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1 application 1. the acs756 outputs an analog signal, v out , that varies linearly with the uni- or bi-directional ac or dc primary sampled current, i p , within the range specified. c f is for optimal noise management, with values that depend on the application. acs756 description the allegro acs756 family of current sensor ics provides economical and precise solutions for ac or dc current sensing in industrial, automotive, commercial, and communications systems. the device package allows for easy implementation by the customer. typical applications include motor control, load detection and management, power supplies, and overcurrent fault protection. the device consists of a precision, low-offset linear hall circuit with a copper conduction path located near the die. applied current flowing through this copper conduction path generates a magnetic field which the hall ic converts into a proportional voltage. device accuracy is optimized through the close proximity of the magnetic signal to the hall transducer. a precise, proportional voltage is provided by the low-offset, chopper-stabilized bicmos hall ic, which is programmed for accuracy at the factory. the output of the device has a positive slope (>v cc / 2) when an increasing current flows through the primary copper conduction path (from terminal 4 to terminal 5), which is the path used for current sampling. the internal resistance of this conductive path is 130 ? typical, providing low power loss. the thickness of the copper conductor allows survival of the device at up to 5 overcurrent conditions. the terminals of the acs756-ds, rev. 6 features and benefits ? industry-leading noise performance through proprietary amplifier and filter design techniques ? total output error 0.8% at t a = 25c ? small package size, with easy mounting capability ? monolithic hall ic for high reliability ? ultra-low power loss: 130 ? internal conductor resistance ? 3 kv rms minimum isolation voltage from pins 1-3 to pins 4-5 ? 3.0 to 5.0 v, single supply operation ? 3 s output rise time in response to step input current ? 20 or 40 mv/a output sensitivity ? output voltage proportional to ac or dc currents ? factory-trimmed for accuracy ? extremely stable output offset voltage ? nearly zero magnetic hysteresis fully integrated, hall effect-based linear current sensor ic with 3 kvrms voltage isolation and a low-resistance current conductor continued on the next page? package: 5 pin package (suffix pff) typical application +5 v v out r f c f c byp 0.1 f ip+ ip? 2 gnd 4 5 acs756 3 1 viout vcc i p additional leadforms available for qualifying volumes tv america certificate number: u8v 09 05 54214 021
fully integrated, hall effect-based linear current sensor ic with 3 kvrms voltage isolation and a low-resistance current conductor acs756 2 allegro microsystems, inc. 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com selection guide part number 1 t op (c) primary sampled current , i p (a) packing 2 ACS756SCA-050B-PFF-T ?20 to 85 50 34 per tube acs756sca-100b-pff-t ?20 to 85 100 acs756kca-050b-pff-t ?40 to 125 50 1 additional leadform options available for qualified volumes 2 contact allegro for additional packing options. conductive path are electrically isolated from the signal leads (pins 1 through 3). this allows the acs756 family of sensor ics to be used in applications requiring electrical isolation without the use of opto-isolators or other costly isolation techniques. the device is fully calibrated prior to shipment from the factory. the acs75x family is lead (pb) free. all leads are plated with 100% matte tin, and there is no pb inside the package. the heavy gauge leadframe is made of oxygen-free copper. description (continued) absolute