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PD - 96058 IRLR7843CPBF IRLU7843CPbF Applications l l HEXFET(R) Power MOSFET l High Frequency Synchronous Buck Converters for Computer Processor Power High Frequency Isolated DC-DC Converters with Synchronous Rectification for Telecom and Industrial Use Lead-Free VDSS 30V RDS(on) max 3.3m: Qg 34nC Benefits l l l Very Low RDS(on) at 4.5V VGS Ultra-Low Gate Impedance Fully Characterized Avalanche Voltage and Current D-Pak I-Pak IRLR7843CPBF IRLU7843CPbF Absolute Maximum Ratings Parameter VDS VGS ID @ TC = 25C ID @ TC = 100C IDM PD @TC = 25C PD @TC = 100C TJ TSTG Drain-to-Source Voltage Gate-to-Source Voltage Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Max. 30 20 161f 113f 620 140 71 0.95 -55 to + 175 300 (1.6mm from case) Units V A W W/C C Maximum Power Dissipation Maximum Power Dissipation Linear Derating Factor Operating Junction and Storage Temperature Range g g Soldering Temperature, for 10 seconds Thermal Resistance Parameter RJC RJA RJA Junction-to-Case Junction-to-Ambient (PCB Mount) Junction-to-Ambient Typ. Max. 1.05 50 110 Units C/W gA --- --- --- Notes through are on page 11 www.irf.com 1 05/31/06 IRLR/U7843CPbF Static @ TJ = 25C (unless otherwise specified) Parameter BVDSS VDSS/TJ RDS(on) VGS(th) VGS(th)/TJ IDSS IGSS gfs Qg Qgs1 Qgs2 Qgd Qgodr Qsw Qoss td(on) tr td(off) tf Ciss Coss Crss Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Gate Threshold Voltage Coefficient Drain-to-Source Leakage Current Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Forward Transconductance Total Gate Charge Pre-Vth Gate-to-Source Charge Post-Vth Gate-to-Source Charge Gate-to-Drain Charge Gate Charge Overdrive Switch Charge (Qgs2 + Qgd) Output Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance Min. Typ. Max. Units 30 --- --- --- 1.5 --- --- --- --- --- 37 --- --- --- --- --- --- --- --- --- --- --- --- --- --- --- 19 2.6 3.2 --- -5.4 --- --- --- --- --- 34 9.1 2.5 12 10 15 21 25 42 34 19 4380 940 430 --- --- 3.3 4.0 2.3 --- 1.0 150 100 -100 --- 50 --- --- --- --- --- --- --- --- --- --- --- --- --- pF nC nC V Conditions VGS = 0V, ID = 250A mV/C Reference to 25C, ID = 1mA m VGS = 10V, ID = 15A V VGS = 4.5V, ID VDS = VGS, ID = 250A e = 12A e mV/C A VDS = 24V, VGS = 0V nA S VDS = 24V, VGS = 0V, TJ = 125C VGS = 20V VGS = -20V VDS = 15V, ID = 12A VDS = 15V VGS = 4.5V ID = 12A See Fig. 16 VDS = 15V, VGS = 0V VDD = 15V, VGS = 4.5Ve ID = 12A Clamped Inductive Load VGS = 0V VDS = 15V = 1.0MHz ns Avalanche Characteristics EAS IAR EAR Parameter Single Pulse Avalanche Energyd Avalanche CurrentA Repetitive Avalanche Energy Typ. --- --- --- Max. 1440 12 14 Units mJ A mJ Diode Characteristics Parameter IS ISM VSD trr Qrr ton Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode)A Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Forward Turn-On Time Min. Typ. Max. Units --- --- --- --- --- --- --- --- 39 36 161f A 620 1.0 59 54 V ns nC Conditions MOSFET symbol showing the integral reverse p-n junction diode. TJ = 