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integrated silicon solution, inc. www.issi.com 1 rev. b 04/02/09 copyright ? 2006 integrated silicon solution, inc. all rights reserved. issi reserves the right to make changes to this speci?cation and its products at any time without notice. issi assumes no liability arising out of the application or use of any information, products or services described herein. customers are advised to obtain the lat - est version of this device speci?cation before relying on any published information and before placing orders for products. is 45s83200c is45s16160c 256 mb single data rate synchronous dram april 2009 general description is45s83200c is organized as 4-bank x 8,388,608-word x 8-bit synchronous dram with lvttl interface and is45s16160c is organized as 4-bank x 4,194,304-word x 16-bit. all inputs and outputs are referenced to the rising edge of clk . is45s83200c and is45s16160c achieve very high s peed data rates up to 166mhz, and are suitable for main memories or graphic mem ories in computer systems. features - single 3.3v 0.3v power supply - max. clock frequency : - 6:166mhz<3-3-3>/-7:143mhz<3-3-3>/-75:133mhz<3-3-3> - fully synchronous operation referenced to clock rising edge - 4-bank operation controlled by ba0,ba1(bank address) - /cas latency- 2/3 (programmable) - burst length- 1/2/4/8/fp (programmable) - burst type- sequential and interleave burst (programmable) - byte control- l dqm and u dqm ( is45s16160c ) - random column acce ss - auto precharge / all bank precharge controlled by a10 - auto and self refresh - 8192 refresh cycles /64ms - lvttl interface - package 400-mil, 54-pin thin small outline (tsop ii) with 0.8mm lead pitch pb-free package is available
2 integrated silicon solution, inc. www.issi.com rev. b 04/02/09 is45s83200c is 45s16160c clk : master clock dqm : output disable / write mask cke : clock enable a0-12 : address input /cs : chip select ba0,1 : bank address /ras : row address strobe vdd : power supply /cas : column address strobe vddq : power supply for output /we : write enable vss : ground dq0-15 : data i/o vssq : ground for output integrated silicon solution, inc. www.issi.com 3 rev. b 04/02/09 note: this figure shows the is4 5s83200c. the is4 5s16160c configuration is 8192x512x16 of cell array and dq0-15 is45s83200c is45s16160c 4 i ntegrated silicon solution, inc. ? www.issi.com r ev. b 04/02/09 pin descriptions symbol type description clk input clock: clk is driven by the system clock. all sdram input signals are sampled on the positive edge of clk. clk also increments the internal burst counter and controls the output registers. cke input clock enable: cke activates (high) and deactivates (low) the clk signal. deactivating the clock provides precharge power-down and self refresh operation (all banks idle), active power-down (row active in any bank), deep power down (all banks idle), or clock suspend operation (burst/access in progress). cke is synchronous except after the device enters power-down and self refresh modes, w here cke becomes asynchronous until after exiting the same mode. the input buffers, including clk, are disabled during power-down and self refresh modes, providing low standby power. cke may be tied high. /cs input chip select: /cs enables (registered low) and disables (registered high) the command decoder. all commands are masked when /cs is registered high. /cs provides for external bank selection on systems with multiple banks. /cs is considered part of the command code. /cas, /ras, /we input command inputs: /cas, /ras, and /we (along with /cs) define the command being entered. ldqm, u dqm (x8) dqm (x16) input input/output mask: dqm is sampled high and is an input mask signal for write accesses and an output enable signal for read accesses. input data is masked during a write cycle. the output buffers are placed in a high-z state (two-clock latency) when during a read cycle. ldqm corresponds to dq0?dq7, udqm corresponds to dq8?dq15. ldqm and udqm are considered same state when referen ced as dqm. ba0, ba1 input bank address input(s): ba0 and ba1 define to which bank the active, read, write or precharge command is being applied. these pins also select between the mode register and the extended mode register. a0?a12 input a0-12 specify the row / column address in conjunction with ba0,1. the row address is specified by a0-12. the column address is specified by a0-9(x8) and a0-8(x16). a10 is also used to indicate precharge option. when a10 is high at a read / write command, an auto precharge is performed. when a10 is high at a precharge command, all banks are precharged. dq0-dq15 (x16) dq0-dq7 (x8) i/o data input/output: data bus. nc ? internally not connected: these could be left unconnected, but it is recommended they be connected or v ss . v dd q supply dq power: provide isolated power to dqs for improved noise immunity. v ss q supply dq ground: provide isolated ground to dqs for improved noise immunity. v dd supply core power supply. v ss supply ground. is45s83200c is45s16160c integrated silicon solution, inc. www.issi.com 5 rev. b 04/02/09 absolute maximum ratings parameter symbol value unit voltage on any pin relative to v ss v in ,v out -0.5 ~ 4.6 v voltage on v dd supply relative to v ss v dd , v ddq -0.5 ~ 4.6 v storage temperature t stg -65 ~ +150 c power dissipation p d 1.0 w short circuit current i os 50 ma notes: permanent device damage may occur if absolute maximum ratings are exceeded. functional operation should be restricted to recommended operating condition. exposure to higher than recommended voltage for extended periods of time could affect device reliability. dc operating conditions recommended operating conditions (voltage referenced to v ss = 0v, automotive grade: ta = -40 to 85 o c) parameter symbol min typ max unit note vdd 3.0 3.3 3.6 v supply voltage v ddq 3.0 3.3 3.6 v input logic high voltage v ih 2.0 v ddq + 0.3 v 1 input logic low voltage v il -0.3 0 0.8 v 2 output logic high voltage v oh 2.4 - - v i oh = -0.1ma output logic low voltage v ol - - 0.4 v i ol = 0.1ma input leakage current i li -5 - 5 ua 3 output leakage current i ol -5 - 5 ua 3 note: 1. vih(max) = v ddq + 2v ac for pulse width 3 ns acceptable. 2. vil(min) = - 2 v ac for pulse width 3 ns acceptabl e. 3. an y in put 0v vin v dd + 0.3v, all other pin s are n o t under tes t = 0v. 4. dout is disabled , 0v vout vdd. capacitance ( vdd =3.3v, t a = 25c , f = 1mhz ? parameter symbol min max unit note clock cclk 2.5 4.0 pf /cas,/ras,/we,/cs,cke,l/udqm cin 2.5 5.0 pf address c add 2.5 5.0 pf dq0~dq15 c out 4.0 6.5 pf is45s83200c is45s16160c 6 integrated silicon solution, inc. www.issi.com rev. b 04/02/09 dc characteristics recommended operating conditions (voltage referenced to v ss = 0 v, automotive grade: ta = -40 to 85 o c) o n o c version parameter symbol test condition organization -6 -7 -75 unit note x 8 14 0 14 0 130 operating current (one bank active) i cc1 burst length = 1 t rc |