10 mm 1 digit slim font display reliability data sheet description the following cumulative test results have been obtained from testing performed at agilent technologies optoelectronics division in accordance with the latest revision of mil-std-883. the actual performance you obtain from agilent parts depends on the electrical and environmental characteristics of your application but will probably be better than the performance outlined in table 1. table 1. life tests demonstrated performance stress test total units units failure rate colors stress test conditions device hrs. tested failed mtbf (% /1k hours) yellow high temperature t a = +55 c, 10,500 21 0 10,500 < 9.52 operating life i f = 20 ma her, high temperature t a = +55 c, 21,000 42 0 21,000 < 4.76 green operating life i f = 30 ma algaas high temperature t a = +55 c, 10,500 21 0 10,500 < 9.52 operating life i f = 15 ma her, low temperature t a = -40 c 31,500 63 0 31,500 < 3.17 green and operating life i f = 30 ma for yellow her & green i f = 15 ma for yellow algaas low temperature t a = -20 c, 10,500 21 0 10,500 < 9.52 operating life i f = 15 ma her, wet high t a = +85 c, 42,000 84 0 42,000 < 2.38 green, temperature r.h. = 85% yellow, operating life i f = 10 ma algaas point typical performance agilent HDSP-301G/hdsp-303g hdsp-301e/hdsp-303e hdsp-301y/hdsp-303y hdsp-301a/hdsp-303a
www.semiconductor.agilent.com data subject to change. copyright ? 2000 agilent technologies, inc. 5980-2922en (9/00) table 2. environmental tests units units test name reference test conditions tested failed solder heat agilent 1x wave solder at 245 c for total of 3 seconds 2,300 0 resistance internal test and 5 temperature cycles per mil-std-883 method 1010. temperature mil-std-883 -40 c to +80 c, 15 min. dwell, 5 min. transfer, 2,300 0 cycle method 1010 up to 20 cycles..................................... humidity jis c 7021 85 c, 85% rh, 500 hours 21 0 storage method b-11
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