25C, IS = 12A, VGS = 0V TJ = 25C, IF = 12A, VDD = 15V di/dt = 100A/s e e Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) 2 www.irf.com IRLR/U7843CPbF 1000 VGS 10V 4.5V 3.7V 3.5V 3.3V 3.0V 2.7V BOTTOM 2.5V TOP 1000 ID, Drain-to-Source Current (A) 100 ID, Drain-to-Source Current (A) 100 VGS 10V 4.5V 3.7V 3.5V 3.3V 3.0V 2.7V BOTTOM 2.5V TOP 10 2.5V 10 1 2.5V 20s PULSE WIDTH Tj = 25C 0.1 0.1 1 10 100 20s PULSE WIDTH Tj = 175C 1 0.1 1 10 100 VDS, Drain-to-Source Voltage (V) VDS, Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 1000 2.0 RDS(on) , Drain-to-Source On Resistance ID, Drain-to-Source Current () ID = 30A VGS = 10V 100 10 T J = 25C (Normalized) T J = 175C 1.5 1.0 1 2.0 3.0 VDS = 15V 20s PULSE WIDTH 4.0 5.0 0.5 -60 -40 -20 0 20 40 60 80 100 120 140 160 180 VGS , Gate-to-Source Voltage (V) T J , Junction Temperature (C) Fig 3. Typical Transfer Characteristics Fig 4. Normalized On-Resistance vs. Temperature www.irf.com 3 IRLR/U7843CPbF 100000 12 VGS, Gate-to-Source Voltage (V) VGS = 0V, f = 1 MHZ Ciss = C gs + Cgd, C ds Crss = C gd Coss = Cds + Cgd SHORTED ID= 12A 10 8 6 4 2 0 VDS= 24V VDS= 15V C, Capacitance (pF) 10000 Ciss 1000 Coss Crss 100 1 10 100 0 20 40 60 80 VDS, Drain-to-Source Voltage (V) Q G Total Gate Charge (nC) Fig 5. Typical Capacitance vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage 1000.0 10000 OPERATION IN THIS AREA LIMITED BY R DS(on) 100.0 T J = 175C 10.0 ID, Drain-to-Source Current (A) ISD, Reverse Drain Current (A) 1000 100 100sec 10 Tc = 25C Tj = 175C Single Pulse 1 0.1 1.0 10.0 1msec 10msec 100.0 1000.0 1.0 T J = 25C VGS = 0V 0.1 0.0 0.5 1.0 1.5 VSD, Source-toDrain Voltage (V) VDS , Drain-toSource Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage Fig 8. Maximum Safe Operating Area 4 www.irf.com IRLR/U7843CPbF 160 LIMITED BY PACKAGE 2.5 VGS(th) Gate threshold Voltage (V) ID , Drain Current (A) 120 2.0 ID = 250A 1.5 80 1.0 40 0.5 0 25 50 75 100 125 150 175 T C , Case Temperature (C) 0.0 -75 -50 -25 0 25 50 75 100 125 150 175 T J , Temperature ( C ) Fig 9. Maximum Drain Current vs. Case Temperature Fig 10. Threshold Voltage vs. Temperature 10 Thermal Response ( Z thJC ) 1 D = 0.50 0.20 0.10 0.05 0.02 0.01 J J 1 1 R1 R1 2 R2 R2 C 2 0.1 Ri (C/W) 0.5084 0.5423 i (sec) 0.000392 0.011108 0.01 Ci= i/Ri Ci= i/Ri SINGLE PULSE ( THERMAL RESPONSE ) 0.001 1E-006 1E-005 0.0001 0.001 Notes: 1. Duty Factor D = t1/t2 2. Peak Tj = P dm x Zthjc + Tc 0.01 0.1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 IRLR/U7843CPbF 15V 6000 EAS, Single Pulse Avalanche Energy (mJ) VDS L DRIVER 5000 ID 8.6A 9.6A BOTTOM 12A TOP RG 20V VGS D.U.T IAS tp + V - DD 4000 A 0.01 3000 Fig 12a. Unclamped Inductive Test Circuit V(BR)DSS tp 2000 1000 0 25 50 75 100 125 150 175 Starting T J, Junction Temperature (C) Fig 12c. Maximum Avalanche Energy Vs. Drain Current I AS LD VDS Fig 12b. Unclamped Inductive Waveforms + VDD Current Regulator Same Type as D.U.T. D.U.T VGS Pulse Width < 1s Duty Factor < 0.1% 50K 12V .2F .3F D.U.T. VGS 3mA + V - DS Fig 14a. Switching