Part Number Hot Search : 
TLCY6100 25WAR 19R154C KRC655U 22N055 254262 FT838NB C64KIT
Product Description
Full Text Search
 

To Download LPT3363-S176-PF Datasheet File

  If you can't view the Datasheet, Please click here to try to view without PDF Reader .  
 
 


  Datasheet File OCR Text:
  npn silicon phototransistor led lamps pb lead-free parts a lpt3363/s176-pf 03 - mar. ligitek electronics co.,ltd. property of ligitek only data sheet doc. no : qw0905- rev. : date : - 2008 lpt3363/s176-pf
v v (br)eco emitter-collector breakdown voltage on state collector current collector dark current collector-emitter saturation voltage fall time rise time i ceo ip(on) v ce(sat) tf tr v ce =30v ic=800 a , rl=1k v ce =10v ee=0mw/c O na ma ma ma ma v ce =5v ee=1mw/c O p=940nm s v ic=0.5ma ee=20mw/c O 260 for 3 seconds -50 to +100 maximum ratings collector-emitter breakdown voltage parameter electrical characteristics(ta=25) ? lead soldering temperature(1.6mm from body) storage temperature operating temperature emitter-collector voltage collector-emitter voltage power dissipation maximum ratings(ta=25) ? note:1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted 2.specifications are subject to change without notice v (br)ceo symbol 5 30 parameter 100 package dimension test condition v unit ic=1ma ee=0mw/c O v v unit mw features . high illumination sensitivity . stable characteristics . spectrally and mechanically matched with ir emitter description the lpt3363/s176-pf series are silicon nitride passivated npn planar phototransistors with exceptionally stable characteristics and high illumination sensitivity the cases of lpt3363/s176-pf are encapsulated in water clear plastic t1 3/4 package individuallt -50 to +100 0.4 s 100 1.emitter 2.collector i e =100 a ee=0mw/c O max. typ. min. 30 5 5 5 1 2 4 8 8 4 2 lpt3363/s176-pf part no. page 1/3 ligitek electronics co.,ltd. property of ligitek only 8.6 1.0min 2.45typ 2 1 48min 0.5 typ 7.6 5.9 5.0 1.5 max
page 2/3 2.wave soldering profile soldering condition(pb-free) 1.iron: soldering iron:30w max temperature 350 c max soldering time:3 seconds max(one time only) distance:2mm min(from solder joint to body) ligitek electronics co.,ltd. property of ligitek only 150 time(sec) 260 c3sec max 260 temp( c) 2 /sec max 100 50 preheat 120 25 0 0 note:1.wave solder should not be made more than one time. 2.you can just only select one of the soldering conditions as above. 5 /sec max dip soldering preheat: 120 c max preheat time: 60seconds max ramp-up 2 c/sec(max) ramp-down:-5 c/sec(max) solder bath:260 c max dipping time:3 seconds max distance:2mm min(from solder joint to body) 60 seconds max lpt3363/s176-pf part no.
page3/3 ligitek electronics co.,ltd. property of ligitek only mil-std-883:1008 jis c 7021: b-10 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 jis c 7021: b-12 mil-std-202:103b jis c 7021: b-11 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) test condition 1.ta=85 5 2.t=1000 hrs (-24hrs, +72hrs) 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. description the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. the purpose of this test is the resistance of the device under tropical for hours. the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. reference standard test item reliability test: operating life test low temperature storage test high temperature storage test thermal shock test high temperature high humidity test mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 1.t.sol=230 5 2.dwell time=5 1sec 1.t.sol=260 5 2.dwell time= 10 1sec. this test intended to see soldering well performed or not. solder resistance test solderability test this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. lpt3363/s176-pf part no.


▲Up To Search▲   

 
Price & Availability of LPT3363-S176-PF

All Rights Reserved © IC-ON-LINE 2003 - 2022  

[Add Bookmark] [Contact Us] [Link exchange] [Privacy policy]
Mirror Sites :  [www.datasheet.hk]   [www.maxim4u.com]  [www.ic-on-line.cn] [www.ic-on-line.com] [www.ic-on-line.net] [www.alldatasheet.com.cn] [www.gdcy.com]  [www.gdcy.net]


 . . . . .
  We use cookies to deliver the best possible web experience and assist with our advertising efforts. By continuing to use this site, you consent to the use of cookies. For more information on cookies, please take a look at our Privacy Policy. X