 -1.129 3. 396 0.229 8.259 99.25 1.422 -0.603 0.141 106 2.527 2.525 2.528 2.524 1.279 -0.09 2. 504 0.229 8.532 101.94 1.401 -1.294 0.139 73 2.529 2.526 2.529 2.525 1.278 -0.813 4. 386 0.229 8.123 101.19 1.381 -0.790 0.140 115 2.498 2.495 2.496 2.494 1.263 -0.090 1. 919 0.180 9.167 98.16 1.297 -2.387 0.149 * data collected for information purposes only parameter not specified for post radiation. electrical test data (post radiation ? 100k rad(si)) test vout1 vout2 v out3 vout4 vout5 line reg load reg vdrop current limit ripple rej. vshdn vout shdn ishdn* max limit 2.625 2.625 2.625 2.625 2.625 12.5 147.6 0.4 10 200 1.7 0.1 ---- min limit 2.375 2.375 2.375 2.375 2.375 -12.5 -147.6 0 3 40 1 -0.1 ---- serial # (v) (v) (v) (v) (v) (mv) (mv) (v) (a) (db) (v) (mv) (ma) cntrl 2.509 2.504 2.507 2.504 1.268 0.497 3.466 0.199 8.982 98.09 1.337 -1.840 0.150 75 2.564 2.559 2.561 2.558 1.293 -0.226 2. 500 0.248 8.029 91.62 1.526 -2.733 0.133 80 2.552 2.550 2.554 2.550 1.290 0.271 5. 296 0.241 8.483 97.60 1.505 -2.445 0.137 81 2.558 2.556 2.558 2.557 1.293 -0.135 1. 878 0.252 8.392 95.51 1.505 -1.452 0.133 91 2.563 2.561 2.563 2.560 1.298 0.316 1. 520 0.248 8.165 94.40 1.505 -1.034 0.133 92 2.564 2.560 2.562 2.560 1.295 -1.445 1. 159 0.252 8.437 92.38 1.505 -2.157 0.136 100 2.564 2.561 2.562 2.560 1.294 -0.452 1. 748 0.252 8.483 95.51 1.505 -2.085 0.136 102 2.561 2.557 2.559 2.556 1.293 0.181 2. 895 0.256 8.210 96.30 1.526 -1.380 0.132 106 2.560 2.558 2.561 2.559 1.295 -0.181 2. 520 0.252 8.528 93.80 1.547 -0.963 0.134 73 2.564 2.559 2.561 2.558 1.293 -0.226 2. 500 0.248 8.029 91.62 1.526 -2.733 0.133 115 2.495 2.494 2.494 2.492 1.261 0.000 1. 577 0.188 9.073 98.66 1.316 -1.178 0.148 * data collected for information purposes only parameter not specified for post radiation.
tid test report iruh33pa13b20k december 2005 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 12 electrical test data (post radiation ? 200k rad(si)) test vout1 vout2 v out3 vout4 vout5 line reg load reg vdrop current limit ripple rej. vshdn vout shdn ishdn* max limit 2.625 2.625 2.625 2.625 2.625 12.5 147.6 0.4 10 200 1.7 0.1 ---- min limit 2.375 2.375 2.375 2.375 2.375 -12.5 -147.6 0 3 40 1 -0.1 ---- serial # (v) (v) (v) (v) (v) (mv) (mv) (v) (a) (db) (v) (mv) (ma) cntrl 2.513 2.511 2.513 2.511 1.276 0.994 4.007 0.204 9.143 99.189 1.339 -2.652 0.149 75 2.593 2.592 2.592 2.590 1.315 0.63 2. 10 0.230 8.507 88.06 1.631 -1.348 0.131 80 2.602 2.601 2.600 2.600 1.319 -0.81 0. 42 0.230 8.371 87.00 1.610 -1.276 0.129 81 2.609 2.607 2.608 2.608 1.322 0.23 1. 36 0.264 8.462 63.24 1.631 -1.090 0.126 91 2.617 2.613 2.611 2.609 1.323 -0.68 0. 70 0.234 8.144 61.99 1.610 -1.391 0.130 92 2.612 2.607 2.606 2.605 1.321 -1.18 0. 06 0.234 8.371 63.29 1.631 -0.732 0.129 100 2.611 2.605 2.603 2.602 1.320 -1.22 -0 .41 0.234 8.507 61.95 1.610 -1.319 0.129 102 2.603 2.602 2.602 2.602 1.320 -1.22 -1 .05 0.230 8.462 63.29 1.631 -1.606 0.128 106 2.615 2.611 2.609 2.607 1.322 -1.13 0. 45 0.241 8.189 61.86 1.631 -0.861 0.128 73 2.618 2.613 2.613 2.610 1.324 -0.723 2. 942 0.226 8.507 61.99 1.589 -1.735 0.130 115 2.606 2.605 2.604 2.603 1.322 -0.63 -0 .29 0.238 8.507 63.29 1.631 -0.646 0.125 * data collected for information purposes only parameter not specified for pre-radiation.
tid test report iruh33pa13b20k december 2005 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 13 appendix b radiation test specification
tid test report iruh33pa13b20k december 2005 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 14 specification # t090104g revision: a ecn # date: ir base part no . irruh33pa13b20k product discription: adjustable low dropout voltage regulato r automatic test tester: pxi test console 04-134-tc prog. ref. test symbol test conditions rad level: min max units a output voltage v out vin = 3.30 vdc pre rad 2.475 2.525 vdc iout = 1.5 a a output voltage v out vin = 3.3 vdc pre rad 2.375 2.625 vdc iout = 50 ma a output voltage v out vin = 3.8 vdc pre rad 2.375 2.625 vdc iout = 3.0 a a output voltage v out vin = 2.8 vdc pre rad 2.375 2.625 vdc iout = 50 ma a output voltage v ref vin = 3.3 vdc pre rad 1.225 1.305 vdc iout = 25ma a line regulation vrline 2.9v < vi n < 3.8v pre rad -6.25 6.25 mvdc iout = 50 ma a load regulation vrload vin = 3.3v pre rad -73.8 73.8 mvdc 50ma < io < 3.0a a dropout voltage vdrop iout = 3a pre rad 0 0.40 vdc a current limit i limit vin = 3.3 vdc pre rad 3.0 10.0 a a ripple rejection rrej f= 120 hz pre rad 65 200 db iout = 50 ma a shutdown vshutdown pre rad 1.0 1.6 v threshold a output voltage vout shdn vin = 3.3 vdc pre rad -0.1 +0.1 v at shutdown iout = 50 ma vshdn = +5 vdc a shutdown ishutdown vin = 3.3 vdc pre rad --- --- ua pin current iout = 50 ma vshdn = +5 vdc notes: 2. these tests are performed for information purposes only. this is proprietary information of international rectifier hi-rel products and it is understood that this will not be divulged to a third party or used in any way prejudicial to the interest of international rectifier hi-rel products. 1. regulator shall be biased at a nominal vout of 2.5v with radjust set at 976 ohms and tested to the limits specified on the data sheet. 2 notes table 1: pre radiation tests, 25c tests only 1 vin = 5.0 vdc, vshutdown ramp from 0.8v to 4.8v, output monitored for 100mv dro p below
tid test report iruh33pa13b20k december 2005 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 15 automatic test tester: pxi test console 04-134-tc prog. ref. test symbol test conditions rad level: min max units b output voltage v out vin = 3.30 vdc post rad 2.375 2.625 vdc iout = 1.5 a b output voltage v out vin = 3.3 vdc post rad 2.375 2.625 vdc iout = 50 ma b output voltage v out vin = 3.8 vdc post rad 2.375 2.625 vdc iout = 3.0 a b output voltage v out vin = 2.8 vdc post rad 2.375 2.625 vdc iout = 50 ma b output voltage v ref vin = 3.3 vdc post rad 1.202 1.328 vdc iout = 25ma b line regulation vrline 2.9v < vin < 3.8v post rad -12.5 12.5 mvdc iout = 50 ma b load regulation vrload vin = 3.3v post rad -147.6 147.6 mvdc 50ma < io < 3.0a b dropout voltage vdrop iout = 3a post rad 0 0.40 vdc b current limit i limit vin = 3.3 vdc post rad 3.0 10.0 a b ripple rejection rrej f= 120 hz post rad 40 200 db iout = 50 ma b shutdown vshutdown post rad 1.0 1.7 v threshold b output voltage vout shdn vin = 3.3 vdc post rad -0.1 +0.1 v at shutdown iout = 50 ma vshdn = +5 vdc b shutdown ishutdown vin = 3.3 vdc post rad --- --- ua pin current iout = 50 ma vshdn = +5 vdc notes: 2. these tests are performed for information purposes only. this is proprietary information of international rectifier hi-rel products and it is understood that this will not be divulged to a third party or used in any way prejudicial to the interest of international rectifier hi-rel products. 2 notes table 2: post radiation tests, 25c tests only 1 vin = 5.0 vdc, vshutdown ramp from 0.8v to 4.8v, output 1. regulator shall be biased at a nominal vout of 2.5v with radjust set at 976 ohms and tested to the limits specified on the data sheet.
tid test report iruh33pa13b20k december 2005 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 16 radiation circuit 05-043-ta 30k, 20k, 50k, 50k, 50k gamma cave unbiased, in circuit with power supply off 0.01 to 0.10 rad(si)/sec tf-02-008 05-043-ta unbiased, in circuit with power supply off 30k, 20k, 50k, 50k, 50k 50 to 300 rad(si)/sec tf-02-011 bias conditions dose step profile program card number dose rate range board number dose step profile test temperature board number low dose rate 3 dose rate range 0.01 to 0.10 rad(si)/sec 25c +/-5c table 3: total dose radiation requirements high dose rate 3 vin = 6.8v, vout = 2.5v, io=10ma bias conditions chamber 30k, 20k, 50k, 50k, 50k 50 to 300 rad(si)/sec tf-02-011 05-043-ta gamma cave 25c +/-5c 3. performed at during initial qualification of the device and retested only when specified by quality assurance due to a chang e per mil-prf-38534. 25c +/-5c 25c +/-5c test temperature tf-02-008 05-043-ta program card number chamber hot cell hot cell 30k, 20k, 50k, 50k, 50k vin = 6.8v, vout = 2.5v, io=10ma vin 976 ohm 1% 1uf 50v 1uf 50v 250 ohm 5% 1 2 3 4 5

▲Up To Search▲

Price & Availability of GSIONIRUH33PA13B20K

	To Download GSIONIRUH33PA13B20K Datasheet File
If you can't view the Datasheet, Please click here to try to view without PDF Reader .