Time Test Circuit VDS 90% IG ID 10% Current Sampling Resistors VGS td(on) tr td(off) tf Fig 13. Gate Charge Test Circuit Fig 14b. Switching Time Waveforms 6 www.irf.com IRLR/U7843CPbF D.U.T Driver Gate Drive + P.W. Period D= P.W. Period VGS=10V + Circuit Layout Considerations * Low Stray Inductance * Ground Plane * Low Leakage Inductance Current Transformer * D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt - + RG * * * * dv/dt controlled by RG Driver same type as D.U.T. I SD controlled by Duty Factor "D" D.U.T. - Device Under Test V DD VDD + - Re-Applied Voltage Inductor Curent Body Diode Forward Drop Ripple 5% ISD * VGS = 5V for Logic Level Devices Fig 15. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET(R) Power MOSFETs Id Vds Vgs Vgs(th) Qgs1 Qgs2 Qgd Qgodr Fig 16. Gate Charge Waveform www.irf.com 7 IRLR/U7843CPbF Power MOSFET Selection for Non-Isolated DC/DC Converters Control FET Special attention has been given to the power losses in the switching elements of the circuit - Q1 and Q2. Power losses in the high side switch Q1, also called the Control FET, are impacted by the Rds(on) of the MOSFET, but these conduction losses are only about one half of the total losses. Power losses in the control switch Q1 are given by; Synchronous FET The power loss equation for Q2 is approximated by; * Ploss = Pconduction + P + Poutput drive Ploss = Irms x Rds(on) + ( g x Vg x f ) Q ( 2 ) Ploss = Pconduction+ Pswitching+ Pdrive+ Poutput This can be expanded and approximated by; Q + oss x Vin x f + (Qrr x Vin x f ) 2 *dissipated primarily in Q1. Ploss = (Irms 2 x Rds(on ) ) Qgd +I x x Vin x ig + (Qg x Vg x f ) + Qoss x Vin x f 2 Qgs 2 f + I x x Vin x f ig This simplified loss equation includes the terms Qgs2 and Qoss which are new to Power MOSFET data sheets. Qgs2 is a sub element of traditional gate-source charge that is included in all MOSFET data sheets. The importance of splitting this gate-source charge into two sub elements, Qgs1 and Qgs2, can be seen from Fig 16. Qgs2 indicates the charge that must be supplied by the gate driver between the time that the threshold voltage has been reached and the time the drain current rises to Idmax at which time the drain voltage begins to change. Minimizing Q gs2 is a critical factor in reducing switching losses in Q1. Qoss is the charge that must be supplied to the output capacitance of the MOSFET during every switching cycle. Figure A shows how Qoss is formed by the parallel combination of the voltage dependant (nonlinear) capacitances Cds and Cdg when multiplied by the power supply input buss voltage. For the synchronous MOSFET Q2, Rds(on) is an important characteristic; however, once again the importance of gate charge must not be overlooked since it impacts three critical areas. Under light load the MOSFET must still be turned on and off by the control IC so the gate drive losses become much more significant. Secondly, the output charge Qoss and reverse recovery charge Qrr both generate losses that are transfered to Q1 