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H7N0608FM Silicon N Channel MOS FET Power Switching REJ03G0165-0100Z Rev.1.00 Dec.04.2003 Features * Low on-resistance RDS(on) = 6.5 m typ. * Low drive current * 4.5 V gate drive device can be driven from 5 V source Outline TO-220FM D G 12 S 1. Gate 2. Drain 3. Source 3 Rev.1.00, Dec.04.2003, page 1 of 9 H7N0608FM Absolute Maximum Ratings (Ta = 25C) Item Drain to source voltage Gate to source voltage Drain current Drain peak current Body-drain diode reverse drain current Avalanche current Avalanche energy Channel dissipation Channel temperature Storage temperature Symbol VDSS VGSS ID ID (pulse) IDR IAP Note3 Note1 Ratings 60 20 50 200 50 40 137 30 150 -55 to +150 Unit V V A A A A mJ W C C EARNote3 Pch Tch Tstg Note2 Notes: 1. PW 10 s, duty cycle 1% 2. Value at Tc = 25C 3. Value at Tch = 25C, Rg 50 Rev.1.00, Dec.04.2003, page 2 of 9 H7N0608FM Electrical Characteristics (Ta = 25C) Item Drain to source breakdown voltage Symbol Min V(BR)DSS 60 Typ -- -- -- -- -- 6.5 8.5 60 6200 680 350 100 20 20 45 160 125 32 0.92 40 Max -- -- 10 10 2.5 8.5 13 -- -- -- -- -- -- -- -- -- -- -- -- -- Unit V V A A V m m S pF pF pF nC nC nC ns ns ns ns V ns Test Conditions ID = 10 mA, VGS = 0 IG = 100 A, VDS = 0 VGS = 16 V, VDS = 0 VDS = 60 V, VGS = 0 ID = 1 mA, VDS = 10 VNote4 ID = 20 A, VGS = 10 VNote4 ID = 20 A, VGS = 4.5 VNote4 ID = 20 A, VGS = 10 VNote4 VDS = 10 V VGS = 0 f = 1 MHz VDD = 25 V VGS = 10 V ID = 50 A VGS = 10 V, ID = 20 A VDD 30 V RL = 1.5 Rg = 4.7 IF = 50 A, VGS = 0 IF = 50 A, VGS = 0 diF/dt = 100 A/s Gate to source breakdown Voltage V(BR)GSS 20 Gate to source leak current Zero gate voltage drain current Gate to source cutoff voltage Static drain to source on state resistance Forward transfer admittance Input capacitance Output capacitance Reverse transfer capacitance Total gate charge Gate to source charge Gate to drain charge Turn-on delay time Rise time Turn-off delay time Fall time |yfs| Ciss Coss Crss Qg Qgs Qgd td(on) tr td(off) tf trr IGSS IDSS VGS(off) RDS(on) -- -- 1.5 -- -- 40 -- -- -- -- -- -- -- -- -- -- -- -- Body-drain diode forward voltage VDF Body-drain diode reverse recovery time Notes: 4. Pulse test Rev.1.00, Dec.04.2003, page 3 of 9 H7N0608FM Main Characteristics Power vs. Temperature Derating 40 Pch (W) Maximum Safe Operation Area 1000 300 (A) 10 10 0 s 30 100 30 10 3 1 0.3 Operation in 0.1 limited by RDS(on) 0.03 Ta = 25C 0.01 0.1 0.3 1 this area is DC Operation (Tc = 25C) PW = 10 ms (1 shot) s 1 ID s m Channel Dissipation 20 10 0 Drain Current 50 100 150 Tc (C) 200 3 10 30 VDS 100 (V) Case Temperature Drain to Source Voltage Typical Output Characteristics 100 10 V 4.5 V 4.0 V Pulse Test (A) Typical Transfer Characteristics 100 VDS = 10 V Pulse Test (A) 80 80 ID 60 ID Drain Current 3.6 V 60 Drain Current 40 VGS = 3.2 V 20 40 Tc = 150C 25C -40C 20 0 2 4 6 8 VDS (V) 10 0 2 4 6 8 VGS 10 (V) Drain to Source Voltage Gate to Source Voltage Rev.1.00, Dec.04.2003, page 4 of 9 H7N0608FM Drain to Source Saturation Voltage vs. Gate to Source Voltage Drain to Source Saturation Voltage VDS(on) (mV) Static Drain to Source on State Resistance vs. Drain Current Drain to Source on State Resistance RDS(on) (m) 100 500 Pulse Test Pulse Test 30 400 ID = 50 A 300 10 VGS = 4.5 V 10 V 200 20 A 100 10 A 3 0 4 8 12 16 VGS (V) 1 20 1 3 Gate to Source Voltage 30 100 300 1000 10 Drain Current ID (A) Drain to Source on State Resistance RDS(on) (m) Forward Transfer Admittance |yfs| (S) Static Drain to Source on State Resistance vs. Temperature 20 Pulse Test 16 50 A 10, 20 A 8 4.5 V Forward Transfer Admittance vs. Drain Current 1000 300 100 30 25C 10 3 1 0.3 0.1 0.1 0.3 1 3 10 (A) 30 100 150C VDS = 10 V Pulse Test Tc = -40C 12 4 VGS = 10 V 10, 20, 50 A 0 -50 -25 0 25 50 75 100 125 150 Tc (C) Case Temperature Drain Current ID Rev.1.00, Dec.04.2003, page 5 of 9 H7N0608FM Body-Drain Diode Reverse Recovery Time di / dt = 100 A / s VGS = 0, Ta = 25C Typical Capacitance vs. Drain to Source Voltage Ciss 1000 10000 3000 Reverse Recovery Time trr (ns) 300 100 30 10 3 1 0.1 Capacitance C (pF) 1000 Coss 300 100 30 10 0 VGS = 0 f = 1 MHz 10 20 30 40 (V) 50 Crss 0.3 1 3 10 30 IDR (A) 100 Reverse Drain Current Drain to Source Voltage VDS Dynamic Input Characteristics 100 VDS (V) VGS 16 (V) ID = 50 A 20 1000 300 tf Switching