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| INTEGRATED CIRCUITS 74F20 Dual 4-input NAND gate Product specification IC15 Data Handbook 1989 Mar 03 Philips Semiconductors Philips Semiconductors Product specification Dual 4-input NAND gate 74F20 TYPE TYPICAL PROPAGATION DELAY 3.5ns TYPICAL SUPPLY CURRENT (TOTAL) 2.2mA PIN CONFIGURATION D0a D0b NC 1 2 3 4 5 6 7 14 13 12 11 10 9 8 VCC D1d D1c NC D1b D1a Q1 74F20 ORDERING INFORMATION DESCRIPTION 14-pin plastic DIP 14-pin plastic SO COMMERCIAL RANGE VCC = 5V 10%, Tamb = 0C to +70C N74F20N N74F20D PKG DWG # SOT27-1 D0c D0d Q0 GND SF00065 SOT108-1 INPUT AND OUTPUT LOADING AND FAN-OUT TABLE PINS Dna, Dnb, Dnc, Dnd Q0, Q1 Data inputs Data outputs DESCRIPTION 74F (U.L.) HIGH/LOW 1.0/1.0 50/33 LOAD VALUE HIGH/LOW 20A/0.6mA 1.0mA/20mA NOTE: One (1.0) FAST unit load is defined as: 20A in the High state and 0.6mA in the Low state. LOGIC DIAGRAM D0a D0b D0c D0d 1 2 6 4 5 Q0 FUNCTION TABLE INPUTS Dna L X X 9 10 8 12 13 Q1 OUTPUT Dnd X X X L H Qn H H H H L X X L X H Dnb X L X X Dnc X D1a D1b D1c VCC = Pin 14 GND = Pin 7 D1d H H NOTES: H = High voltage level L = Low voltage level X = Don't care SF00066 LOGIC SYMBOL 1 2 4 5 9 10 12 13 IEC/IEEE SYMBOL 1 2 & 6 D0a D0b D0c D0d D1a D1b D1c D1d 4 5 Q0 Q1 VCC = Pin 14 GND = Pin 7 6 8 9 SF00067 10 8 12 13 SF00068 March 3, 1989 2 853-0332 95935 Philips Semiconductors Product specification Dual 4-input NAND gate 74F20 ABSOLUTE MAXIMUM RATINGS (Operation beyond the limits set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the operating free-air temperature range.) SYMBOL VCC VIN IIN VOUT IOUT Tamb Tstg Supply voltage Input voltage Input current Voltage applied to output in High output state Current applied to output in Low output state Operating free-air temperature range Storage temperature range PARAMETER RATING -0.5 to +7.0 -0.5 to +7.0 -30 to +5 -0.5 to VCC 40 0 to +70 -65 to +150 UNIT V V mA V mA C C RECOMMENDED OPERATING CONDITIONS LIMITS SYMBOL VCC VIH VIL IIK IOH IOL Tamb Supply voltage High-level input voltage Low-level input voltage Input clamp current High-level output current Low-level output current Operating free-air temperature range 0 PARAMETER MIN 4.5 2.0 0.8 -18 -1 20 +70 NOM 5.0 MAX 5.5 V V V mA mA mA C UNIT DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 VCC = MIN, VIL = MAX VIH = MIN, IOH = MAX Low-level Low level output voltage Input clamp voltage Input current at maximum input voltage High-level input current Low-level input current Short-circuit output current3 Supply current (total) ICCH ICCL VCC = MIN, VIL = MAX VIH = MIN, IOL = MAX VCC = MIN, II = IIK VCC = MAX, VI = 7.0V VCC = MAX, VI = 2.7V VCC = MAX, VI = 0.5V VCC = MAX VCC = MAX VIN = GND VIN = 4.5V -60 0.9 3.4 10%VCC 5%VCC 10%VCC 5%VCC LIMITS MIN 2.5 2.7 3.4 0.30 0.30 -0.73 0.50 0.50 -1.2 100 20 -0.6 -150 1.4 5.1 V A A mA mA mA V TYP2 MAX UNIT VO OH High level output voltage High-level V VO OL VIK II IIH IIL IOS ICC NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. March 3, 1989 3 Philips Semiconductors Product specification Dual 4-input NAND gate 74F20 AC ELECTRICAL CHARACTERISTICS LIMITS SYMBOL PARAMETER TEST CONDITION VCC = +5.0V Tamb = +25C CL = 50pF, RL = 500 MIN tPLH tPHL Propagation delay Dna, Dnb, Dnc, Dnd to Qn Waveform 1 2.4 2.0 TYP 3.7 3.2 MAX 5.0 4.3 VCC = +5.0V 10% Tamb = 0C to +70C CL = 50pF, RL = 500 MIN 2.4 2.0 MAX 6.0 5.3 ns