and increase the dissipation in that device. Thirdly, gate charge will impact the MOSFETs' susceptibility to Cdv/dt turn on. The drain of Q2 is connected to the switching node of the converter and therefore sees transitions between ground and Vin. As Q1 turns on and off there is a rate of change of drain voltage dV/dt which is capacitively coupled to the gate of Q2 and can induce a voltage spike on the gate that is sufficient to turn the MOSFET on, resulting in shoot-through current . The ratio of Qgd/Qgs1 must be minimized to reduce the potential for Cdv/dt turn on. Figure A: Qoss Characteristic 8 www.irf.com IRLR/U7843CPbF D-Pak (TO-252AA) Package Outline Dimensions are shown in millimeters (inches) D-Pak (TO-252AA) Part Marking Information @Y6HQG@) UCDTADTA6IADSAS XDUCA6TT@H7G GPUA8P9@A !"# %A! ! Q6SUAIVH7@S DIU@SI6UDPI6G S@8UDAD@S GPBP 6TT@H7G@9APIAXXA DIAUC@A6TT@H7GAGDI@AA6A ,5)5 $ 96U@A8P9@ @6SA X@@FA GDI@A6 A2A! % Ir)AAQAAvAhriyAyvrAvv vqvphrAAGrhqArrA AQAAvAhriyAyvrAvvAvqvphrA AGrhqArrAAhyvsvphvAAurA8ryrry 6TT@H7G GPUA8P9@ 25 DIU@SI6UDPI6G S@8UDAD@S GPBP Q6SUAIVH7@S ,5)5 96U@A8P9@ QA2A9@TDBI6U@TAG@69AS@@ QSP9V8UAPQUDPI6G QA2A9@TDBI6U@TAG@69AS@@ QSP9V8UARV6GDAD@9AUPA 6TT@H7G GPUA8P9@ 8PITVH@SAG@W@GAPQUDPI6G @6SA X@@FA A2A! % 6A2A6TT@H7GATDU@A8P9@ www.irf.com 9 IRLR/U7843CPbF I-Pak (TO-251AA) Package Outline Dimensions are shown in millimeters (inches) I-Pak (TO-251AA) Part Marking Information @Y6HQG@) UCDTADTA6IADSAV ! XDUCA6TT@H7G GPUA8P9@A$%&' 6TT@H7G@9APIAXXA (A! DIAUC@A6TT@H7GAGDI@AA6A Ir)AAQAAvAhriyAyvrAvv vqvphrAGrhqArrA DIU@SI6UDPI6G S@8UDAD@S GPBP 6TT@H7G GPUA8P9@ Q6SUAIVH7@S ,5)8 $ 96U@A8P9@ @6SA A2A! X@@FA ( GDI@A6 25 DIU@SI6UDPI6G S@8UDAD@S GPBP 6TT@H7G GPUA8P9@ Q6SUAIVH7@S ,5)8 96U@A8P9@ QA2A9@TDBI6U@TAG@69AS@@ QSP9V8UAPQUDPI6G @6SA A2A! X@@FA ( 6A2A6TT@H7GATDU@A8P9@ 10 www.irf.com IRLR/U7843CPbF D-Pak (TO-252AA) Tape & Reel Information Dimensions are shown in millimeters (inches) TR TRR TRL 16.3 ( .641 ) 15.7 ( .619 ) 16.3 ( .641 ) 15.7 ( .619 ) 12.1 ( .476 ) 11.9 ( .469 ) FEED DIRECTION 8.1 ( .318 ) 7.9 ( .312 ) FEED DIRECTION NOTES : 1. CONTROLLING DIMENSION : MILLIMETER. 2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ). 3. OUTLINE CONFORMS TO EIA-481 & EIA-541. 13 INCH 16 mm NOTES : 1. OUTLINE CONFORMS TO EIA-481. Notes: Repetitive rating; pulse width limited by max. junction temperature. Starting TJ = 25C, L = 20mH, RG = 25, IAS = 12A. Pulse width 400s; duty cycle 2%. Calculated continuous current based on maximum allowable junction temperature. Package limitation current is 30A. When mounted on 1" square PCB (FR-4 or G-10 Material). For recommended footprint and soldering techniques refer to application note #AN-994. Data and specifications subject to change without notice. This product has been designed and qualified for the Consumer market. Qualification Standards can be found on IR's Web site. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information. 05/2006 www.irf.com 11 |
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