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1 features ? high-density, high-performance, electrically-erasable complex programmable logic device ? 64 macrocells ? 5 product terms per macrocell, expandable up to 40 per macrocell ? 44, 68, 84, 100 pins ? 7.5 ns maximum pin-to-pin delay ? registered operation up to 125 mhz ? enhanced routing resources in-system programmability (isp) via jtag flexible logic macrocell ? d/t/latch configurable flip-flops ? global and individual register control signals ? global and individual output enable ? programmable output slew rate ? programmable output open collector option ? maximum logic utilization by burying a register with a com output advanced power management features ? automatic a standby for ?l? version ? pin-controlled 1 ma standby mode ? programmable pin-keeper circuits on inputs and i/os ? reduced-power feature per macrocell available in commercial and industrial temperature ranges available in 44-, 68-, and 84-lead plcc; 44- and 100-lead tqfp; and 100-lead pqfp advanced ee technology ? 100% tested ? completely reprogrammable ? 10,000 program/erase cycles ? 20-year data retention ? 2000v esd protection ? 200 ma latch-up immunity jtag boundary-scan testing to ieee std. 1149.1-1990 and 1149.1a-1993 supported pci-compliant 3.3v or 5.0v i/o pins security fuse feature enhanced features improved connectivity (additional feedback routing, alternate input routing) output enable product terms transparent ? latch mode combinatorial output with registered feedback within any macrocell three global clock pins itd (input transition detection) circuits on global clocks, inputs and i/o fast registered input from product term programmable ?pin-keeper? option v cc power-up reset option pull-up option on jtag pins tms and tdi advanced power management features ? edge-controlled power-down ?l? ? individual macrocell power option ? disable itd on global clocks, inputs and i/o high- performance complex programmable logic device atf1504as ATF1504ASL rev. 0950n?pld?07/02
2 atf1504as(l) 0950n?pld?07/02 44-lead tqfp top view 1 2 3 4 5 6 7 8 9 10 11 33 32 31 30 29 28 27 26 25 24 23 i/o/tdi i/o i/o gnd pd1/i/o i/o tms/i/o i/o vcc i/o i/o i/o i/o/tdo i/o i/o vcc i/o i/o i/o/tck i/o gnd i/o 44 43 42 41 40 39 38 37 36 35 34 12 13 14 15 16 17 18 19 20 21 22 i/o i/o i/o i/o gnd vcc i/o pd2/i/o i/o i/o i/o i/o i/o i/o vcc gclk2/oe2/i gclr/i i/oe1 gclk1/i gnd gclk3/i/o i/o 44-lead plcc top view 7 8 9 10 11 12 13 14 15 16 17 39 38 37 36 35 34 33 32 31 30 29 tdi/i/o i/o i/o gnd pd1/i/o i/o i/o/tms i/o vcc i/o i/o i/o i/o/tdo i/o i/o vcc i/o i/o i/o/tck i/o gnd i/o 6 5 4 3 2 1 44 43 42 41 40 18 19 20 21 22 23 24 25 26 27 28 i/o i/o i/o i/o gnd vcc i/o pd2/i/o i/o i/o i/o i/o i/o i/o vcc gclk2/oe2/i gclr/i oe1/i gclk1/i gnd gclk3/i/o i/o 68-lead plcc top view 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44 i/o vccio i/o/td1 i/o i/o i/o gnd i/o/pd1 i/o i/o/tms i/o vccio i/o i/o i/o i/o gnd i/o i/o gnd i/o/tdo i/o i/o i/o vccio i/o i/o i/o/tck i/o gnd i/o i/o i/o i/o 9 8 7 6 5 4 3 2 1 68 67 66 65 64 63 62 61 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 i/o i/o i/o i/o vccio i/o i/o gnd vccint i/o i/o/pd2 gnd i/o i/o i/o i/o vccio i/o i/o i/o gnd i/o i/o vccint gclk2/oe2/i gclr/i oe1/i gclk1/i gnd gclk3/i/o i/o vccio i/o i/o 84-lead plcc top view 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 i/o vccio i/o/tdi i/o i/o i/o i/o gnd i/o/pd1 i/o i/o i/o/tms i/o i/o vccio i/o i/o i/o i/o i/o gnd i/o i/o gnd i/o/tdo i/o i/o i/o i/o vccio i/o i/o i/o i/o/tck i/o i/o gnd i/o i/o i/o i/o i/o 11 10 9 8 7 6 5 4 3 2 1 84 83 82 81 80 79 78 77 76 75 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 i/o i/o i/o i/o i/o vccio i/o i/o i/o gnd vccint i/o i/o i/o/pd2 gnd i/o i/o i/o i/o i/o vccio i/o i/o i/o i/o gnd i/o i/o i/o vccint gclk2/oe2/i i/gclr i/oe1 gclk1/i gnd gclk3/i/o i/o i/o vccio 1/o i/o i/o 3 atf1504as(l) 0950n ? pld ? 