maximum ratings characteristic symbol notes rating units forward supply voltage v cc 8v reverse supply voltage v rcc ?0.5 v forward output voltage v iout 28 v reverse output voltage v riout ?0.5 v working voltage for reinforced isolation v working-r voltage applied between pins 1-3 and 4-5; tested at 3000 vac for 1 minute according to ul standard 60950-1 353 vdc / v pk working voltage for basic isolation v working-b voltage applied between pins 1-3 and 4-5; tested at 3000 vac for 1 minute according to ul standard 60950-1 500 vdc / v pk output source current i out(source) viout to gnd 3 ma output sink current i out(sink) vcc to viout 1 ma nominal operating ambient temperature t op range k ?40 to 125 oc range s ?20 to 85 oc maximum junction t j (max) 165 oc storage temperature t stg ?65 to 165 oc
fully integrated, hall effect-based linear current sensor ic with 3 kvrms voltage isolation and a low-resistance current conductor acs756 3 allegro microsystems, inc. 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com ip+ ip? viout gnd vcc 4 5 3 2 1 terminal list table number name description 1 vcc device power supply terminal 2 gnd signal ground terminal 3 viout analog output signal 4 ip+ terminal for current being sampled 5 ip? terminal for current being sampled functional block diagram pin-out diagram amp out vcc +5 v viout gnd filter dynamic offset cancellation 0.1 f ip? ip+ gain temperature coefficient offset trim control to all subcircuits
fully integrated, hall effect-based linear current sensor ic with 3 kvrms voltage isolation and a low-resistance current conductor acs756 4 allegro microsystems, inc. 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com common operating characteristics 1 over full range of t op , and v cc = 5 v, unless otherwise specified characteristic symbol test conditions min. typ. max. units supply voltage 2 v cc 3 5.0 5.5 v supply current i cc v cc = 5.0 v, output open ? 10 14 ma power on time t po t a = 25c ? 35 ? s rise time t r i p = three-quarter scale of i p +, t a = 25c, c out = 0.47 nf ? 3 ? s internal bandwidth 3 bw i ?3 db; i p is 10 a peak-to-peak; 100 pf from viout to gnd ? 120 ? khz output load resistance r load(min) viout to gnd 4.7 ? ? k output load capacitance c load(max) viout to gnd ? ? 10 nf primary conductor resistance r primary t a = 25c ? 130 ? ? symmetry e sym over half-scale of ip 98.5 100 101.5 % bidirectional 0 a output v out(qbi) i p = 0 a, t a = 25c ? v cc /2 ? v magnetic offset error i errom i p = 0 a, after excursion of 100 a ? 0.23 ? a ratiometry v rat v cc = 4.5 to 5.5 v ? 100 ? % propagation time t prop t a = 25c, c out = 100 pf, ? 1 ? s 1 device is factory-trimmed at 5 v, for optimal accuracy. 2 devices are programmed for maximum accuracy at 5.0 v v cc levels. the device contains ratiometry circuits that accurately alter the 0 a output volt- age and sensitivity level of the device in proportion to the applied v cc level. however, as a result of minor nonlinearities in the ratiometry circuit ad- ditional output error will result when v cc varies from the 5 v v cc level. customers that plan to operate the device from a 3.3 v regulated supply should contact their local allegro sales representative regarding expected device accuracy levels under these bias conditions. 3 guaranteed by design.
