View K9S2808V0B_240293.PDF datasheet online --- IC-ON-LINE

Datasheet File OCR Text:

K9S5608V0C/B K9S2808V0C/B
Document Title
K9S6408V0C/B
SmartMediaTM
SmartMediaTM Card Revision History
Revision No
0.0 0.1
History
Initial issue 1. Explain how pointer operation works in detail. 2. Updated operation for tRST timing - If reset command(FFh) is written at Ready state, the device goes into Busy for maximum 5us. 1. Renamed the 17th pin from Vcc to LVD(Low Voltage Detect) -The LVD is used to electrically detect the proper supply voltage. By connecting this pin to Vss through a pull-down resister, it is possible to distinguish 3.3V product from 5V product. When 3.3V is applied as Vcc to pins 12 and 22, a ' High'level can be detected on the system side if the device is a 3.3V product, and ' Low'level for 5V product. 1.Powerup sequence is added Recovery time of minimum 1s is required before internal circuit gets ready for any command sequences
~ 2.5V
Draft Date
July 17th 2000 Nov. 20th 2000
Remark
Advanced Information Preliminary
0.2
Mar. 2th 2001
Final
0.3
Sep. 7th 2001
~ 2.5V
VCC High
WP
1s WE
2. AC parameter tCLR(CLE to RE Delay, min 50ns) is added. 3. AC parameter tAR1 value : 100ns --> 20ns
Note : For more detailed features and specifications including FAQ, please refer to Samsung' Flash web site. s http://www.samsung.com/Products/Semiconductor/Flash/TechnicalInfo/datasheets.htm The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions about device. If you have any questions, please contact the SAMSUNG branch office near your office.
1
K9S5608V0C/B K9S2808V0C/B
Revision History
Revision No
0.4
K9S6408V0C/B
SmartMediaTM
History
1. Unified access timing parameter definition for multiple operating modes - Changed AC characteristics (Before) Parameter ALE to RE Delay (ID read) ALE to RE Delay (Read cycle) RE Low to Status Output CE Low to Status Output RE access time(Read ID) - AC characteristics (After) . Deleted tRSTO, tCSTO and tREADID / Added tCLR, tCEA Parameter ALE to RE Delay (ID read) ALE to RE Delay (Read cycle) CLE to RE Delay CE Access Time Symbol tAR1 tAR2 tCLR tCEA Min 50 50 10 45 Max ns Unit Symbol tAR1 tAR2 tRSTO tCSTO tREADID Min 100 100 Max 35 45 35 ns Unit
Draft Date
Sep. 7th 2001
Remark
Final
CLE
tCR
CE WE
tAR
ALE RE
tREA
I/O0~7
90h
00h Address. 1cycle
ECh Maker code
CLE
tCEA
CE WE
tAR
ALE RE I/O0~7
tWHR tREA
90h 00h Address. 1cycle ECh Maker code
Note : For more detailed features and specifications including FAQ, please refer to Samsung Flash web site. http://www.samsung.com/Products/Semiconductor/Flash/TechnicalInfo/datasheets.htm The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions about device. If you have any questions, please contact the SAMSUNG branch office near your office.
2
K9S5608V0C/B K9S2808V0C/B
Revision History
Revision No History
K9S6408V0C/B
SmartMediaTM
Draft Date
tCLS tCLS tCLH tCS
Remark
CLE
CE
tWP
WE
tCH tCSTO tWHR tCHZ
RE
tDS
tDH tIR
tRSTO tRHZ
Status Output
I/O0~7
70h
tCLS
CLE
tCLS tCLH tCS
CE
tWP
WE
tCH tCEA tWHR tCHZ
RE
tDH tDS
I/O0~7 70h
tIR
tREA tRHZ
Status Output
0.5
1. Eliminated the duplicated AC parameter. - AC characteristics (Before) . Replaced tAR1,tAR2 with tAR Parameter ALE to RE Delay (ID read) ALE to RE Delay (Read cycle) CLE to RE Delay CE Access Time - AC characteristics (After) Parameter ALE to RE Delay CLE to RE Delay CE Access Time Symbol tAR tCLR tCEA Min 10 10 45 Max ns Unit Symbol tAR1 tAR2 tCLR tCEA Min 50 50 10 45 Max ns Unit
Feb. 9th 2002
Final
The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions about device. If you have any questions, please contact the SAMSUNG branch office near your office.