07/02 100-lead pqfp top view 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 nc nc i/o i/o vccio i/o/tdi nc i/o nc i/o i/o i/o gnd i/o/pd1 i/o i/o i/o/tms i/o i/o vccio i/o i/o i/o nc i/o nc i/o gnd nc nc nc nc i/o i/o gnd i/o/tdo nc i/o nc i/o i/o i/o vccio i/o i/o i/o i/o/tck i/o i/o gnd i/o i/o i/o nc i/o nc i/o vccio nc nc 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 i/o i/o i/o i/o i/o vccio i/o i/o i/o gnd vccint i/o i/o i/o/pd2 gnd i/o i/o i/o i/o i/o i/o i/o i/o gnd i/o i/o i/o vccint input/oe2/gclk2 input/gclr input/oe1 input/gclk1 gnd i/o/gclk3 i/o i/o vccio i/o i/o i/o 100-lead tqfp top view nc nc vccio i/o/tdi nc i/o nc i/o i/o i/o gnd i/o/pd1 i/o i/o i/o/tms i/o i/o vccio i/o i/o i/o nc i/o nc i/o i/o gnd i/o/tdo nc i/o nc i/o i/o i/o vccio i/o i/o i/o i/o/tck i/o i/o gnd i/o i/o i/o nc i/o nc i/o vccio gnd nc nc i/o i/o i/o i/o i/o vccio i/o i/o i/o gnd vccint i/o i/o i/o/pd2 gnd i/o i/o i/o i/o i/o nc nc i/o i/o i/o i/o i/o gnd i/o i/o i/o vccint input/oe2/gclk2 input/gclr input/oe1 input/gclk1 gnd i/o/gclk3 i/o i/o vccio i/o i/o i/o nc nc i/o 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 80 79 78 77 76 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 4 atf1504as(l) 0950n ? pld ? 07/02 description the atf1504as is a high-performance, high-density complex programmable logic device (cpld) that utilizes atmel ? s proven electrically-erasable memory technology. with 64 logic macrocells and up to 68 inputs, it easily integrates logic from several ttl, ssi, msi, lsi and classic plds. the atf1504as ? s enhanced routing switch matrices increase usable gate count and the odds of successful pin-locked design modifications. the atf1504as has up to 68 bi-directional i/o pins and four dedicated input pins, depending on the type of device package selected. each dedicated pin can also serve as a global control signal, register clock, register reset or output enable. each of these control signals can be selected for use individually within each macrocell. each of the 64 macrocells generates a buried feedback that goes to the global bus. each input and i/o pin also feeds into the global bus. the switch matrix in each logic block then selects 40 individual signals from the global bus. each macrocell also gener- ates a foldback logic term that goes to a regional bus. cascade logic between macrocells in the atf1504as allows fast, efficient generation of complex logic func- tions. the atf1504as contains four such logic chains, each capable of creating sum term logic with a fan-in of up to 40 product terms. the atf1504as macrocell, shown in figure 1, is flexible enough to support highly-com- plex logic functions operating at high speed. the macrocell consists of five sections: product terms and product term select multiplexer, or/xor/cascade logic, a flip-flop, output select and enable, and logic array inputs. 5 atf1504as(l) 0950n ? pld ? 07/02 block diagram unused product terms are automatically disabled by the compiler to decrease power consumption. a security fuse, when programmed, protects the contents of the atf1504as. two bytes (16 bits) of user signature are accessible to the user for pur- poses such as storing project name, part number, revision or date. the user signature is accessible regardless of the state of the security fuse. the atf1504as device is an in-system programmable (isp) device. it uses the indus- try-standard 4-pin jtag interface (ieee std. 1149.1), and is fully-compliant with jtag ? s boundary-scan description language (bsdl). isp allows the device to be programmed without removing it from the printed circuit board. in addition to simplifying the manufac- turing flow, isp also allows design modifications to be made in the field via software. i/o (mc64)/gclk3 6 atf1504as(l) 0950n ? pld ? 07/02 product terms and select mux each atf1504as macrocell has five product terms. each product term receives as its possible inputs all signals from both the global bus and regional bus. the product term select multiplexer (ptmux) allocates the five product terms as needed to the macrocell logic gates and control signals. the ptmux programming is determined by the design compiler, which selects the optimum macrocell configuration. or/xor/cascade logic the atf1504as ? s logic structure is designed to efficiently support all types of logic. within a single macrocell, all the product terms can be routed to the or gate, creating a 5-input and/or sum term. with the addition of the casin from neighboring macrocells, this can be expanded to as many as 40 product terms with a little small additional delay. the macrocell ? s xor gate allows efficient implementation of compare and arithmetic functions. one input to the xor comes from the or sum term. the other xor input can be a product term or a fixed high- or low-level. for combinatorial outputs, the fixed level input allows polarity selection. for registered functions, the fixed levels allow demorgan minimization of product terms. the xor gate is also used to emulate t- and jk-type flip-flops. flip-flop the atf1504as ? s flip-flop has very flexible data and control functions. the data input can come from either the xor gate, from a separate product term or directly from the i/o pin. selecting the separate product term allows creation of a buried registered feed- back within a combinatorial output macrocell. (this feature is automatically implemented by the fitter software). in addition to d, t, jk and sr operation, the flip-flop can also be configured as a flow-through latch. in this mode, data passes through when the clock is high and is latched when the clock is low. the clock itself can be either one of the global clk signals (gck[0 : 2]) or an individual product term. the flip-flop changes state on the clock ? s rising edge. when the gck sig- nal is used as the clock, one of the macrocell product terms can be selected as a clock enable. when the clock enable function is active and the enable signal (product term) is low, all clock edges are ignored. the flip-flop ? s asynchronous reset signal (ar) can be either the global clear (gclear), a product term, or always off. ar can also be a logic or of gclear with a product term. the asynchronous preset (ap) can be a product term or always off. output select and enable the atf1504as macrocell output can be selected as registered or combinatorial. the buried feedback signal can be either combinatorial or registered signal regardless of whether the output is combinatorial or registered. the output enable multiplexer (moe) controls the output enable signals. any buffer can be permanently enabled for simple output operation. buffers can also be permanently disabled to allow use of the pin as an input. in this configuration all the macrocell resources are still available, including the buried feedback, expander and cascade logic. the output enable for each macrocell can be selected as either of the two dedi- cated oe input pins as an i/o pin configured as an input, or as an individual product term. global bus/switch matrix the global bus contains all input and i/o pin signals as well as the buried feedback sig- nal from all 64 macrocells. the switch matrix in each logic block receives as its possible inputs all signals from the global bus. under software control, up to 40 of these signals can be selected as inputs to the logic block. 7 atf1504as(l) 0950n ? pld ? 07/02 foldback bus each macrocell also generates a foldback product term. this signal goes to the regional bus and is available to four macrocells. the foldback is an inverse polarity of one of the macrocell ? s product terms. the sixteen foldback terms in each region allow generation of high fan-in sum terms (up to sixteen product terms) with a nominal additional delay. figure 1. atf1504as macrocell 8 atf1504as(l) 0950n ? pld ? 07/02 programmable pin- keeper option for inputs and i/os the atf1504as offers the option of programming all input and i/o pins so that pin- keeper circuits can be utilized. when any pin is driven high or low and then subse- quently left floating, it will stay at that previous high- or low-level. this circuitry prevents unused input and i/o lines from floating to intermediate voltage levels, which causes unnecessary power consumption and system noise. the keeper circuits eliminate the need for external pull-up resistors and eliminate their dc power consumption. input diagram speed/power management the atf1504as has several built-in speed and power management features. the atf1504as contains circuitry that automatically puts the device into a low-power standby mode when no logic transitions are occurring. this not only reduces power con- sumption during inactive periods, but also provides proportional power savings for most applications running at system speeds below 5 mhz. this feature may be selected as a device option. i/o diagram to