doc. no : qw0905-luy3833r/s1-pf data sheet lead-free parts luy3833r/s1-pf super bright round type led lamps pb ligitek electronics co.,ltd. property of ligitek only rev. : a date : 17- oct. - 2007
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2/5 20 1.72.6 yellow algainp luy3833r/s1-pf water clear color lens material part no emitted 17000 luminous intensity @20ma(mcd) typ. 20 spectral halfwidth #$ nm 590 dominant wave length $ dnm max. forward voltage @ ma(v) min. 11500 min. viewing angle 2 % 1/2 (deg) 8.0 page ligitek electronics co.,ltd. property of ligitek only unit ma ma & a ' v ' mw 50 90 uy(r) ratings 10 2000 ir -40 ~ +85 -40 ~ +100 120 forward current peak forward current duty 1/10@10khz parameter operating temperature storage temperature electrostatic discharge( * ) reverse current @5v power dissipation typical electrical & optical characteristics (ta=25 ' ) symbol esd t opr tstg i f pd i fp absolute maximum ratings at ta=25 ' note : 1.the forward voltage data did not including ! 0.1v testing tolerance. 2. the luminous intensity data did not including ! 15% testing tolerance. static electricity or power surge will damage the led. use of a conductive wrist band or anti-electrosatic glove is recommended when handing these led. all devices, equipment and machinery must be properly grounded. * part no. luy3833r/s1-pf
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( ' ) r e l a t i v e i n t e n s i t y @ 2 0 m a wavelength (nm) f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 ' fig.4 luminous intensity vs. temperature ambient temperature( ' ) l u m i n o u s i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 ' typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage f o r w a r d c u r r e n t ( m a ) forward current(ma) l u m i n o u s i n t e n s i t y n o r m a l i z e @ 2 0 m a ligitek electronics co.,ltd. property of ligitek only 0 0 50 100 150 050100150 0.0 1.0 2.0 3.0 -40-200204060 0.51.01.52.0 80100 0.94 -20 -4040 20 080100 60 0.0 0.5 1.5 1.0 uyr chip page 3/5 fig.2 luminous intensity vs. forward current 5.0 4.0 2.53.0 0.96 0.98 1.00 1.02 1.04 1.06 500 0.0 0.5 550 600 650 1.0 part no. luy3833r/s1-pf
note:1.wave solder should not be made more than one time. 2.you can just only select one of the soldering conditions as above. 260 c3sec max 5 /sec max 260 120 temp( c) time(sec) 150 50 100 2 /sec max 25 0 preheat 0 page 4/5 ligitek electronics co.,ltd. property of ligitek only soldering condition(pb-free) 1.iron: soldering iron:30w max temperature 350 c max soldering time:3 seconds max(one time only) distance:2mm min(from solder joint to body) 2.wave soldering profile dip soldering preheat: 120 c max preheat time: 60seconds max ramp-up 2 c/sec(max) ramp-down:-5 c/sec(max) solder bath:260 c max dipping time:3 seconds max distance:2mm min(from solder joint to body) part no. luy3833r/s1-pf 60 seconds max
thermal shock test solder resistance test solderability test high temperature high humidity test mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202:103b jis c 7021: b-11 this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. this test intended to see soldering well performed or not. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. the purpose of this test is the resistance of the device under tropical for hours. 1.t.sol=230 '! 5 ' 2.dwell time=5 ! 1sec 1.ta=105 '! 5 ' &-40 '! 5 ' (10min) (10min) 2.total 10 cycles 1.t.sol=260 '! 5 ' 2.dwell time= 10 ! 1sec. 1.ta=65 5 2.rh=90%~95% 3.t=240hrs ! 2hrs low temperature storage test test item operating life test high temperature storage test reliability test: jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 reference standard ligitek electronics co.,ltd. property of ligitek only the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) test condition this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. description page 5/5 part no. luy3833r/s1-pf
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