UNIT AC WAVEFORMS Dna, Dnb, Dnc, Dnd VM tPHL VM tPLH Qn VM VM SF00069 Waveform 1. Propagation Delay for Inverting Outputs NOTE: For all waveforms, VM = 1.5V. TEST CIRCUIT AND WAVEFORMS VCC NEGATIVE PULSE VIN PULSE GENERATOR RT D.U.T. VOUT 90% VM 10% tTHL (tf ) CL RL tw VM 10% tTLH (tr ) 0V 90% AMP (V) tTLH (tr ) 90% POSITIVE PULSE VM 10% tw tTHL (tf ) AMP (V) 90% VM 10% 0V Test Circuit for Totem-Pole Outputs DEFINITIONS: RL = Load resistor; see AC ELECTRICAL CHARACTERISTICS for value. CL = Load capacitance includes jig and probe capacitance; see AC ELECTRICAL CHARACTERISTICS for value. RT = Termination resistance should be equal to ZOUT of pulse generators. Input Pulse Definition INPUT PULSE REQUIREMENTS family amplitude VM 74F 3.0V 1.5V rep. rate 1MHz tw 500ns tTLH 2.5ns tTHL 2.5ns SF00006 March 3, 1989 4 Philips Semiconductors Product specification Dual 4-input NAND gate 74F20 DIP14: plastic dual in-line package; 14 leads (300 mil) SOT27-1 1989 Mar 03 5 Philips Semiconductors Product specification Dual 4-input NAND gate 74F20 SO14: plastic small outline package; 14 leads; body width 3.9 mm SOT108-1 1989 Mar 03 6 Philips Semiconductors Product specification Dual 4-input NAND gate 74F20 NOTES 1989 Mar 03 7 Philips Semiconductors Product specification Dual 4-input NAND gate 74F20 Data sheet status Data sheet status Objective specification Preliminary specification Product specification Product status Development Qualification Definition [1] This data sheet contains the design target or goal specifications for product development. Specification may change in any manner without notice. This data sheet contains preliminary data, and supplementary data will be published at a later date. Philips Semiconductors reserves the right to make chages at any time without notice in order to improve design and supply the best possible product. This data sheet contains final specifications. Philips Semiconductors reserves the right to make changes at any time without notice in order to improve design and supply the best possible product. Production [1] Please consult the most recently issued datasheet before initiating or completing a design. Definitions Short-form specification -- The data in a short-form specification is extracted from a full data sheet with the same type number and title. For detailed information see the relevant data sheet or data handbook. Limiting values definition -- Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information -- Applications that are described herein for any of these products are for illustrative purposes only. Philips Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Disclaimers Life support -- These products are not designed for use in life support appliances, devices or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips Semiconductors customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application. Right to make changes -- Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless otherwise specified. Philips Semiconductors 811 East Arques Avenue P.O. Box 3409 Sunnyvale, California 94088-3409 Telephone 800-234-7381 (c) Copyright Philips Electronics North America Corporation 1998 All rights reserved. Printed in U.S.A. print code Document order number: Date of release: 10-98 9397-750-05058 Philips Semiconductors yyyy mmm dd 8 |
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