further reduce power, each atf1504as macrocell has a reduced power bit feature. this feature allows individual macrocells to be configured for maximum power savings. this feature may be selected as a design option. all atf1504as also have an optional power-down mode. in this mode, current drops to below 10 ma. when the power-down option is selected, either pd1 or pd2 pins (or both) can be used to power-down the part. the power-down option is selected in the design source file. when enabled, the device goes into power-down when either pd1 or pd2 is high. in the power-down mode, all internal logic signals are latched and held, as are any enabled outputs. 9 atf1504as(l) 0950n ? pld ? 07/02 all pin transitions are ignored until the pd pin is brought low. when the power-down fea- ture is enabled, the pd1 or pd2 pin cannot be used as a logic input or output. however, the pin ? s macrocell may still be used to generate buried foldback and cascade logic signals. all power-down ac characteristic parameters are computed from external input or i/o pins, with reduced power bit turned on. for macrocells in reduced-power mode (reduced-power bit turned on), the reduced-power adder, trpa, must be added to the ac parameters, which include the data paths t lad ,t lac ,t ic ,t acl ,t ach and t sexp . the atf1504as macrocell also has an option whereby the power can be reduced on a per macrocell basis. by enabling this power-down option, macrocells that are not used in an application can be turned-down, thereby reducing the overall power consumption of the device. each output also has individual slew rate control. this may be used to reduce system noise by slowing down outputs that do not need to operate at maximum speed. outputs default to slow switching, and may be specified as fast switching in the design file. design software support atf1504as designs are supported by several industry-standard third-party tools. auto- mated fitters allow logic synthesis using a variety of high level description languages and formats. power-up reset the atf1504as is designed with a power-up reset, a feature critical for state machine initialization. at a point delayed slightly from v cc crossing v rst , all registers will be ini- tialized, and the state of each output will depend on the polarity of its buffer. however, due to the asynchronous nature of reset and uncertainty of how v cc actually rises in the system, the following conditions are required: 1. the v cc rise must be monotonic, 2. after reset occurs, all input and feedback setup times must be met before driving the clock pin high, and, 3. the clock must remain stable during t d . the atf1504as has two options for the hysteresis about the reset level, v rst ,small and large. during the fitting process users may configure the device with the power-up reset hysteresis set to large or small. atmel pof2jed users may select the large option by including the flag ? -power_reset ? on the command line after ? filename.pof ? . to allow the registers to be properly reinitialized with the large hysteresis option selected, the following condition is added: 4. if v cc falls below 2.0v, it must shut off completely before the device is turned on again. when the large hysteresis option is active, i cc is reduced by several hundred micro- amps as well. security fuse usage a single fuse is provided to prevent unauthorized copying of the atf1504as fuse pat- terns. once programmed, fuse verify is inhibited. however, the 16-bit user signature remains accessible. 10 atf1504as(l) 0950n ? pld ? 07/02 programming atf1504as devices are in-system programmable (isp) devices utilizing the 4-pin jtag protocol. this capability eliminates package handling normally required for programming and facilitates rapid design iterations and field changes. atmel provides isp hardware and software to allow programming of the atf1504as via the pc. isp is performed by using either a download cable or a comparable board tester or a simple microprocessor interface. to facilitate isp programming by the automated test equipment (ate) vendors. serial vector format (svf) files can be created by atmel provided software utilities. atf1504as devices can also be programmed using standard third-party programmers. with third-party