3
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
SmartMediaTM Card
FEATURES
*Single 2.7V~3.6V Supply *Organization - Memory Cell Array : 8MB(K9S6408V0X) : ( 8M + 256K)bit x 8bit 16MB(K9S2808V0X) : (16M + 512K)bit x 8bit 32MB(K9S5608V0X) : (32M + 1,024K)bit x 8bit - Data Register : (512 + 16)bit x8bit *Automatic Program and Erase - Page Program : (512 + 16)Byte - Block Erase 32MB, 16MB(K9S56/2808V0X) : (16K + 512)Byte 8MB (K9S6408V0X) : (8K + 256)Byte *528-Byte Page Read Operation - Random Access : 10s(Max.) * K9S6408V0B/A : 7s(Max.) * K9S6408V0C : 10s(Max.) - Serial Page Access : 50ns(Min.) *Fast Write Cycle Time - Program Time : 200s(Typ.) - Block Erase Time : 2ms(Typ.) *Command/Address/Data Multiplexed I/O Port *Hardware Data Protection - Program/Erase Lockout During Power Transitions *Reliable CMOS Floating-Gate Technology - Endurance : 100K Program/Erase Cycles * K9S6408V0X : 1Million Program/Erase Cycles - Data Retention : 10 years *Command Register Operation *22pad SmartMediaTM(SSFDC) *Unique ID for Copyright Protection
GENERAL DESCRIPTION
Using Nand flash memory, SmartMedia provides the most costeffective solution for the solid state mass storage market. A program operation is implemented by the single page of 528 bytes in typical 200s and an erase operation is done by the single block of 16K bytes (K9S6408V0X: 8K bytes) in typical 2ms. Data in a page can be read out at 50ns cycle time per byte. The I/O pins serve as ports for address and data inputs/outputs as well as command inputs. The on-chip writing controller automates all program and erase functions including pulse repetition, where required, and internal verification and margining of data. Even the write-intensive systems can take advantage of the SmartMeidas extended reliability of 100K program/erase cycles by providing ECC(Error Correcting Code) with real time mapping-out algorithm. (*Endurance varies according to its density. please refer to Features). SmartMedia is an optimum solution for data storage applications such as solid state file storage, digital voice recorder, digital still camera and other portable applications requiring non-volatility.
PIN DESCRIPTION
Device K9S2808V0X K9S5608V0X K9S6408V0C K9S6408V0A/M Unique ID Support O
X
SmartMediaTM CARD(SSFDC)
PIN DESCRIPTION
Pin Name I/O0 ~ I/O7 CLE Pin Function Data Input/Outputs Command Latch Enable Address Latch Enable Chip Enable Read Enable Write Enable Write Protect Low Voltage Detect Ground Ready/Busy output Power Ground No Connection
22 VCC 21 CE 20 RE 19 R/B 18 GND 17 LVD 16 I/O7 15 I/O6 14 I/O5 13 I/O4 12 VCC
12
22
1 2 3 4 5
VSS CLE ALE WE WP I/O0 I/O1 I/O2 I/O3
ALE CE RE WE WP LVD GND R/B VCC VSS
11
1
6 7 8 9
ID 32MB
10 VSS 11 VSS
22 PAD
SmartMediaTM
N.C
NOTE : Connect all VCC and VSS pins of each device to common power supply outputs and do not leave VCC or VSS disconnected. The pin 17(LVD) is used to detect 5V or 3.3V product electrically. Please, refer to the SmartMedia Application note for detail.
4
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
Figure 1. FUNCTIONAL BLOCK DIAGRAM
VCC VSS
A22: K9S6408V0X A23: K9S2808V0X A24: K9S5608V0X K9S6408V0X : 64M + 2M Bit K9S2808V0X : 128M + 4M Bit K9S5608V0X : 256M + 8M Bit
NAND Flash ARRAY
A9 - A24
X-Buffers Latches & Decoders Y-Buffers Latches & Decoders
A0 - A7
K9S6408V0X : (512 + 16)Byte x 16,384 K9S2808V0X : (512 + 16)Byte x 32,768 K9S5608V0X : (512 + 16)Byte x 65,536
Page Register & S/A
A8
Command Command Register
Y-Gating
I/O Buffers & Latches
VCC VSS I/0 0 I/0 7
CE RE WE
Control Logic & High Voltage Generator
Global Buffers
Output Driver
CLE ALE WP
5
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
Figure 2. ARRAY ORGANIZATION
Pages (8MB) : 1block=16pages (16MB/32MB) : 1block=32pages
1st half Page Register (=256 Bytes)
2nd half Page Register (=256 Bytes)
8 bit 512B Byte 16 Byte
Page Register
512 Byte 16 Byte
I/O 0 ~ I/O 7
ARRAY ORGANIZATION
1 Page K9S6408V0X K9S2808V0X K9S5608V0X 528 Byte 528Byte 528 Byte 1 Block 528 Bytes x 16 Pages 528Bytes x 32 Pages 528 Byte x 32 Pages 1 Device 528 Byte x 16Pages x 1024 Blocks 528Byte x 32Pages x 1024 Blocks 528Bytes x 32Pages x 2048 Blocks
NOTE : Column Address : Starting Address of the Register.
I/O 0 1st Cycle 2nd Cycle 3rd Cycle A0 A9 A17
I/O 1 A1 A10 A18
I/O 2 A2 A11 A19
I/O 3 A3 A12 A20
I/O 4 A4 A13 A21
I/O 5 A5 A14 A22
I/O 6 A6 A15 A23
I/O 7 A7 A16 A24 Column Address Row Address (Page Address)
00h Command(Read) : Defines the starting address of the 1st half of the register. 01h Command(Read) : Defines the starting address of the 2nd half of the register. A22: K9S6408V0X should be designated up to A22, addresse A23 to A24 must be set to "Low". A23: K9S2808V0X should be designated up to A23, address A24 must be set to "Low". A24: K9S5608V0X should be designated up to A24. * A8 is set to "Low" or "High" by the 00h or 01h Command. * The device ignores any additional input of address cycles than reguired.
