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| www.fairchildsemi.com KA75XXX Voltage Detector Features * Detecting against error operations at the power ON/OFF. * Resetting function for the low voltage microprocessor. * Checking low battery Description The KA75250/KA75270/KA75290/KA75310/KA75330/ KA75360/KA75390/KA75420/KA75450 prevents error of system from supply voltage below normal voltage level at the time the power on and instantaneous power off in systems. TO-92 1 1. Input 2. GND 3. Output Internal Block Diagram INPUT 1 1:TO-92 3:SOT-89 3 OUT 3:TO-92 1:SOT-89 VREF 2 GND 2:TO-92 2:SOT-89 Rev. 1.0.2 (c)2001 Fairchild Semiconductor Corporation KA75XXX Absolute Maximum Rating (TA=25C) Characteristic Supply Voltage Detecting Voltage Hysteresis Voltage Operating Temperature Storage Temperature Power Dissipation Detecting Voltage Temperature Coefficient Symbol Vcc VDET VHYS TOPR TSTG PD VDET/T Value 0.3 ~ + 15.0 2.5/2.7/2.9/3.1 3.3/3.6/3.9/4.2/4.5 50 - 25 ~ + 85 - 50 ~ + 150 200 RL = 200, +0.01 Unit V V mV C C mW %/ C Electrical Characteristics (TA=25C) Characteristic Symbol Test Conditions RL=200 VOL 0.4V Detecting Voltage VDET KA75250 KA75270 KA75290 KA75310 KA75330 KA75360 KA75390 KA75420 KA75450 Min 2.35 2.55 2.75 2.95 3.15 3.45 3.75 4.05 4.35 30 0.6 10 8 Typ 2.5 2.7 2.9 3.1 3.3 3.6 3.9 4.2 4.5 50 0.01 300 30 0.8 10 15 20 16 Max 2.65 2.85 3.05 3.25 3.45 3.75 4.05 4.35 4.65 0.4 0.1 100 500 50 1.0 20 30 30 Unit V Low Output Voltage Output Leakage Current Hysteresis Voltage Detecting Voltage Temperature Coefficient Circuit Current(at on time) Circuit Current(at off time) Threshold Operating Voltage " L" Transmission Delay Time " H" Transmission Delay Time Output Current (at on time) Output Current (at on time) VOL ILKG VHYS VDET/T ICCL ICCH VTH(OPR) TOL TOH IOLI IOLII RL=200 VCC=15V RL=200 RL=200 VCC=VDET(MIN)-0.05V VCC=5.25V RL=200, VOL 0.4V RL=1.0k, CL=100pF RL=1.0k, CL=100pF VCC=VDET(MIN) -0.05V, TA=25C VCC=VDET(MIN) - 0.05V TA= -25 ~ + 85C V uA mV %/C uA uA V uS uS mA mA 2 KA75XXX TEST CIRCUIT 1. A1 INPUT A2 KA75XXX OUTPUT V1 M 10u 10V + GND TEST CIRCUIT 2. INPUT RL + KA75XXX INPUT PULSE 0.1u 50V GND OUTPUT 10u 50V 5V TEST CIRCUIT 3. INPUT RL LED VCC KA75XXX OUTPUT GND 3 KA75XXX Application Circuit INPUT RL VCC KA75XXX OUTPUT GND RESET GND Vcc CPU 4 KA75XXX Mechanical Dimensions Package Dimensions in millimeters TO-92 4.58 -0.15 +0.25 14.47 0.40 0.46 0.10 4.58 0.20 1.27TYP [1.27 0.20] 3.60 0.20 1.27TYP [1.27 0.20] 0.38 -0.05 +0.10 3.86MAX 1.02 0.10 0.38 -0.05 +0.10 (R2.29) (0.25) 5 KA75XXX Ordering Information Product Number KA75250Z KA75270Z KA75290Z KA75310Z KA75330Z KA75360Z KA75390Z KA75420Z KA75450Z TO-92 -25 ~ +85C Package Operating Temperature 6 KA75XXX 7 KA75XXX DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. www.fairchildsemi.com 4/28/01 0.0m 001 Stock#DSxxxxxxxx 2001 Fairchild Semiconductor Corporation 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. |
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