programmer, the jtag isp port can be disabled thereby allowing four additional i/o pins to be used for logic. contact your local atmel representatives or atmel pld applications for details. isp programming protection the atf1504as has a special feature that locks the device and prevents the inputs and i/o from driving if the programming process is interrupted for any reason. the inputs and i/o default to high-z state during such a condition. in addition the pin-keeper option preserves the former state during device programming, if this circuit were previously programmed on the device. this prevents disturbing the operation of other circuits in the system while the atf1504as is being programmed via isp. all atf1504as devices are initially shipped in the erased state thereby making them ready to use for isp. note: for more information refer to the ? designing for in-system programmability with atmel cplds ? application note. 11 atf1504as(l) 0950n ? pld ? 07/02 notes: 1. not more than one output at a time should be shorted. duration of short circuit test should not exceed 30 sec. 2. when macrocell reduced-power feature is enabled. note: typical values for nominal supply voltage. this parameter is only sampled and is not 100% tested. the ogi pin (high-voltage pin during programming) has a maximum capacitance of 12 pf. dc and ac operating conditions commercial industrial operating temperature (ambient) 0 c-70 c-40 c-85 c v ccint or v ccio (5v) power supply 5v ?% 5v 10% v ccio (3.3v) power supply 3.0v - 3.6v 3.0v - 3.6v dc characteristics symbol parameter condition min typ max units i il input or i/o low leakage current v in =v cc -2 -10 a i ih input or i/o high leakage current 210 i oz tri-state output off-state current v o =v cc or gnd -40 40 ? i cc1 power supply current, standby v cc =max v in =0,v cc std mode com. 105 ma ind. 130 ma ? l ? mode com. 10 ? ind. 10 ? i cc2 power supply current, power-down mode v cc =max v in =0,v cc ? pd ? mode 1 10 ma i cc3 (2) current in reduced-power mode v cc =max v in =0,vcc std power com 85 ma ind 105 v ccio supply voltage 5.0v device output com. 4.75 5.25 v ind. 4.5 5.5 v v ccio supply voltage 3.3v device output 3.0 3.6 v v il input low voltage -0.3 0.8 v v ih input high voltage 2.0 v ccio +0.3 v v ol output low voltage (ttl) v in =v ih or v il v ccio =min,i ol =12ma com. 0.45 v ind. output low voltage (cmos) v in =v ih or v il v cc =min,i ol =0.1ma com. .2 v ind. .2 v v oh output high voltage (ttl) v in =v ih or v il v ccio =min,i oh =-4.0ma 2.4 v pin capacitance typ max units conditions c in 810 pf v in =0v;f=1.0mhz c i/o 810 pf v out =0v;f=1.0mhz 12 atf1504as(l) 0950n ? pld ? 07/02 absolute maximum ratings* temperature under bias .................................. -40 cto+85 c *notice: stresses beyond those listed under ? absolute maximum ratings ? may cause permanent dam- age to the device. this is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. exposure to absolute maximum rating conditions for extended periods may affect device reliability. note: 1. minimum voltage is -0.6v dc, which may under- shoot to -2.0v for pulses of less than 20 ns. max- imum output pin voltage is v cc + 0.75v dc, which may overshoot to 7.0v for pulses of less than 20 ns. storage temperature ..................................... -65 cto+150 c voltage on any pin with respect to ground .........................................-2.0v to +7.0v (1) voltage on input pins with respect to ground during programming.....................................-2.0v to +14.0v (1) programming voltage with respect to ground .......................................-2.0v to +14.0v (1) ac characteristics symbol parameter -7 -10 -15 -20 -25 units min max min max min max min max min max t pd1 input or feedback to non-registered output 7.5 10 3 15 20 25 ns t pd2 i/o input or feedback to non-registered feedback 793121625ns t su global clock setup time 6 7 11 16 20 ns t h global clock hold time 0 0 0 0 0 ns t fsu global clock setup time of fast input 33335ns t fh global clock hold time of fast input 0.5 0.5 1.0 1.5 2 ns t cop global clock to output delay 4.5 5 8 10 13 ns t ch global clock high time 3 4 5 6 7 ns t cl global clock low time 3 4 5 6 7 ns t asu array clock setup time 3 3 4 4 5 ns t ah array clock hold time 2 3 4 5 6 ns t acop array clock output delay 7.5 10 15 20 25 ns t ach array clock high time 3 4 6 8 10 ns t acl array clock low time 3 4 6 8 10 ns t cnt minimum clock global period 8 10 13 17 22 ns f cnt maximum internal global clock frequency 125 100 76.9 66 50 mhz t acnt minimum array clock period 8 10 13 17 22 ns f acnt maximum internal array clock frequency 125 100 76.9 66 50 mhz 13 atf1504as(l) 0950n ? pld ? 