6
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
PRODUCT INTRODUCTION
The SmartMeida has the memory organization as following Table1. Spare sixteen columns are located from column address of 512 to 527. A 528-byte data register is connected to memory cell arrays and is accommodating data-transfer between the I/O buffers and memory cell arrays during page read and page program operations. The memory array is made up of 16 cells that are serially connected to form a NAND structure. Each of the 16 cells resides in a different page. A block consists of the 32 pages formed by two 16 cell memory array. The array organization is shown in Figure 2. The program and the read operations are executed on a page basis, while the erase operation is executed on a block basis. The SmartMedia has addresses multiplexed into 8 I/O's. This scheme dramatically reduces pin counts and allows system upgrade to future densities by maintaining consistency in system board design. Command, address and data are all written through I/O's by bringing WE to low while CE is low. Data is latched on the rising edge of WE. Command Latch Enable(CLE) and Address Latch Enable(ALE) are used to multiplex command and address respectively, via the I/O pins. All commands require one bus cycle except for Block Erase and Page Program commands which require two cycles: one cycle for a setup and another for an execution. The physical space of the SmartMedia varies according to its density and from 8MB to 32MB SmartMedia require three cycles for bytelevel addressing; column address, row address, in that order. Page Read and Page Program need the same three address cycles following the required command input. In Block Erase operation, however, only the two row address cycles are used. Device operations are selected by writing specific commands into the command register. Table 2. defines the specific commands of the SmartMedia.
Table 1.MEMORY ORGANIZATION
Memory Organization K9S6408V0X K9S2808V0X K9S5608V0X 66Mbit (69,206,016 bit) 132Mbit (138,412,032 bit) 264Mbit (276,824,064 bit) Number of rows(Pages) 16,384 rows 32,768 rows 65,536 rows Number of columns 528 columns 528 columns 528 columns
Table 2. COMMAND SETS
Function Read 1 Read 2 Read ID Reset Page Program Block Erase Read Status 1st. Cycle 00h/01h(1) 50h 90h FFh 80h 60h 70h 2nd. Cycle 10h D0h O O Acceptable Command during Busy
NOTE: 1. The 00h command defines starting address of the 1st half of registers.The 01h command defines starting address of the 2nd half of registers. After data access on the 2nd half of register by the 01h command, address pointer is automatically moved to the 1st half register(00h) on the next cycle. Caution : Any undefined command inputs are prohibited except for above command sets of Table2.
7
K9S5608V0C/B K9S2808V0C/B
PIN DESCRIPTION
K9S6408V0C/B
SmartMediaTM
Command Latch Enable(CLE)
The CLE input controls the path activation for commands sent to the command register. When active high, commands are latched into the command register through the I/O ports on the rising edge of the WE signal.
Address Latch Enable(ALE)
The ALE input controls the activating path for address to the internal address registers. Addresses are latched on the rising edge of WE with ALE high.
Chip Enable(CE)
The CE input is the device selection control. When CE goes high during a read operation the device is returned to standby mode. However, when the device is in the busy state during program or erase, CE high is ignored and does not return the device to standby mode.
Write Enable(WE)
The WE input controls writing to the I/O port. Commands, address and data are latched on the rising edge of the WE pulse.
Read Enable(RE)
The RE input is the serial data-out control, and when active drives the data onto the I/O bus.
I/O Port : I/O 0 ~ I/O 7
The I/O pins are used to input command, address and data, and to output data during read operations. The I/O pins float to high-z when the chip is deselected or when the outputs are disabled.
Write Protect(WP)
The WP pin provides inadvertent write/erase protection during power transitions. The internal high voltage generator is reset when the WP pin is active low.
Ready/Busy(R/B)
The R/B output indicates the status of the device operation. When low, it indicates that a program, erase or random read operation is in process and returns to high state upon completion. It is an open drain output and does not float to high-z condition when the chip is deselected or when outputs are disabled.
Low Voltage Detect(LVD)
The LVD is used to detect the proper supply voltage electrically. By connecting this pin to Vss through a pull-down resister, it is possible to distinguish 3.3V product from 5V product. When 3.3V is applied as Vcc to pins 12 and 22, a ' High' level can be detected on the system side if the device is a 3.3V product, and ' Low'level for 5V product.
8
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
Symbol VIN VCC Rating -0.6 to + 4.6 -0.6 to + 4.6 -10 to +65 -20 to +65 C C Unit V
ABSOLUTE MAXIMUM RATINGS
Parameter Voltage on any pin relative to VSS Temperature Under Bias Storage Temperature
TBIAS TSTG
NOTE : 1. Minimum DC voltage is -0.3V on input/output pins. During transitions, this level may undershoot to -2.0V for periods <30ns. Maximum DC voltage on input/output pins is VCC+0.3V which, during transitions, may overshoot to VCC+2.0V for periods <20ns. 2. Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded. Functional operation should be restricted to the conditions as detailed in the operational sections of this data sheet. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
RECOMMENDED OPERATING CONDITIONS
(Voltage reference to GND, TA=0 to 55C)
Parameter Supply Voltage Supply Voltage Symbol VCC VSS Min 2.7 0 Typ. 3.3 0 Max 3.6 0 Unit V V
DC AND OPERATING CHARACTERISTICS(Recommended operating conditions otherwise noted.)
