Part Number Hot Search : 
LBN7002 NTD5803 STA406A AD7797 10120 BC517A3 LT8362 TLE4305
Product Description
Full Text Search
 

To Download 2SJ669 Datasheet File

  If you can't view the Datasheet, Please click here to try to view without PDF Reader .  
 
 


  Datasheet File OCR Text:
 2SJ669
TOSHIBA Field Effect Transistor Silicon P-Channel MOS Type (U-MOS III)
2SJ669
Relay Drive, DC/DC Converter and Motor Drive Applications
4-V gate drive Low drain-source ON-resistance: RDS (ON) = 0.12 (typ.) High forward transfer admittance: |Yfs| = 5.0 S (typ.) Low leakage current: IDSS = -100 A (max) (VDS = -60 V) Enhancement mode: Vth = -0.8 to -2.0 V (VDS = -10 V, ID = -1 mA) Unit: mm
Absolute Maximum Ratings (Ta = 25C)
Characteristic Drain-source voltage Drain-gate voltage (RGS = 20 k) Gate-source voltage Drain current Drain power dissipation Single-pulse avalanche energy (Note 2) Avalanche current Repetitive avalanche energy (Note 3) Channel temperature Storage temperature range DC (Note 1) Symbol VDSS VDGR VGSS ID IDP PD EAS IAR EAR Tch Tstg Rating -60 -60 20 -5 -20 1.2 40.5 -5 0.12 150 -55~150 Unit V V V A A W mJ A mJ C C
Pulse (Note 1)
JEDEC JEITA TOSHIBA
2-8M1B
Weight: 0.54 g (typ.)
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Thermal Characteristics
Characteristic Thermal resistance, channel to ambient Symbol Rth (ch-a) Max 104 Unit C / W
Note 1: The channel temperature should not exceed 150 during use. Note 2: VDD = -25 V, Tch = 25C (initial), L = 2.2 mH, RG = 25 , IAR = -5 A Note 3: Repetitive rating: pulse width limited by maximum channel temperature This transistor is an electrostatic-sensitive device. Handle with care.
1
2006-11-17
2SJ669
Electrical Characteristics (Ta = 25C)
Characteristic Gate leakage current Drain cutoff current Drain-source breakdown voltage Gate threshold voltage Drain-source ON-resistance Forward transfer admittance Input capacitance Reverse transfer capacitance Output capacitance Rise time Turn-on time Symbol IGSS IDSS V (BR) DSS V (BR) DSX Vth RDS (ON) |Yfs| Ciss Crss Coss tr ton tf toff Qg Qgs Qgd VDD -48 V, VGS = -10 V, ID = -5 A Duty < 1%, tw = 10 s = 0V VGS -10 V 4.7 Switching time ID = -2.5 A
Output
Test Condition VGS = 16 V, VDS = 0 V VDS = -60 V, VGS = 0 V ID = -10 mA, VGS = 0 V ID = -10 mA, VGS = 20 V VDS = -10 V, ID = -1 mA VGS = -4 V, ID = -2.5 A VGS = -10 V, ID = -2.5 A VDS = -10 V, ID = -2.5 A
Min -- -- -60 -35 -0.8 -- -- 2.5 --
Typ. -- -- -- -- -- 0.16 0.12 5.0 700 60 90 14 24
Max 10 -100 -- -- -2.0 0.25 0.17 -- -- -- -- -- --
Unit A A V V V S
VDS = -10 V, VGS = 0 V, f = 1 MHz
-- -- -- --
pF
RL = 12 VDD -30 V -
ns
Fall time Turn-off time Total gate charge (gate-source plus gate-drain) Gate-source charge Gate-drain ("Miller") charge
-- -- -- -- --
14 95 15 11 4
-- -- -- -- -- nC
Source-Drain Ratings and Characteristics (Ta = 25C)
Characteristic Continuous drain reverse current (Note 1) Pulse drain reverse current (Note 1) Forward voltage (diode) Reverse recovery time Reverse recovery charge Symbol IDR IDRP VDSF trr Qrr Test Condition -- -- IDR = -5 A, VGS = 0 V IDR = -5 A, VGS = 0 V dlDR / dt = 50 A / S Min -- -- -- -- -- Typ. -- -- -- 40 32 Max -5 -20 1.7 -- -- Unit A A V ns nC
Marking
J669
Part No. (or abbreviation code) Lot No. A line indicates lead (Pb)-free package or lead (Pb)-free finish.
2
2006-11-17
2SJ669
ID - VDS
-5 -8 -10 -6 -4. -3.5 Common source Ta = 25C Pulse test -10 -10 -8 -6 -4