07/02 note: see ordering information for valid part numbers. timing model ac characteristics (continued) symbol parameter -7 -10 -15 -20 -25 units min max min max min max min max min max f max maximum clock frequency 166.7 125 100 83.3 60 mhz t in input pad and buffer delay 0.5 0.5 2 2 2 ns t io i/o input pad and buffer delay 0.5 0.5 2 2 2 ns t fin fast input delay 1 1 2 2 2 ns t sexp foldback term delay 4 5 8 10 12 ns t pexp cascade logic delay 0.8 0.8 1 1 1.2 ns t lad logic array delay 3 5 6 7 8 ns t lac logic control delay 3 5 6 7 8 ns t ioe internal output enable delay 2 2 3 3 4 ns t od1 output buffer and pad delay (slow slew rate = off; v ccio =5v;c l =35pf) 21.54 5 6ns t od2 output buffer and pad delay (slow slew rate = off; v ccio =3.3v;c l =35pf) 2.5 2.0 5 6 7 ns t od3 output buffer and pad delay (slow slew rate = on; v ccio =5vor3.3v;c l =35pf) 55.58 1010ns 14 atf1504as(l) 0950n ? pld ? 07/02 notes: 1. see ordering information for valid part numbers. 2. the t rpa parameter must be added to the t lad ,t lac ,t tic ,t acl ,andt sexp parameters for macrocells running in the reduced- power mode. input test waveforms and measurement levels t r ,t f = 1.5 ns typical ac characteristics (continued) symbol parameter -7 -10 -15 -20 -25 units min max min max min max min max min max t zx1 output buffer enable delay (slow slew rate = off; v ccio =5.0v;c l =35pf) 4.0 5.0 7 9 10 ns t zx2 output buffer enable delay (slow slew rate = off; v ccio =3.3v;c l =35pf) 4.5 5.5 7 9 10 ns t zx3 output buffer enable delay (slow slew rate = on; v ccio =5.0v/3.3v;c l =35pf) 9 9 10 11 12 ns t xz output buffer disable delay (c l =5pf) 45678ns t su registersetuptime 33456 ns t h registerholdtime 23456 ns t fsu register setup time of fast input 33223 ns t fh register hold time of fast input 0.5 0.5 2 2 2.5 ns t rd registerdelay 12122ns t comb combinatorialdelay 12122ns t ic arrayclockdelay 35678ns t en registerenabletime 35678ns t glob global control delay 11111ns t pre registerpresettime 23456ns t clr registercleartime 23456ns t uim switchmatrixdelay 11222ns t rpa reduced-power adder (2) 10 11 13 14 15 ns 15 atf1504as(l) 0950n ? pld ? 07/02 output ac test loads note: *numbers in parenthesis refer to 3.0v operating conditions (preliminary). power-down mode the atf1504as includes an optional pin-controlled power-down feature. when this mode is enabled, the pd pin acts as the power-down pin. when the pd pin is high, the device supply current is reduced to less than 10 ma. during power-down, all output data and internal logic states are latched internally and held. therefore, all registered and combinatorial output data remain valid. any outputs that were in a high-z state at the onset will remain at high-z. during power-down, all input signals except the power-down pin are blocked. input and i/o hold latches remain active to ensure that pins do not float to indeterminate levels, further reducing system power. the power-down mode feature is enabled in the logic design file or as a fitted or translated s/w option. designs using the power-down pin may not use the pd pin as a logic array input. however, all other pd pin macrocell resources may still be used, including the buried feedback and foldback product term array inputs. notes: 1. for slow slew outputs, add t sso . 2. pin or product term. 3. includes t rpa due to reduced power bit enabled. power down ac characteristics (1)(2) symbol parameter -7 -10 -15 -20 -25 units min max min max min max min max min max t ivdh validi,i/obeforepdhigh 7 10152025 ns t gvdh valid oe (2) beforepdhigh 7 10152025 ns t cvdh valid clock (2) beforepdhigh7 10152025 ns t dhix i, i/o don ? t care after pd high 12 15 25 30 35 ns t dhgx oe (2) don ? t care after pd high 12 15 25 30 35 ns t dhcx clock (2) don ? t care after pd high 12 15 25 30 35 ns t dliv pd low to valid i, i/o 1 1 1 1 1 s t dlgv pd low to valid oe (pin or term) 1 1 1 1 1 ? t dlcv pd low to valid clock (pin or term) 1 1 1 1 1 s t dlov pd low to valid output 1 1 1 1 1 s 16 atf1504as(l) 0950n ? pld ? 