Parameter Operating Current Sequential Read Program Erase Stand-by Current(TTL) Stand-by Current(CMOS) Input Leakage Current Output Leakage Current Input High Voltage, All inputs Input Low Voltage, All inputs Output High Voltage Level Output Low Voltage Level Output Low Current(R/B) Symbol ICC1 ICC2 ICC3 ISB1 ISB2 ILI ILO VIH VIL VOH VOL IOL(R/B) IOH=-400A IOL=2.1mA VOL=0.4V Test Conditions tRC=50ns, CE=VIL, IOUT=0mA CE=VIH, WP=0V/VCC CE=VCC-0.2, WP=0V/VCC VIN=0 to 3.6V VOUT=0 to 3.6V Min 2.0 -0.3 2.4 8 Typ 10 10 10 10 10 Max 20 20 mA 20 1 50 10 10 VCC+0.3 0.8 0.4 mA V A Unit
9
K9S5608V0C/B K9S2808V0C/B
VALID BLOCK
Parameter
K9S6408V0C/B
SmartMediaTM
Symbol NVB Min 1,014 1,004 2013 Typ. 1,020 Max 1,024 1,024 2048 Blocks Unit
K9S6408V0X Valid Block Number K9S2808V0X K9S5608V0X
NOTE : 1. The K9SXX08V0X may include invalid blocks when first shipped. Additional invalid blocks may develop while being used. The number of valid blocks is presented with both cases of invalid blocks considered. Invalid blocks are defined as blocks that contain one or more bad bits. Do not erase or program factory-marked bad blocks. Refer to the attached technical notes for an appropriate management of invalid blocks. 2. Per the specification of the physical format version 1.2 by SSFDC forum, minimum 1,000 vaild blocks are guaranteed for each 16MB memory space. (Refer to the attached technical notes)
AC TEST CONDITION
(TA=0 to 55C, VCC=2.7V~3.6V unless otherwise noted)
Parameter Input Pulse Levels Input Rise and Fall Times Input and Output Timing Levels Output Load (3.0V +/-10%) Output Load (3.3V +/-10%) Value 0.4V to 2.4V 5ns 1.5V 1 TTL GATE and CL=50pF 1 TTL GATE and CL=100pF
CAPACITANCE(TA=25C, VCC=3.3V, f=1.0MHz)
Item Input/Output Capacitance Input Capacitance Symbol CI/O CIN Test Condition VIL=0V VIN=0V Min Max 10 10 Unit pF pF
NOTE : Capacitance is periodically sampled and not 100% tested.
MODE SELECTION
CLE H L H L L L X X X X X ALE L H L H L L X X X X(1) X CE L L L L L L L X X X H H X X X X X X X X X X WE RE H H H H H WP X X H H H X X H H L 0V/VCC(2) Data Input sequential Read & Data Output During Read(Busy) During Program(Busy) During Erase(Busy) Write Protect Stand-by Write Mode Read Mode Mode Command Input Address Input(3clock) Command Input Address Input(3clock)
NOTE : 1. X can be VIL or VIH. 2. WP should be biased to CMOS high or CMOS low for standby.
Program/Erase Characteristics
Parameter Program Time Number of Partial Program Cycles in the Same Page Block Erase Time Main Array Spare Array Symbol tPROG Nop tBERS Min Typ 200 2 Max 500 2 3 3 Unit s cycles cycles ms
10
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
Symbol tCLS tCLH tCS tCH tWP tALS tALH tDS tDH tWC tWH Min 0 10 0 10 25
(1)
AC Timing Characteristics for Command / Address / Data Input
Parameter CLE setup Time CLE Hold Time CE setup Time CE Hold Time WE Pulse Width ALE setup Time ALE Hold Time Data setup Time Data Hold Time Write Cycle Time WE High Hold Time Max Unit ns ns ns ns ns ns ns ns ns ns ns
0 10 20 10 50 15
NOTE : 1. If tCS is set less than 10ns, tWP must be minimum 35ns, otherwise, tWP may be minimum 25ns.
AC Characteristics for Operation
Parameter Data Transfer from Cell to Register CLE to RE Delay ALE to RE Delay Ready to RE Low RE Pulse Width WE High to Busy Read Cycle Time RE Access Time RE High to Output Hi-Z CE High to Output Hi-Z RE High Hold Time Output Hi-Z to RE Low Last RE High to Busy (at sequential read) CE High to Ready (in case of interception by CE at read) CE High Hold Time(at the last serial read) WE High to RE Low Device Resetting Time(Read/Program/Erase)
(2)
Symbol tR tCLR tAR tRR tRP tWB tRC tREA tRHZ tCHZ tREH tIR tRB tCRY tCEH tWHR tRST
Min 10 10 20 30 50 15 15 0 100 60 -
Max 10 100 35 30 20 100 50 +tr(R/B)(1) 5/10/500
(3)
Unit s ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns s
NOTE : 1. The time to Ready depends on the value of the pull-up resistor tied R/B pin. 2. To break the sequential read cycle, CE must be held high for longer time than tCEH. 3. If reset command(FFh) is written at Ready state, the device goes into Busy for maximum 5us.
