TC74ACT521P/f 2007-10-01 1 toshiba cmos digital integrat ed ci rcuit silicon monolithic TC74ACT521P,tc74act521f 8-bit equality comparator the tc74act521 is an advanced high speed cmos 8-bit digital comparator fabricated with silicon gate and double-layer metal wiring c 2 mos technology. it achieves the high speed op eration similar to equivalent bipolar schottky ttl while ma intaining the cmos low power dissipation. this device may be used as a level converter for interfacing ttl or nmos to high speed cmos. the inputs are compatible with ttl, nmos and cmos output voltage levels. it compares two 8-bit binary or bcd words applied inputs p 0 ~p 7 , and inputs q 0 ~q 7 , and indicates whether or not they are equal. a signal active low enable is prov ided to facilitate cascading of several packages to compare of words greater than 8 bits. all inputs are equipped with prot ection circuits against static discharge or transi ent excess voltage. features ? high speed: t pd = 6.4 ns (typ.) at v cc = 5 v ? low power dissipation: i cc = 8 a (max) at ta = 25c ? compatible with ttl outputs: v il = 0.8 v (max) v ih = 2.0 v (min) ? symmetrical output impedance: |i oh | = i ol = 24 ma (min) capability of driving 50 transmission lines. ? balanced propagation delays: t plh ? t phl ? pin and function compatible with 74f521 pin assignment TC74ACT521P tc74act521f weight dip20-p-300-2.54a : 1.30 g (typ.) sop20-p-300-1.27a : 0.22 g (typ.)
TC74ACT521P/f 2007-10-01 2 iec logic symbol truth table inputs output p, q g qp = p = q l l p q l h x h h x: don?t care system diagram
TC74ACT521P/f 2007-10-01 3 absolute maximum ratings (note 1) characteristics symbol rating unit supply voltage range v cc ?0.5~7.0 v dc input voltage v in ?0.5~v cc + 0.5 v dc output voltage v out ?0.5~v cc + 0.5 v input diode current i ik 20 ma output diode current i ok 50 ma dc output current i out 50 ma dc v cc /ground current i cc 100 ma power dissipation p d 500 (dip) (note 2)/180 (sop) mw storage temperature t stg ?65~150 c note 1: exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in ic performance or even destruction. using continuously under heavy loads (e.g. the app lication of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temper ature/current/voltage, etc. ) are within the absolute maximum ratings and the operating ranges. please design the appropriate reliability upon reviewing the toshiba semiconductor reliability handbook (?handling precautions?/?derating concept and methods?) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). note 2: 500 mw in the range of ta = ? 40~65c. from ta = 65 to 85c a derating factor of ? 10 mw/c should be applied up to 300 mw. operating ranges (note) characteristics symbol rating unit supply voltage v cc 4.5~5.5 v input voltage v in 0~v cc v output voltage v out 0~v cc v operating temperature t opr ?40~85 c input rise and fall time dt/dv 0~10 ns/v note: the operating ranges must be maintained to ensure the normal oper ation of the device. unused inputs must be tied to either vcc or gnd.
TC74ACT521P/f 2007-10-01 4 electrical characteristics dc characteristics ta 25c ta 40~85c characteristics symbol test condition v cc (v) min typ. max min max unit high-level input voltage v ih 4.5~ 5.5 2.0 2.0 v low-level input voltage v il 4.5~ 5.5 0.8 0.8 v high-level output voltage v oh v in v ih or v il i oh 50 p a i oh 24 ma i oh 75 ma (note) 4.5 4.5 5.5 4.4 3.94 4.5 4.4 3.80 3.85 v low-level output voltage v ol v in v ih or v il i ol 50 p a i ol 24 ma i ol 75 ma (note) 4.5 4.5 5.5 0.0 0.1 0.36 0.1 0.44 1.65 v input leakage current i in v in v cc or gnd 5.5 r0.1 r1.0 p a i cc v in v cc or gnd 5.5 8.0 80.0 p a quiescent supply current i c per input: v in 3.4 v other input: v cc or gnd 5.5 1.35 1.5 ma note: this spec indicates the capability of driving 50 : transmission lines. one output should be tested at a ti me for a 10 ms maximum duration. ac characteristics (c l 50 pf, r l 500 : , input: t r t f 3 ns) ta 25c ta 40~85c characteristics symbol test condition v cc (v) min typ. max min max unit propagation delay time (pn, qn- qp ) t plh t phl 5.0 r 0.5 7.1 11.4 1.0 13.0 ns propagation delay time ( g- qp ) t plh t phl 5.0 r 0.5 5.7 8.3 1.0 9.5 ns input capacitance c in 5 10 10 pf power dissipation capacitance c pd (note) 29 pf note: c pd is defined as the value of the internal equivalent capacitance which is ca lculated from the operating current consumption without load. average operating current can be obtained by the equation: i cc (opr) c pd ?v cc ?f in i cc
TC74ACT521P/f 2007-10-01 5 package dimensions weight: 1.30 g (typ.)
TC74ACT521P/f 2007-10-01 6 package dimensions weight: 0.22 g (typ.)
TC74ACT521P/f 2007-10-01 7 restrictions on product use ? toshiba corporation, and its subsidiaries and affiliates (collect ively ?toshiba?), reserve the right to make changes to the in formation in this document, and related hardware, software a nd systems (collectively ?product?) without notice. ? this document and any information herein may not be reproduc ed without prior written permission from toshiba. even with toshiba?s written permission, reproduc tion is permissible only if reproducti on is without alteration/omission. ? though toshiba works continually to improve product?s quality and reliability, product can malfunction or fail. customers are responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and systems which minimize risk and avoid situat ions in which a malfunction or failure of product could cause loss of human life, b odily injury or damage to property, including data loss or corruption. before creating and producing des igns and using, customers mus t also refer to and comply with (a) the latest versions of all re levant toshiba information, including without limitation, this d ocument, the specifications, the data sheets and applic ation notes for product and the precautions and conditions set forth in the ?tosh iba semiconductor reliability handbook? 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