fully integrated, hall effect-based linear current sensor ic with 3 kvrms voltage isolation and a low-resistance current conductor acs756 5 allegro microsystems, inc. 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com x 050 performance characteristics over range s 1 : t op = ?20c to 85c, v cc = 5 v, unless otherwise specified characteristic symbol test conditions min. typ. max. units primary sampled current i p ?50 ? 50 a sensitivity sens ta half scale of i p applied for 5 ms, t a = 25c ? 40 ? mv/a sens top half scale of i p applied for 5 ms 38.3 ? 41.7 mv/a noise 2 v noise t a = 25c, 10 nf on viout pin to gnd ? 10 ? mv nonlinearity e lin(ht) up to full scale of i p , i p applied for 5 ms, t op = 25c to 85c ? 1 ? 1 % e lin(lt) up to full scale of i p , i p applied for 5 ms, t op = ?20c to 25c ? 1 ? 1 % electrical offset voltage 3 v oe(ta) i p = 0 a, t a = 25c ? 2 ? mv v oe(top)ht i p = 0 a, t op = 25c to 85c ?30 ? 30 mv v oe(top)lt i p = 0 a, t op = ?20c to 25c ?30 ? 30 mv total output error 4 e tot(ht) over full scale of i p , i p applied for 5 ms, t op = 25c to 85c ?5 ? 5 % e tot(lt) over full scale of i p , i p applied for 5 ms, t op = ?20c to 25c ?5 ? 5 % 1 device may be operated at higher primary current levels, i p , and ambient temperatures, t op , provided that the maximum junction temperature, t j (max), is not exceeded. 2 6 noise voltage. 3 v oe(top) drift is referred to ideal v oe = 2.5 v at 0 a. 4 percentage of i p , with i p = 25 a. output filtered. x 050 performance characteristics over range k 1 : t op = ?40c to 125c, v cc = 5 v, unless otherwise specified characteristic symbol test conditions min. typ. max. units primary sampled current i p ?50 ? 50 a sensitivity sens ta half scale of i p applied for 5 ms, t a = 25c ? 40 ? mv/a sens top half scale of i p applied for 5 ms 37.2 ? 42.8 mv/a noise 2 v noise t a = 25c, 10 nf on viout pin to gnd ? 10 ? mv nonlinearity e lin(ht) up to full scale of i p , i p applied for 5 ms, t op = 25c to 125c ? 1 ? 1 % e lin(lt) up to full scale of i p , i p applied for 5 ms, t op = ?40c to 25c ? 1.8 ? 1.8 % electrical offset voltage 3 v oe(ta) i p = 0 a, t a = 25c ? 2 ? mv v oe(top)ht i p = 0 a, t op = 25c to 125c ?30 ? 30 mv v oe(top)lt i p = 0 a, t op = ?40c to 25c ?60 ? 60 mv total output error 4 e tot(ht) over full scale of i p , i p applied for 5 ms, t op = 25c to 125c ?7.5 ? 7.5 % e tot(lt) over full scale of i p , i p applied for 5 ms, t op = ?40c to 25c ?7.5 ? 7.5 % 1 device may be operated at higher primary current levels, i p , and ambient temperatures, t op , provided that the maximum junction temperature, t j (max), is not exceeded. 2 6 noise voltage. 3 v oe(top) drift is referred to ideal v oe = 2.5 v at 0 a. 4 percentage of i p , with i p = 25 a. output filtered.
fully integrated, hall effect-based linear current sensor ic with 3 kvrms voltage isolation and a low-resistance current conductor acs756 6 allegro microsystems, inc. 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com x 100 performance characteristics over range s 1 : t op = ?20c to 85c, v cc = 5 v, unless otherwise specified characteristic symbol test conditions min. typ. max. units primary sampled current i p ?100 ? 100 a sensitivity sens ta half scale of i p applied for 5 ms, t a = 25c ? 20 ? mv/a sens top half scale of i p applied for 5 ms 18.2 ? 21.8 mv/a noise 2 v noise t a = 25c, 10 nf on viout pin to gnd ? 6 ? mv nonlinearity e lin(ht) up to full scale of i p , i p applied for 5 ms, t op = 25c to 85c ? 1.75 ? 1.75 % e lin(lt) up to full scale of i p , i p applied for 5 ms, t op = ?20c to 25c ? 1 ? 1 % electrical offset voltage 3 v oe(ta) i p = 0 a, t a = 25c ? 2 ? mv v oe(top)ht i p = 0 a, t op = 25c to 85c ?30 ? 30 mv v oe(top)lt i p = 0 a, t op = ?20c to 25c ?30 ? 30 mv total output error 4 e tot(ht) over full scale of i p , i p applied for 5 ms, t op = 25c to 85c ?8 ? 8 % e tot(lt) over full scale of i p , i p applied for 5 ms, t op = ?20c to 25c ?7 ? 7 % 1 device may be operated at higher primary current levels, i p , and ambient temperatures, t op , provided that the maximum junction temperature, t j (max), is not exceeded. 2 6 noise voltage. 3 v oe(top) drift is referred to ideal v oe = 2.5 v at 0 a. 4 percentage of i p , with i p = 25 a. output filtered.