ID - VDS
Common source Ta = 25C Pulse test -3.5 -6
-4
(A)
ID
-3 -2.8 -2 VGS = -2.5V -1
Drain current
Drain current
ID
(A)
-4
-3
-8
-3
-2
VGS = -2.5 V
0
0
-0.4
-0.8
-1.2
-1.6
-2.0
0
0
-2
-4
-6
-8
-10
Drain-source voltage
VDS
(V)
Drain-source voltage
VDS
(V)
ID - VGS
-10 -2.0
VDS - VGS VDS (V)
Common source Ta = 25C Pulse test
ID
(A)
-8
Common source VDS = -10 V Pulse test
-1.6
Drain current
25
-4
Drain-source voltage
-6
-1.2
-0.8 -5 -0.4 -2.5 ID = -1.2 A 0 0 -4 -8 -12 -16 -20
-2
100
Ta = -55C
0
0
-1
-2
-3
-4
-5
Gate-source voltage
VGS
(V)
Gate-source voltage
VGS
(V)
Yfs - ID (S)
100 Common source VDS = -10 V Pulse test 0.5 Common source Ta = 25C Pulse test
RDS (ON) - ID
Yfs
Drain-source ON-resistance RDS (ON) ()
0.4
Forward transfer admittance
10
Ta = -55C 100 25
0.3
0.2
-4 V
1
0.1
VGS = -10V
0.1 -0.1
-1
-10
-100
0 0
-2
-4
-6
-8
-10
Drain current
ID
(A)
Drain current
ID
(A)
3
2006-11-17
2SJ669
RDS (ON) - Ta
-0.4 Common source Pulse test 10 Common source Ta = 25C Pulse test
IDR - VDS
-5 -10
Drain-source ON-resistance RDS (ON) ()
-2.5 -1.2 -0.2 VGS = -4 V -1.2 -0.1 VGS = -10 V 0 -80 -2.5 -5
Drain reverse current
IDR
-0.3
ID = -5 A
(A)
-3
1
-1
VGS = 0 V
0.1 -40 0 40 80 120 160
0
0.2
0.4
0.6
0.8
1.0
1.2
Ambient temperature
Ta
(C)
Drain-source voltage
VDS
(V)
Capacitance - VDS
10000 Common source f = 1 MHz
Vth - Ta
-2.0
Tc = 25C 1000 Ciss
Vth (V)
VGS = 0 V
(pF)
-1.6
Common source VDS = -10 V ID = 1 mA Pulse test
C
Gate threshold voltage
-100
-1.2
Capacitance
100
Coss
-0.8
Crss 10 -0.1
-0.4
-1
-10
0 -80
-40
0
40
80
120
160
Drain-source voltage
VDS
(V)
Ambient temperature
Ta
(C)
PD - Ta
2.0
Dynamic input/output characteristics
-50 VDS -25 ID = -5 A -40 Ta = 25C Pulse test -30 -15
(W)
VDS (V)
1.5
Drain power dissipation
1.0
Drain-source voltage
-20
-12V
-24V
-10
0.5
-10 VGS 0
VDD = -48 V
-5
0
0
40
80
120
160
200
0
5
10
15
20
25
30
0
Ambient temperature
Ta
(C)
Total gate charge
Qg
(nC)
4
2006-11-17
Gate-source voltage
VGS
-20
PD
(V)
Common source
2SJ669
rth - tw
10
Normalized transient thermal impedance
1
Duty = 0.5 0.2
rth (t)/Rth (ch-a)
0.1
0.1 0.05 0.02 0.01 PDM t Single pulse T Duty = t/T Rth (ch-a) = 104C/W
0.01
0.001 100
1m
10 m
100 m
1
10
100
Pulse width
tw
(s)
EAS - Tch Safe operating area
100 50
(mJ)
100 s *
40
ID max (Pulsed) * 10
EAS Avalanche nergy
ID max (Continuous) 1 ms *
30
(A)
20
Drain current
ID
1
DC operation Ta = 25C 0.1
10
0 25
50
75
100
125
150
0.01
*:Single nonrepetitive pulse Tc = 25C Curves linearly must with be derated in VDSS max 1 10 100 increase
Channel temperature (initia)
Tch
(C)
temperature. 0.001 0.1
0V -15 V
BVDSS IAR VDD Test circuit VDS Waveform AS = 1 B VDSS L I2 B 2 VDSS - VDD
Drain-source voltage
VDS
(V)
RG = 25 VDD = -25 V, L = 2.2 mH
5
2006-11-17
2SJ669
RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
6
2006-11-17


▲Up To Search▲   

 
Price & Availability of 2SJ669

All Rights Reserved © IC-ON-LINE 2003 - 2022  

[Add Bookmark] [Contact Us] [Link exchange] [Privacy policy]
Mirror Sites :  [www.datasheet.hk]   [www.maxim4u.com]  [www.ic-on-line.cn] [www.ic-on-line.com] [www.ic-on-line.net] [www.alldatasheet.com.cn] [www.gdcy.com]  [www.gdcy.net]


 . . . . .
  We use cookies to deliver the best possible web experience and assist with our advertising efforts. By continuing to use this site, you consent to the use of cookies. For more information on cookies, please take a look at our Privacy Policy. X