11
K9S5608V0C/B K9S2808V0C/B
Invalid Block(s)
K9S6408V0C/B
SmartMediaTM
SmartMedia Technical Notes
Invalid blocks are defined as blocks that contain one or more invalid bits whose reliability is not guaranteed by Samsung. The information regarding the invalid block(s) is so called as the invalid block information. An invalid block(s) does not affect the performance of valid block(s) because it is isolated from the bit line and the common source line by a select transistor. The system design must be able to mask out the invalid block(s) via address mapping.
Identifying Invalid Block(s)
SSFDC Forum specifies the logical format and physical format to ensure compatibility of SmartMedia. Samsung pre-formats SmartMedia in the Forum-compliant format prior to shipping. The physical format standard by SSFDC Forum specifies that invalid block information is written at the 6th byte of spare area in invalid blocks with two or more "0" bits, while valid blocks are erased(FFh). Since the invalid block information is also erasable in most cases, it is impossible to recover the information once it has been erased. Therefore, the system must be able to recognize the invalid block(s) based on the original invalid block information and create the invalid block table via the following suggested flow chart(Figure 3). Any intentional erasure of the original invalid block information is prohibited.
Start
Set Block Address = 0
Increment Block Address
Create (or update) Invalid Block(s) Table
No
Check "FFh" ?
*
Yes No Last Block ?
Check "FFh" at the column address 517 of the first page in the block
Yes
End
Figure 3. Flow chart to create invalid block table.
12
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
SmartMedia Technical Notes (Continued)
Error in write or read operation
Over its life time, the additional invalid blocks may be developed during its use. Refer to the qualification report for the actual data.The following possible failure modes should be considered to implement a highly reliable system. In the case of status read failure after erase or program, block replacement should be done. Because program status failure during a page program does not affect the data of the other pages in the same block, block replacement can be executed with a page-sized buffer by finding an erased empty block and reprogramming the current target data and copying the rest data of the replaced block. To improve the efficiency of memory space, it is recommended that the read or verification failure due to single bit error be reclaimed by ECC without any block replacement. The said additional block failure rate does not include those reclaimed blocks.
Failure Mode Erase Failure Write Program Failure Single Bit Failure
Detection and Countermeasure sequence Status Read after Erase --> Block Replacement Status Read after Program --> Block Replacement Read back ( Verify after Program) --> Block Replacement or ECC Correction Verify ECC -> ECC Correction
Read
ECC
: Error Correcting Code --> Hamming Code etc. Example) 1bit correction & 2bit detection
Program Flow Chart
If ECC is used, this verification operation is not needed. Start Write 00h
Write 80h
Write Address
Write Address
Write Data
Wait for tR Time
Write 10h
Verify Data
No
*
Program Error
Read Status Register
Yes Program Completed
I/O 6 = 1 ? or R/B = 1 ? Yes No I/O 0 = 0 ?
No
*
*
Program Error
: If program operation results in an error, map out the block including the page in error and copy the target data to another block.
Yes
13
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
SmartMedia Technical Notes (Continued)
Erase Flow Chart
Start Write 60h Write Block Address Write D0h Read Status Register
Read Flow Chart
Start Write 00h Write Address Read Data ECC Generation
I/O 6 = 1 ? or R/B = 1 ? Yes No I/O 0 = 0 ? Yes Erase Completed
No
Reclaim the Error
No
Verify ECC Yes Page Read Completed
*
Erase Error
*
: If erase operation results in an error, map out the failing block and replace it with another block.
Block Replacement
1st (n-1)th nth (page)
{ {
Block A 2 an error occurs. Buffer memory of the controller. Block B 1
1st (n-1)th nth (page)
* Step1 When an error happens in the nth page of the Block ' during the program operation. A' * Step2 Copy the nth page data of the Block ' in the buffer memory to the nth page of another free block. (Block ' ) A' B' * Step3 Then, copy the data in the 1st ~ (n-1)th page of the Block ' to the same location of the Block ' . A' B' * Step4 Do not erase or program to Block ' by creating an ' A' invalid Block'table or using other appropriate scheme.

14
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
Pointer Operation of the SmartMedia
Samsung NAND Flash has three address pointer commands as a substitute for the two most significant column addresses. ' 00h' command sets the pointer to ' area(0~255byte), ' A' 01h'command sets the pointer to ' area(256~511byte), and ' B' 50h'command sets the pointer to ' area(512~527byte). With these commands, the starting column address can be set to any of a whole C' page(0~527byte). ' 00h'or ' 50h'is sustained until another address pointer command is inputted. ' 01h'command, however, is effective only for one operation. After any operation of Read, Program, Erase, Reset, Power_Up is executed once with ' 01h' command, the address pointer returns to ' area by itself. To program data starting from ' or ' area, ' A' A' C' 00h' or ' 50h' command must be inputted before ' 80h'command is written. A complete read operation prior to ' 80h'command is not necessary. To program data starting from ' area, ' B' 01h'command must be inputted right before ' 80h'command is written.
