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| IRFD110 Data Sheet July 1999 File Number 2314.3 1A, 100V, 0.600 Ohm, N-Channel Power MOSFET This N-Channel enhancement mode silicon gate power field effect transistor is an advanced power MOSFET designed, tested, and guaranteed to withstand a specified level of energy in the breakdown avalanche mode of operation. All of these power MOSFETs are designed for applications such as switching regulators, switching convertors, motor drivers, relay drivers, and drivers for high power bipolar switching transistors requiring high speed and low gate drive power. These types can be operated directly from integrated circuits. Formerly developmental type TA17441. Features * 1A, 100V * rDS(ON) = 0.600 * Single Pulse Avalanche Energy Rated * SOA is Power Dissipation Limited * Nanosecond Switching Speeds * Linear Transfer Characteristics * High Input Impedance * Related Literature - TB334 "Guidelines for Soldering Surface Mount Components to PC Boards" Ordering Information PART NUMBER IRFD110 PACKAGE HEXDIP BRAND IRFD110 Symbol D NOTE: When ordering, use the entire part number. G S Packaging HEXDIP DRAIN GATE SOURCE 4-269 CAUTION: These devices are sensitive to electrostatic discharge; follow proper ESD Handling Procedures. http://www.intersil.com or 407-727-9207 | Copyright (c) Intersil Corporation 1999 IRFD110 Absolute Maximum Ratings TC = 25oC, Unless Otherwise Specified IRFD110 100 100 1.0 8.0 20 1.0 0.008 19 -55 to 150 300 260 UNITS V V A A V W W/oC mJ oC oC oC Drain to Source Breakdown Voltage (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VDS Drain to Gate Voltage (RGS = 20k) (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VDGR Continuous Drain Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ID Pulsed Drain Current (Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IDM Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VGS Maximum Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . PD Linear Derating Factor (See Figure 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Single Pulse Avalanche Energy Rating (Note 3). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . EAS Operating and Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TJ , TSTG Maximum Temperature for Soldering Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TL Package Body for 10s, See Techbrief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Tpkg CAUTION: Stresses above those listed in "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. NOTE: 1. TJ = 25oC to 125oC. Electrical Specifications PARAMETER TC = 25oC, Unless Otherwise Specified SYMBOL BVDSS VGS(TH) IDSS TEST CONDITIONS ID = 250A, VGS = 0V (Figure 9) VGS = VDS , ID = 250A VDS = Rated BVDSS , VGS = 0V VDS = 0.8 x Rated BVDSS, VGS = 0V, TC = 125oC MIN 100 2.0 1.0 0.8 VGS = 10V, ID 1.0A, VDS = 0.8 x Rated BVDSS, Ig(REF) = 1.5mA (Figure 13) Gate Charge is Essentially Independent of Operating Temperature VGS = 0V, VDS = 25V, f = 1MHz (Figure 10) Measured from the Drain Lead, 2mm (0.08in) from Package to Center of Die Measured from the Source Lead, 2mm (0.08in) from Header to Source