07/02 jtag-bst/isp overview the jtag boundary-scan testing is controlled by the test access port (tap) controller in the atf1504as. the boundary-scan technique involves the inclusion of a shift-regis- ter stage (contained in a boundary-scan cell) adjacent to each component so that signals at component boundaries can be controlled and observed using scan testing principles. each input pin and i/o pin has its own boundary-scan cell (bsc) in order to support boundary scan testing. the atf1504as does not currently include a test reset (trst) input pin because the tap controller is automatically reset at power-up. the five jtag modes supported include: sample/preload, extest, bypass, idcode and highz. the atf1504as ? s isp can be fully described using jtag ? sbsdlas described in ieee standard 1149.1b. this allows atf1504as programming to be described and implemented using any one of the third-party development tools support- ing this standard. the atf1504as has the option of using four jtag-standard i/o pins for boundary-scan testing (bst) and in-system programming (isp) purposes. the atf1504as is program- mable through the four jtag pins using the ieee standard jtag programming protocol established by ieee standard 1149.1 using 5v ttl-level programming signals from the isp interface for in-system programming. the jtag feature is a programmable option. if jtag (bst or isp) is not needed, then the four jtag control pins are available as i/o pins. jtag boundary-scan cell (bsc) testing the atf1504as contains up to 68 i/o pins and four input pins, depending on the device type and package type selected. each input pin and i/o pin has its own boundary-scan cell (bsc) in order to support boundary-scan testing as described in detail by ieee standard 1149.1. a typical bsc consists of three capture registers or scan registers and up to two update registers. there are two types of bscs, one for input or i/o pin, and one for the macrocells. the bscs in the device are chained together through the cap- ture registers. input to the capture register chain is fed in from the tdi pin while the output is directed to the tdo pin. capture registers are used to capture active device data signals, to shift data in and out of the device and to load data into the update regis- ters. control signals are generated internally by the jtag tap controller. the bsc configuration for the input and i/o pins and macrocells are shown below. bsc configuration for input and i/o pins (except jtag tap pins) note: the atf1504as has pull-up option on tms and tdi pins. this feature is selected as a design option. 17 atf1504as(l) 0950n ? pld ? 07/02 bsc configuration for macrocell 0 1 dq 0 1 0 1 dq dq capture dr capture dr update dr 0 1 0 1 dq dq tdi tdi outj oej shift shift clock clock mode tdo tdo pin bsc macrocell bsc pin pin 18 atf1504as(l) 0950n ? pld ? 07/02 pci compliance the atf1504as also supports the growing need in the industry to support the new peripheral component interconnect (pci) interface standard in pci-based designs and specifications. the pci interface calls for high current drivers, which are much larger than the traditional ttl drivers. in general, plds and fpgas parallel outputs to support the high current load required by the pci interface. the atf1504as allows this without contributing to system noise while delivering low output-to-output skew. having a pro- grammable high drive option is also possible without increasing output delay or pin capacitance. the pci electrical characteristics appear on the next page. pci voltage-to-current curves for +5v signaling in pull-up mode pci voltage-to-current curves for +5v signaling in pull-down mode 2.4 vcc 1.4 -2 -44 -178 current (ma) ac drive point dc drive point voltage pull up test point 2.2 vcc 0.55 3,6 95 380 current (ma) ac drive point dc drive point voltage pull down test point 19 atf1504as(l) 0950n ? pld ? 07/02 note: leakage current is with pin-keeper off. notes: 1. equation a: i oh =11.9(v out - 5.25) * (v out + 2.45) for v cc >v out >3.1v. 2. equation b: i ol = 78.5 * v out *(4.4-v out )for0v |