fully integrated, hall effect-based linear current sensor ic with 3 kvrms voltage isolation and a low-resistance current conductor acs756 7 allegro microsystems, inc. 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com sensitivity (sens). the change in device output in response to a 1 a change through the primary conductor. the sensitivity is the product of the magnetic circuit sensitivity (g / a) and the linear ic amplifier gain (mv/g). the linear ic amplifier gain is pro- grammed at the factory to optimize the sensitivity (mv/a) for the half-scale current of the device. noise (v noise ). the noise floor is derived from the thermal and shot noise observed in hall elements. dividing the noise (mv) by the sensitivity (mv/a) provides the smallest current that the device is able to resolve. nonlinearity (e lin ). the degree to which the voltage output from the ic varies in direct proportion to the primary current through its half-scale amplitude. nonlinearity in the output can be attributed to the saturation of the flux concentrator approaching the half-scale current. the following equation is used to derive the linearity: 100 1? [ { [ { v iout _half-scale amperes ? v iout(q) gain % sat ( ) 2 ( v iout _quarter-scale amperes ? v iout(q) ) where ? gain = the gain variation as a function of temperature changes from 25oc, % sat = the percentage of saturation of the flux concentra- tor, which becomes significant as the current being sampled approaches half-scale i p , and v iout_half-scale amperes = the output voltage (v) when the sampled current approximates half-scale i p . symmetry (e sym ). the degree to which the absolute voltage output from the ic varies in proportion to either a positive or negative half-scale primary current. the following equation is used to derive symmetry: 100 v iout _+ half-scale amperes ? v iout(q) v iout(q) ? v iout _?half-scale amperes ?? ratiometry. the device features a ratiometric output. this means that the quiescent voltage output, v ioutq , and the mag- netic sensitivity, sens, are proportional to the supply voltage, v cc . the ratiometric change (%) in the quiescent voltage output is defined as: v cc 5 v v ioutq(v cc ) v ioutq(5v) $ v ioutq( $ v) = s % and the ratiometric change (%) in sensitivity is defined as: v cc 5 v = s % $ sens ( $ v sens (v cc sens ( v quiescent output voltage (v iout(q) ). the output of the device when the primary current is zero. for a unipolar supply voltage, it nominally remains at v cc 2. thus, v cc = 5 v translates into v iout(q) = 2.5 v. variation in v out(q) can be attributed to the res- olution of the allegro linear ic quiescent voltage trim, magnetic hysteresis, and thermal drift. electrical offset voltage (v oe ). the deviation of the device out- put from its ideal quiescent value of v cc 2 due to nonmagnetic causes. magnetic offset error (i errom ). the magnetic offset is due to the residual magnetism (remnant field) of the core material. the magnetic offset error is highest when the magnetic circuit has been saturated, usually when the device has been subjected to a full-scale or high-current overload condition. the magnetic offset is largely dependent on the material used as a flux concentrator. the larger magnetic offsets are observed at the lower operating temperatures. total output error (e tot ). the maximum deviation of the actual output from its ideal value, also referred to as accuracy , illustrated graphically in the output voltage versus current chart on the following page. e tot is divided into four areas: ?? 0 a at 25c. accuracy at the zero current flow at 25c, with- out the effects of temperature. ?? 0 a over temperature. accuracy at the zero current flow including temperature effects. ?? half-scale current at 25c. accuracy at the the half-scale current at 25c, without the effects of temperature. ?? half-scale current over temperature. accuracy at the half- scale current flow including temperature effects. definitions of accuracy characteristics
fully integrated, hall effect-based linear current sensor ic with 3 kvrms voltage isolation and a low-resistance current conductor acs756 8 allegro microsystems, inc. 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com output voltage versus sampled current total output error at 0 a and at half-scale current increasing v iout (v) +i p (a) accuracy accuracy accuracy 25c only accuracy 25c only accuracy 25c only accuracy 0 a vr oe $ temp erature average v iout ?i p (a) vr oe $ temp erature vr oe $ temp erature decreasing v iout (v) i p (min) i p (max) half scale definitions of dynamic response characteristics propagation delay (t prop ). the time required for the device output to reflect a change in the primary current signal. propaga- tion delay is attributed to inductive loading within the linear ic package, as well as in the inductive loop formed by the primary conductor geometry. propagation delay can be considered as a fixed time offset and may be compensated. primary current transducer output 90 0 i (%) propagation time, t prop t primary current transducer output 90 10 0 i (%) rise time, t r t rise time (t r ). the time interval between a) when the device reaches 10% of its full scale value, and b) when it reaches 90% of its full scale value. the rise time to a step response is used to derive the bandwidth of the device, in which ?(?3 db) = 0.35 / t r . both t r and t response are detrimentally affected by eddy current losses observed in the conductive ic ground plane. power-on time (t po ). when the supply is ramped to its operat- ing voltage, the device requires a finite time to power its internal components before responding to an input magnetic field. power-on time, t po , is defined as the time it takes for the output voltage to settle within 10% of its steady state value under an applied magnetic field, after the power supply has reached its minimum specified operating voltage, v cc (min), as shown in the chart at right.