Destination of the pointer
Command 00h 01h 50h Pointer position 0 ~ 255 byte 256 ~ 511 byte 512 ~ 527 byte Area 1st half array(A) 2nd half array(B) spare array(C)
"A" area (00h plane) 256 Byte
"B" area (01h plane) 256 Byte
"C" area (50h plane) 16 Byte
"A"
"B"
"C" Internal Page Register
Pointer select commnad (00h, 01h, 50h)
Pointer
Figure 4. Block Diagram of Pointer Operation
(1) Command input sequence for programming ' area A'
The address pointer is set to ' area(0~255), and sustained A' Address / Data input 00h 80h 10h 00h 80h Address / Data input 10h
' ,' ,' area can be programmed. A' B' C' It depends on how many data are inputted.
' 00h'command can be omitted.
(2) Command input sequence for programming ' area B'
The address pointer is set to ' area(256~512), and will be reset to B' ' area after every program operation is executed. A' Address / Data input 01h 80h 10h 01h 80h Address / Data input 10h
' , ' area can be programmed. B' C' It depends on how many data are inputted.
' 01h'command must be rewritten before every program operation
(3) Command input sequence for programming ' area C'
The address pointer is set to ' area(512~527), and sustained C' Address / Data input 50h 80h 10h 50h 80h Address / Data input 10h
Only ' area can be programmed. C'
' 50h'command can be omitted.
15
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
System Interface Using CE don' t-care.
For an easier system interface, CE may be inactive during the data-loading or sequential read as shown below. The internal 528byte page registers are utilized as separate buffers for this operation and the system design gets more flexible. In addition, for voice or audio applications which use slow cycle time on the order of u-seconds, de-activating CE during the data-loading and reading would provide significant savings in power consumption.
Figure 5. Program Operation with CE don' t-care.
CLE
CE don' t-care
CE
WE ALE
I/O0~7
80h
Start Add.(3Cycle)
Data Input
Data Input
10h
(Min. 10ns)
tCS CE
(Max. 45ns)
tCH CE
tCEA
tREA tWP WE I/O0~7 out RE
Figure 6. Read Operation with CE don' t-care.
CLE
CE don' t-care Must be held low during tR.
CE
RE ALE R/B tR
WE
I/O0~7
00h
Start Add.(3Cycle)
Data output (Sequential)
16
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
Command Latch Cycle
CLE tCLS tCS CE tCLH tCH
tWP WE
tALS ALE tDS I/O0~7
tALH
tDH
Command
Address Latch Cycle
tCLS CLE
tCS CE
tWC
tWC
tWP WE tALS ALE tDS I/O0~7 tDH tWH tALH tALS
tWP tWH tALH tALS
tWP
tALH
tDS
tDH
tDS
tDH
A0~A7
A9~A16
A17~A24
A22: K9S6408V0X A23: K9S2808V0X A24: K9S5608V0X
17
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
Input Data Latch Cycle
tCLH CLE
tCH CE
tALS ALE
tWC
tWP WE tDS I/O0~7 tWH tDH
tWP
tDH
tWP tDH
tDS
tDS
DIN 0 DIN 1 DIN 511
Serial Access Cycle after Read(CLE=L, WE=H, ALE=L)
tREH RE tREA tRP
CE
tRC tCHZ
tRHZ tRHZ I/O0~7 tRR R/B Dout
tREA
tREA
Dout
Dout
NOTES : Transition is measured 200mV from steady state voltage with load. This parameter is sampled and not 100% tested.
18
K9S5608V0C/B K9S2808V0C/B
Status Read Cycle
K9S6408V0C/B
SmartMediaTM
tCLR CLE tCLS tCS CE tCH tWP WE tWHR RE tDS I/O0~7 70h tDH tIR tREA tRHZ Status Output tCEA tCHZ tCLH
READ1 OPERATION(READ ONE PAGE)
CLE tCEH CE tWC WE tWB tAR ALE tR RE tRR I/O0~7
00h or 01h A0 ~ A7 A9 ~ A16 A17 ~ A24 Dout N Dout N+1 Dout N+2 Dout N+3
tCHZ
tCRY
tRC
tRHZ
Dout 527
Column Address
Page(Row) Address Busy
tRB
R/B
A22: K9S6408V0X A23: K9S2808V0X A24: K9S5608V0X
19
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
READ1 OPERATION(INTERCEPTED BY CE)
CLE
CE
WE tWB tAR ALE tR RE tRR I/O0~7
00h or 01h
tCHZ
tRC
A0 ~ A7
A9 ~ A16
A17 ~ A24
Dout N
Dout N+1
Dout N+2
Dout N+3
Column Address
Page(Row) Address
A22: K9S6408V0X A23: K9S2808V0X A24: K9S5608V0X
R/B
Busy
READ2 OPERATION(READ ONE PAGE)
CLE
CE
WE tWB ALE
tR tAR tRR
RE
I/O0~7
50H
A0 ~ A7
A9 ~ A16 A17 ~ A24
Dout 511+M
Dout 511+M+1
Dout 527
R/B M Address
A22: K9S6408V0X A23: K9S2808V0X A24: K9S5608V0X
Selected Row
A0~A3 : Valid Address A4~A7 : Dont care 512 16 Start address M
20
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
SEQUENTIAL ROW READ OPERATION (Within a block especially for 64Mb-Cdie and 128Mb Bdie)
CLE
CE
WE
ALE
RE
A22: K9S6408V0X A23: K9S2808V0X A24: K9S5608V0X
I/O0~7
00h
A0 ~ A7 A9 ~ A16 A17 ~ A24
Dout N
Dout N+1
Dout N+2
Dout 527
Dout 0
Dout 1
Dout 2

70h
Dout 527
Busy
M+1
Ready R/B
M
Busy
N
Output
Output
PAGE PROGRAM OPERATION
CLE
CE tWC WE tWB ALE tPROG tWC tWC
RE
A22: K9S6408V0X A23: K9S2808V0X A24: K9S5608V0X
I/O0~7
80h