Bonding Pad Modified MOSFET Symbol Showing the Internal Device's Inductances D LD G LS S TYP 0.5 1.2 10 15 15 10 5.0 2.0 3.0 135 80 20 4.0 MAX 4.0 25 250 100 0.6 20 25 25 20 7.0 - UNITS V V A A A nA S ns ns ns ns nC nC nC pF pF pF nH Drain to Source Breakdown Voltage Gate Threshold Voltage Zero Gate Voltage Drain Current On-State Drain Current (Note 2) Gate to Source Leakage Current Drain to Source On Resistance (Note 2) Forward Transconductance (Note 2) Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Gate Charge (Gate to Source + Gate to Drain) Gate to Source Charge Gate to Drain "Miller" Charge Input Capacitance Output Capacitance Reverse Transfer Capacitance Internal Drain Inductance ID(ON) IGSS rDS(ON) gfs td(ON) tr td(OFF) tf Qg(TOT) Qgs Qgd CISS COSS CRSS LD VDS > ID(ON) x rDS(ON)MAX , VGS = 10V VGS = 20V ID = 0.8A, VGS = 10V (Figures 7, 8) VDS > ID(ON) x rDS(ON)MAX , ID = 0.8A (Figure 11) VDD = 0.5 x Rated BVDSS, ID 1.0A, RG = 9.1, RL = 50 MOSFET Switching Times are Essentially Independent of Operating Temperature - Internal Source Inductance LS - 6.0 - nH Thermal Resistance Junction to Ambient RJA Free Air Operation - - 120 oC/W 4-270 IRFD110 Source to Drain Diode Specifications PARAMETER Continuous Source to Drain Current Pulse Source to Drain Current (Note 4) SYMBOL ISD ISDM TEST CONDITIONS Modified MOSFET Symbol Showing the Integral Reverse P-N Junction Diode G D MIN - TYP - MAX 1.0 8.0 UNITS A A S Source to Drain Diode Voltage (Note 2) Reverse Recovery Time Reverse Recovery Charge NOTES: VSD trr QRR TJ = 25oC, ISD = 1.0A, VGS = 0V (Figure 12) TJ = 150oC, ISD = 1.0A, dISD/dt = 100A/s TJ = 150oC, ISD = 1.0A, dISD/dt = 100A/s - 100 0.2 2.5 - V ns C 2. Pulse test: pulse width 300s, duty cycle 2%. 3. VDD = 25V, starting TJ = 25oC, L = 28.5mH, RG = 25, peak IAS = 1.0A. 4. Repetitive rating: pulse width limited by maximum junction temperature. Typical Performance Curves 1.2 POWER DISSIPATION MULTIPLIER 1.0 0.8 Unless Otherwise Specified 1.0 ID, DRAIN CURRENT (A) 0 25 125 50 75 100 TA , AMBIENT TEMPERATURE (oC) 150 0.8 0.6 0.6 0.4 0.4 0.2 0 0.2 0 25 125 50 75 100 TA , AMBIENT TEMPERATURE (oC) 150 FIGURE 1. NORMALIZED POWER DISSIPATION vs AMBIENT TEMPERATURE FIGURE 2. MAXIMUM CONTINUOUS DRAIN CURRENT vs AMBIENT TEMPERATURE 10 5 VGS = 10V VGS = 9V VGS = 8V PULSE DURATION = 80s DUTY CYCLE = 0.5% MAX VGS = 7V 3 VGS = 6V 2 ID , DRAIN CURRENT (A) 1 100s 1ms 10ms 0.1 OPERATION IN THIS AREA MAY BE LIMITED BY rDS(ON) 100ms ID , DRAIN CURRENT (A) 4 1 VGS = 5V VGS = 4V 0.01 TJ = MAX RATED 1 10 VDS , DRAIN TO SOURCE VOLTAGE (V) DC 0 100 0 10 20 30 40 VDS , DRAIN TO SOURCE VOLTAGE (V) 50 FIGURE 3. FORWARD BIAS SAFE OPERATING AREA FIGURE 4. OUTPUT CHARACTERISTICS 4-271 IRFD110 Typical Performance Curves 5 PULSE DURATION = 80s DUTY CYCLE = 0.5% MAX VGS = 10V Unless Otherwise Specified (Continued) VGS = 9V VGS = 8V VGS = 7V ID(ON) , ON-STATE DRAIN CURRENT (A) ID , DRAIN CURRENT (A) 4 5 PULSE DURATION = 80s DUTY CYCLE = 0.5% MAX VDS > ID(ON) x rDS(ON)MAX 4 TJ = -55oC TJ = 25oC 3 TJ = 125oC 2 3 VGS = 6V 2 1 VGS = 5V VGS = 4V 1 0 0 5 0 2 4 6 8 10 VGS , GATE TO SOURCE VOLTAGE (V) 0 1 2 3 4 VDS , DRAIN TO SOURCE VOLTAGE (V) FIGURE 5. SATURATION CHARACTERISTICS FIGURE 6. TRANSFER CHARACTERISTICS 2.0 NORMALIZED DRAIN TO SOURCE ON RESISTANCE 2s PULSE TEST DUTY CYCLE = 0.5% MAX 2.5 PULSE DURATION = 80s DUTY CYCLE = 0.5% MAX VGS = 10V, ID = 0.8A rDS(ON) , DRAIN TO SOURCE ON RESISTANCE () 2.0 1.5 1.5 1.0 VGS = 10V 1.0 0.5 VGS = 20V 0.5 0 0 2 4 ID , DRAIN CURRENT (A) 6 8 0 -60 -40 -20 40 0 20 60 80 100 TJ , JUNCTION TEMPERATURE (oC) 120 140 NOTE: Heating effect of 2s pulse is minimal. FIGURE 7. DRAIN TO SOURCE ON RESISTANCE vs GATE VOLTAGE AND DRAIN CURRENT 1.25 NORMALIZED DRAIN TO SOURCE BREAKDOWN VOLTAGE ID = 250A 1.15 C, CAPACITANCE (pF) FIGURE 8. NORMALIZED DRAIN TO SOURCE ON RESISTANCE vs JUNCTION TEMPERATURE 500 VGS = 0V, f = 1MHz CISS = CGS + CGD CRSS = CGD COSS CDS + CGD 400 1.05 300 0.95 200 CISS 100 COSS CRSS 0.85 0.75 -60 -40 -20 0 20 40 60 80 100 120 140 0 0 10 TJ , JUNCTION TEMPERATURE (oC) 40 30 20 VDS , DRAIN TO SOURCE VOLTAGE (V) 50 FIGURE 9. NORMALIZED DRAIN TO SOURCE BREAKDOWN VOLTAGE vs JUNCTION TEMPERATURE FIGURE 10. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE 4-272 IRFD110 Typical Performance Curves 4.0 PULSE DURATION = 80s DUTY CYCLE = 0.5% MAX TJ = -55oC TJ = 25oC 2.4 TJ = 125oC Unless Otherwise Specified (Continued) 10 ISD , SOURCE TO DRAIN CURRENT (A) 5 PULSE DURATION = 80s DUTY CYCLE = 0.5% MAX gfs , TRANSCONDUCTANCE (S) 3.2 2 TJ = 150oC 1.0 5 TJ = 25oC 1.5 0.8 2 0.1 0 0.2 0.4 1.2 0.6 0.8 1.0 1.4 1.6 VSD , SOURCE TO DRAIN VOLTAGE (V) 1.8 2.0 0 0 1 2 3 4 5 ID , DRAIN CURRENT (A) FIGURE 11. TRANSCONDUCTANCE vs DRAIN CURRENT FIGURE 12. SOURCE TO DRAIN DIODE VOLTAGE 20 ID = 1A VGS , GATE TO SOURCE (V) VDS = 20V VDS = 50V VDS = 80V 10 15 5 0 0 2 4 6 QG, GATE CHARGE (nC) 8 10 FIGURE 13. GATE TO SOURCE VOLTAGE vs GATE CHARGE Test Circuits and Waveforms VDS BVDSS L VARY tP TO OBTAIN REQUIRED PEAK IAS VGS DUT tP RG IAS VDD tP VDS VDD + - 0V IAS 0.01 0 tAV FIGURE 14. UNCLAMPED ENERGY TEST CIRCUIT FIGURE 15. UNCLAMPED ENERGY WAVEFORMS 4-273 IRFD110 Test Circuits and Waveforms (Continued) tON td(ON) tr RL VDS + tOFF td(OFF) tf 90% 90% RG DUT - VDD 0 10% 90% 10% VGS VGS 0 10% 50% PULSE WIDTH 50% FIGURE 16. SWITCHING TIME TEST CIRCUIT FIGURE 17. RESISTIVE SWITCHING WAVEFORMS CURRENT REGULATOR VDS (ISOLATED SUPPLY) VDD SAME TYPE AS DUT Qg(TOT) Qgd Qgs D VDS VGS 12V BATTERY 0.2F 50k 0.3F G DUT 0 Ig(REF) 0 IG CURRENT SAMPLING RESISTOR S VDS ID CURRENT SAMPLING RESISTOR Ig(REF) 0 FIGURE 18. GATE CHARGE TEST CIRCUIT FIGURE 19. GATE CHARGE WAVEFORMS All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification. Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see web site http://www.intersil.com Sales Office Headquarters NORTH AMERICA Intersil Corporation P. O. Box 883, Mail Stop 53-204 Melbourne, FL 32902 TEL: (407) 724-7000 FAX: (407) 724-7240 EUROPE Intersil SA Mercure Center 100, Rue de la Fusee 1130 Brussels, Belgium TEL: (32) 2.724.2111 FAX: (32) 2.724.22.05 ASIA Intersil (Taiwan) Ltd. 7F-6, No. 101 Fu Hsing North Road Taipei, Taiwan Republic of China TEL: (886) 2 2716 9310 FAX: (886) 2 2715 3029 4-274 |
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