hermetically sealed, very high speed logic gate optocoupler reliability data sheet description the reliability data shown includes agilent reliability test data from the past three years on this product family. all of these products use the same leds, the same logic gate ics, the same dscc approved packaging materials, processes, stress conditions and testing. the data in tables 1 and 2 reflect actual test data on dual channel devices. the single channel hcpl- 5401 data in table 3 is inferred from the demonstrated life test data using the factor (1.5) found in the photodiode detector isolator section of mil-hdbk- 217, combined with any single channel data obtained. this data definition of failure inability to switch, i.e., functional failure, is the definition of failure in this data sheet. specifically, failure occurs when the device fails to switch on with 2 times the minimum recommended drive current (but not exceeding the max. rating) or fails to switch off when there is no input current. failure rate projections the demonstrated point mean time to failure (mttf) is measured at the absolute maximum stress condition. the failure rate projections in tables 2 and 3 use the arrhenius acceleration relationship, where a 0.43 ev activation energy is used as in the hybrid section of mil- hdbk-217. applications information the data of tables 1, 2, and 3 were obtained on mil-prf-38534 screened devices with high temperature operating life duration up to 5000 hours. an exponential (random) failure distribution is assumed, expressed in units of fit (failures per billion is taken from testing on agilent technologies devices using internal agilent processes, material specifications, design standards, and statistical process controls. they are not transferable to other manufacturers similar part types. device hours) are only defined in the random failure portion of the reliability curve. for valid system reliability calculations, it is necessary to adjust for the time when the system is not in operation. note that if you are using mil- hdbk-217 for predicting component reliability, the results may not be comparable to those given in tables 2 and 3 due to the different conditions and factors operating life test table 1. demonstrated operating life test performance, hcpl-6431 demonstrated demonstrated stress test total devices total device number of mttf (hr)@ fits @ condition tested hours failed units t a = +125 ct a = +125 c i f = 10 ma 245 725,000 2 362,500 2759 i out = -4 ma v cc = 5.25 v t a = +125 c t j = +155 c agilent 5962-8957101px, 5962-8957103kpx hcpl-5431, hcpl-543k 5962-8957001px, 5962-8957002kpx hcpl-5401, hcpl-540k 5962-89571022a, 5962-8957104K2A hcpl-6431, hcpl-643k
www.semiconductor.agilent.com data subject to change. copyright ? 2000 agilent technologies, inc. obsoletes 5967-6007e 5968-9398e (2/00) environmental testing all high reliability hermetic optocouplers listed meet the 100% screening and quality conformance inspection testing of mil-prf-38534, class h or class k as applicable. table 4. esds classification per method 3015, mil-std-883 that have been accounted for in mil-hdbk-217. for example, it is unlikely that your application will exercise all available channels at full rated power with the led(s) always on as agilent testing does. thus, your application total power and duty cycle must be carefully considered when comparing tables 2 and 3 to predictions using mil-hdbk-217. electrostatic discharge sensitivity part number esd class 5962-8957103kpx, hcpl-543k 3 5962-8957101px, hcpl-5431 3 5962-8957002kpx, hcpl-540k 2 5962-8957001px, hcpl-5401 2 5962-8957104K2A, hcpl-643k 3 5962-89571022a, hcpl-6431 3 table 3. reliability projections for single channel devices listed in title typical (60% confidence) 90% confidence ambient junction mttf fits mttf fits temperature ( c) temperature ( c) (hr/fail) (fail/10 9 hr) (hr/fail) (fail/10 9 hr)) 125 155 350,000 2,855 205,000 4,874 120 150 402,000 2,490 236,000 4,246 110 140 534,000 1,874 313,000 3,191 100 130 719,000 1,391 423,000 2,364 90 120 983,000 1,017 580,000 1,725 80 110 1,367,000 732 807,000 1,239 70 100 1,934,000 517 1,145,000 873 60 90 2,798,000 358 1,655,000 604 50 80 4,108,000 243 2,443,000 409 40 70 6,187,000 162 3,689,000 271 30 60 9,552,000 105 5,711,000 175 25 55 11,986,000 83 7,176,000 139 table 2. reliability projections for dual channel devices listed in title typical (60% confidence) 90% confidence ambient junction mttf fits mttf fits temperature ( c) temperature ( c) (hr/fail) (fail/10 9 hr) (hr/fail) (fail/10 9 hr)) 125 155 234,000 4,282 136,000 7,340 120 150 268,000 3,731 156,000 6,395 110 140 357,000 2,804 208,000 4,806 100 130 481,000 2,078 281,000 3,561 90 120 660,000 1,516 385,000 2,599 80 110 919,000 1,088 536,000 1,865 70 100 1,303,000 767 760,000 1,315 60 90 1,884,000 531 1,099,000 910 50 80 2,781,000 360 1,622,000 616 40 70 4,199,000 238 2,450,000 408 30 60 6,499,000 154 3,792,000 264 25 55 8,167,000 122 4,765,000 210
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