A0 ~ A7 A9 ~ A16 A17 ~ A24 Page(Row) Address
Sequential Data Column Input Command Address
Din Din Din 10h 527 N N+1 Program 1 up to 528 Byte Data Command Serial Input
I/O0
Read Status Command
21
R/B
I/O0=0 Successful Program I/O0=1 Error in Program
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
BLOCK ERASE OPERATION (ERASE ONE BLOCK)
CLE
CE tWC WE tWB ALE tBERS
RE
A22: K9S6408V0X A23: K9S2808V0X A24: K9S5608V0X
I/O0~7
60h
A9 ~ A16 A17 ~ A24 Page(Row) Address
DOh
70h
I/O 0
R/B
Auto Block Erase Setup Command Erase Command
Busy
Read Status Command
I/O0=0 Successful Erase I/O0=1 Error in Erase
22
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
MANUFACTURE & DEVICE ID READ OPERATION
tCLR CLE
CE
WE tAR ALE
RE tREA I/O 0 ~ 7
90h Read ID Command 00h Address. 1cycle 1st ECh Maker Code 2nd 75h Device Code 3rd A5 UniqueID Code
K9S6408V0X : E6h K9S2808V0X : 73h K9S5608V0X : 75h
NOTE : The 3rd byte of device IDs represents whether there is Unigue ID or not. If A5h is read out, that means that the Smart Media has the Unigue ID.
ID Definition Table 90 ID : Access command = 90H
READ ID (1) 1 Byte 2nd Byte 3rd Byte
st
Value ECh *75h A5h
Description Maker Code Device Code Unique1D code
NOTE : *Device Code : K9S6408V0X : E6h , K9S2808V0X : 73h , K9S5608V0X: 75h
23
K9S5608V0C/B K9S2808V0C/B
DEVICE OPERATION
PAGE READ
K9S6408V0C/B
SmartMediaTM
Upon initial device power up, the device defaults to Read1 mode. This operation is also initiated by writing 00h to the command register along with three address cycles. Once the command is latched, it does not need to be written for the following page read operation. Three types of operations are available : random read, sequential read and sequential row read. The random read mode is enabled when the page address is changed. The 528 bytes of data within the selected page are transferred to the data registers in less than 10s(tR). The system controller can detect the completion of this data transfer(tR) by monitoringing the output of R/B pin. Once the data in a page is loaded into the registers, they may be read out in 50ns cycle time by pulsing RE sequentially. High to low transitions of the RE clock output the data starting from the selected column address up to the last column address. After the data of the last column address is clocked out, the next page is automatically selected for sequential row read. Waiting 10s again allows reading the selected page. The sequential row read operation is terminated by bringing CE high. The way the Read1 and Read2 commands work is like a pointer set to either the main area or the spare area. The spare area of bytes 512 to 527 may be selectively accessed by writing the Read2 command. Addresses A0 to A3 set the starting address of the spare area while addresses A4 to A7 are ignored. Unless the operation is aborted, the page address is automatically incremented for sequential row read as in Read1 operation and spare sixteen bytes of each page may be sequentially read. The Read1 command(00h/01h) is needed to move the pointer back to the main area. Figures 7 through 10 show typical sequence and timings for each read operation.
Figure 7. Read1 Operation
CLE CE WE ALE tR R/B RE I/O0~7
00h Start Add.(3Cycle) A0 ~ A7 & A9 ~ A24 Data Output (Serial Access)
A22: K9S6408V0X A23: K9S2808V0X A24: K9S5608V0X
(00h Command) 1st half array 2st half array
(01h Command)* 1st half array 2st half array
Data Field
Spare Field
Data Field
Spare Field
* After data access on 2nd half array by 01h command, the start pointer is automatically moved to 1st half array (00h) at next cycle.
24
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
Figure 8. Read2 Operation
CLE CE WE ALE R/B RE I/O0~7
50h Start Add.(3Cycle) A0 ~ A3 & A9 ~ A24 (A4 ~ A7 : Dont Care)
A22: K9S6408V0X A23: K9S2808V0X A24: K9S5608V0X
1st half array 2nd half array
tR
Data Output(Serial Access) Spare Field
Data Field
Spare Field
Figure 9. Sequential Row Read1 Operation
R/B I/O0 ~ 7
00h 01h Start Add.(3Cycle) A0 ~ A7 & A9 ~ A24 (00h Command)
1st half array 2nd half array
tR
tR
tR
Data Output 1st
Data Output 2nd (528 Byte) (01h Command)
1st half array 2nd half array
Data Output Nth (528 Byte)
1st 2nd Nth
Block
1st 2nd Nth
Data Field
Spare Field
Data Field
Spare Field
The Sequential Read 1 and Read 2 operations are allowed only within a block and after the last page of a block is readout, the sequential read operation must be terminated by bringing CE high. When the page address moves onto the next block, read command and address must be given.