fully integrated, hall effect-based linear current sensor ic with 3 kvrms voltage isolation and a low-resistance current conductor acs756 9 allegro microsystems, inc. 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com chopper stabilization is an innovative circuit technique that is used to minimize the offset voltage of a hall element and an asso- ciated on-chip amplifier. allegro patented a chopper stabiliza- tion technique that nearly eliminates hall ic output drift induced by temperature or package stress effects. this offset reduction technique is based on a signal modulation-demodulation process. modulation is used to separate the undesired dc offset signal from the magnetically induced signal in the frequency domain. then, using a low-pass filter, the modulated dc offset is sup- pressed while the magnetically induced signal passes through the filter. as a result of this chopper stabilization approach, the output voltage from the hall ic is desensitized to the effects of temperature and mechanical stress. this technique produces devices that have an extremely stable electrical offset voltage, are immune to thermal stress, and have precise recoverability after temperature cycling. this technique is made possible through the use of a bicmos process that allows the use of low-offset and low-noise amplifiers in combination with high-density logic integration and sample and hold circuits. chopper stabilization technique amp regulator clock/logic hall element sample and hold low-pass filter concept of chopper stabilization technique
fully integrated, hall effect-based linear current sensor ic with 3 kvrms voltage isolation and a low-resistance current conductor acs756 10 allegro microsystems, inc. 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com package ca, 5-pin package, leadform pff 4 r1 1.91 3 21.4 0.5 r3 ? 0.8 ? 1.5 ? 0.5 r2 perimeter through-holes recommended 1o2 5o5 b 23 14.00.2 17.50.2 4.00.2 3.00.2 2.90.2 3.50.2 3.50.2 10.000.10 13.000.10 0.510.10 4.400.10 7.000.10 1.90.2 1.500.10 1 4 5 a a c b c b branding scale and appearance at supplier discretion dambar removal intrusion for reference only; not for tooling use (reference dwg-9111, dwg-9110) dimensions in millimeters dimensions exclusive of mold flash, gate burrs, and dambar protrusions exact case and lead configuration at supplier discretion within limits shown standard branding reference view n = device part number t = temperature code a = amperage range l = lot number y = last two digits of year of manufacture w = week of manufacture = supplier emblem branded face 0.381 +0.060 ?0.030 1 nnnnnnn ttt - aaa lllllll yyww pcb layout reference view
fully integrated, hall effect-based linear current sensor ic with 3 kvrms voltage isolation and a low-resistance current conductor acs756 11 allegro microsystems, inc. 115 northeast cutoff worcester, massachusetts 01615-0036 u.s.a. 1.508.853.5000; www.allegromicro.com revision history revision revision date description of revision rev. 6 march 25, 2011 augment v cc specification copyright ?2006-2011, allegro microsystems, inc. the products described herein are protected by u.s. patents: 6,781,359; and 7,265,531. allegro microsystems, inc. reserves the right to make, from time to time, such de par tures from the detail spec i fi ca tions as may be required to per- mit improvements in the per for mance, reliability, or manufacturability of its products. before placing an order, the user is cautioned to verify that the information being relied upon is current. allegro?s products are not to be used in life support devices or systems, if a failure of an allegro product can reasonably be expected to cause the failure of that life support device or system, or to affect the safety or effectiveness of that device or system. the in for ma tion in clud ed herein is believed to be ac cu rate and reliable. how ev er, allegro microsystems, inc. assumes no re spon si bil i ty for its use; nor for any in fringe ment of patents or other rights of third parties which may result from its use. for the latest version of this document, visit our website: www.allegromicro.com

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