Characteristics VGS Switching Time t (ns) 80 VDD = 50 V 25 V 10 V tr td(off) Drain to Source Voltage Gate to Source Voltage 100 td(on) 30 tr 10 VGS = 10 V, VDD = 30 V 3 PW = 5 s, duty < 1 % Rg = 4.7 1 0.1 0.3 3 10 1 Drain Current ID tf 60 VDS 12 40 8 20 VDD = 50 V 25 V 10 V 40 80 120 160 Gate Charge Qg (nc) 4 0 200 0 30 (A) 100 Rev.1.00, Dec.04.2003, page 6 of 9 H7N0608FM Reverse Drain Current vs. Source to Drain Voltage 100 Maximum Avalanche Energy vs. Channel Temperature Derating Repetitive Avalanche Energy EAR (mJ) 200 IAP = 40 A VDD = 25 V duty < 0.1 % Rg > 50 (A) Reverse Drain Current IDR 80 10 V 160 60 120 40 5V VGS = 0, -5 V Pulse Test 80 20 40 0 25 0 0.4 0.8 1.2 1.6 VSD 2.0 (V) Source to Drain Voltage 50 75 100 125 Channel Temperature Tch (C) 150 Avalanche Test Circuit EAR = Avalanche Waveform 1 2 * L * I AP * 2 VDSS VDSS - V DD V DS Monitor L I AP Monitor V (BR)DSS I AP VDD ID V DS Rg Vin 15 V D. U. T 50 0 VDD Rev.1.00, Dec.04.2003, page 7 of 9 H7N0608FM Normalized Transient Thermal Impedance vs. Pulse Width Normalized Transient Thermal Impedance s (t) 1 D=1 0.5 0.2 0.1 Tc = 25C 0.3 0.1 0.05 0.02 0.01 lse pu 0.03 0.01 1s ho t ch - c(t) = s (t) * ch - c ch - c = 4.16C/ W, Tc = 25C PDM D= PW T PW T 0.003 0.001 10 100 1m 10 m 100 m 1 10 100 Pulse Width PW (S) Switching Time Test Circuit Waveform Vin Monitor Rg D.U.T. RL Vout Monitor Vin Vout 10% 10% 90% td(on) tr 90% td(off) 90% 10% Vin 10 V V DS = 30 V tf Rev.1.00, Dec.04.2003, page 8 of 9 H7N0608FM Package Dimensions 10.0 0.3 7.0 0.3 3.2 0.2 2.8 0.2 2.5 0.2 As of January, 2003 Unit: mm 0.6 5.0 0.3 2.0 0.3 1.2 0.2 1.4 0.2 12.0 0.3 4.45 0.3 2.5 0.7 0.1 2.54 0.5 2.54 0.5 0.5 0.1 Package Code JEDEC JEITA Mass (reference value) TO-220FM -- Conforms 1.8 g Rev.1.00, Dec.04.2003, page 9 of 9 14.0 1.0 17.0 0.3 Sales Strategic Planning Div. Keep safety first in your circuit designs! Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan 1. Renesas Technology Corp. puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of nonflammable material or (iii) prevention against any malfunction or mishap. Notes regarding these materials 1. These materials are intended as a reference to assist our customers in the selection of the Renesas Technology Corp. product best suited to the customer's application; they do not convey any license under any intellectual property rights, or any other rights, belonging to Renesas Technology Corp. or a third party. 2. Renesas Technology Corp. assumes no responsibility for any damage, or infringement of any third-party's rights, originating in the use of any product data, diagrams, charts, programs, algorithms, or circuit application examples contained in these materials. 3. All information contained in these materials, including product data, diagrams, charts, programs and algorithms represents information on products at the time of publication of these materials, and are subject to change by Renesas Technology Corp. without notice due to product improvements or other reasons. It is therefore recommended that customers contact Renesas Technology Corp. or an authorized Renesas Technology Corp. product distributor for the latest product information before purchasing a product listed herein. The information described here may contain technical inaccuracies or typographical errors. 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Please contact Renesas Technology Corp. or an authorized Renesas Technology Corp. product distributor when considering the use of a product contained herein for any specific purposes, such as apparatus or systems for transportation, vehicular, medical, aerospace, nuclear, or undersea repeater use. 6. The prior written approval of Renesas Technology Corp. is necessary to reprint or reproduce in whole or in part these materials. 7. If these products or technologies are subject to the Japanese export control restrictions, they must be exported under a license from the Japanese government and cannot be imported into a country other than the approved destination. Any diversion or reexport contrary to the export control laws and regulations of Japan and/or the country of destination is prohibited. 8. Please contact Renesas Technology Corp. for further details on these materials or the products contained therein. 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