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  electrical characteristics 1 ? 14.7456 mhz nominal frequency 2 ?? ? / at mode of vibration 3 ?? 20 70 operating temperature range 4 ?? 55125 storage temperature range 5 ?? 20 ppm max adjustment tolerance 6 ?? 30 ppm max tolerance over the temperature range 7 50 max at 25 equivalent seri es resistance 8 5.0 pf max shunt capacitance 9? gross leak: 1.3*1 0 -5 pa.m 3 /s max leakage fine leak: 2.1*1 0 -9 pa.m 3 /s max 10 ? 5ppm max/y aging 11 ? 7.0*5.0*1.1mm dimensions test condition 1.? ____18.0 ____pf load capacitance 2. ____100 ___ w level of drive 3.? equipment hp-e5100 net analysis meter/ax-150u heli0t-706/w helium leak test SMD7050 smd crystal http://www.luguang.cn mail:lge@luguang.cn
SMD7050 ?? dimensions unit: mm SMD7050 ??? mm ? packing ? 1000 ??? 1 ??????? ???? deposit 1000 pieces of the quartz crystal units in tape model, and pack enough bags in a packing case to make a 10,000 pi eces package. the packing format may be subject to change by quantity. SMD7050 ?? SMD7050 smd crystal http://www.luguang.cn mail:lge@luguang.cn
?? reliability test items 1 mechanical performance tests ? test item test method no. spec. no 1-1 ? shock 75 ?? 3 3 ??? orient the sample in any attitude and drop it three times from a height of 75 cm onto a hardwood board with a thickness of 3 cm a 1-2 vibration ? 1055hz, 1.5mm ? 1.5 ? , x y z ? 2 ?? 6 ? subject the sample to 1.5-minute cycl es of frequencies of 10 to 55 hz and amplitudes of 1.5mm for two hours in each of the x,y, and z directions, or 6 hours in total. a 1-3 leaking test ???? take measurements with a helium leakage detector or measure insulation resistance under pressure. e 1 ? SMD7050 smd crystal http://www.luguang.cn mail:lge@luguang.cn
?? reliability test items 3 environmental tests ? test item test method no. spec. no. 2-1 ? cold -40 F??? 500 ? expose the sample in an inoperative mode to 500 hours in a -40 a 2-2 dry heat +85 F??? 500 ? expose the sample in an inoperative mode to 500 hours in a 85 b 2-3 ? damp heat ?+65 ? 95%??? 500 ? expose the sample in an inoperative mode to 500 hours in a 65 and 95%rh b 2-4 ? thermal shock -40 C 30 ?100C 30 ?? 5 subject the sample to 5 temperature variation cycles at -40 for 30 minutes and +100 for the next 30 minutes in each cycles. a specifications 252 F??? 252F ? 2 ?? measurements shall be taken at 25 2 ,and after each test, the sample be exposed to two hours at 25 2 no. spec no. specification a ?, ??? 5ppm , ?? any variation between the pre- and post-test frequencies shall remain within 5ppm. the post-test equivalent series resistance shall remain within its specified tolerance range. b ?, ??? 10ppm , ?? any variation between the pre- and post-test frequencies shall remain within 10ppm. the post-test equivalent series resistance shall remain within its specified tolerance range. c ?, ??? after each test, no visible damage shall be manifested, nor shall the hermetic seal break down. d 90%. at least 90% of each dipped area shall be covered by fresh solder e 110 -2 pa m 3 /s max or ir 500m SMD7050 smd crystal http://www.luguang.cn mail:lge@luguang.cn


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