25
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
Figure 10. Sequential Row Read2 Operation
R/B I/O0~7 tR tR
tR
50h
Start Add.(3Cycle) A0 ~ A3 & A9 ~ A24 (A4 ~ A7 : Dont Care)
Data Output
A22: K9S6408V0X A23: K9S2808V0X A24: K9S5608V0X
Data Output 2nd (16Byte)
Data Output Nth (16Byte)
1st
1st Block Nth
Data Field
Spare Field
PAGE PROGRAM
The device is programmed basically on a page basis, however it does allow multiple partial page programing of a byte or consecutive bytes up to 528, in a single page program cycle. The number of consecutive partial page programming operation within the same page without an intervening erase operation has the limit by its density. (See the Table of Program/Erase Characteristics) It is advisable not to program more often than recommend. It might cause failures due to disturbance when it exceeds its limits. The failure mode could be that data "1" of the erased cell might be changed into data"0"of the programmed cell. The addressing may be done in any random order in a block. A page program cycle consists of a serial data loading period in which up to 528 bytes of data may be loaded into the page register, followed by a non-volatile programming period where the loaded data is programmed into the appropriate cell. Serial data loading can be started from the 2nd half array by moving pointer. About the pointer operation, please refer to the attached technical notes.The serial data loading period begins by inputting the Serial Data Input command(80h), followed by the three cycle address input and then serial data loading. The bytes other than those to be programmed do not need to be loaded.The Page Program confirm command(10h) initiates the programming process. Writing 10h alone without previously entering the serial data will not initiate the programming process. The internal write-controller automatically executes the algorithms and timings necessary for program and verify, thereby freeing the system controller for other tasks. Once the program process starts, the Read Status Register command may be entered, with RE and CE low, to read the status register. The system controller can detect the completion of a program cycle by monitoring the R/B output, or the Status bit(I/O 6) of the Status Register. Only the Read Status command and Reset command are valid while programming is in progress. When the Page Program is completed, the Write Status Bit(I/O 0) may be checked(Figure 11). The internal write verify detects only errors for "1"s that are not successfully programmed to "0"s. The command register remains in Read Status command mode until another valid command is written to the command register.
Figure 11. Program & Read Status Operation
tPROG R/B I/O0~7
80h
Address & Data Input A0 ~ A7 & A9 ~ A24 528 Byte Data
10h
70h
I/O0
Pass
A22: K9S6408V0X A23: K9S2808V0X A24: K9S5608V0X
Fail
26
K9S5608V0C/B K9S2808V0C/B
BLOCK ERASE
K9S6408V0C/B
SmartMediaTM
The Erase operation is done on a block(16K Byte) basis. Block address loading is accomplished in two cycles initiated by an Erase Setup command(60h). Only address A14 to (A22: K9S6408V0X, A23: K9S2808V0X, A24: K9S5608V0X) is valid while A9 to A13 is ignored. The Erase Confirm command(D0h) following the block address loading initiates the internal erasing process. This two-step sequence of setup followed by execution command ensures that memory contents are not accidentally erased due to external noise conditions. At the rising edge of WE after the erase confirm command input, the internal write controller handles erase and erase-verify. When the erase operation is completed, the Write Status Bit(I/O 0) may be checked. Figure 12 details the sequence.
Figure 12. Block Erase Operation
R/B I/O0~7 tBERS
60h
Address Input(2Cycle) Block Add. : A9 ~ A24
D0h
A22: K9S6408V0X A23: K9S2808V0X A24: K9S5608V0X
70h
I/O0
Pass
Fail
READ STATUS
The device contains a Status Register which may be read to find out whether program or erase operation is completed, and whether the program or erase operation is completed successfully. After writing 70h command to the command register, a read cycle outputs the content of the Status Register to the I/O pins on the falling edge of CE or RE, whichever occurs last. This two line control allows the system to poll the progress of each device in multiple memory connections even when R/B pins are common-wired. RE or CE does not need to be toggled for updated status. Refer to Table3 for specific Status Register definitions. The command register remains in Status Read mode until further commands are issued to it. Therefore, if the status register is read during a random read mode, a read command(00h or 50h) should be given before the sequential read cycle.
Read Status Register Definition
I/O # I/O 0 I/O 1 I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7 Device Operation Write Protect Reserved for Future Use Status Program / Erase Definition "0" : Successful Program / Erase "1" : Error in Program / Erase "0" "0" "0" "0" "0" "0" : Busy "0" : Protected "1" : Ready "1" : Not Protected
27
K9S5608V0C/B K9S2808V0C/B
READ ID
K9S6408V0C/B
SmartMediaTM
The device contains a product identification mode, initiated by writing 90h to the command register, followed by an address input of 00h. Three read cycles sequentially output the manufacture code(ECH), the device code (K9S6408V0X : E6h , K9S2808V0X : 73h , K9S5608V0X: 75h), the UniqueID code(A5h) respectively. The command register remains in Read ID mode until further commands are issued to it. Figure 13 shows the operation sequence.
Figure 13. Read ID Operation
tCLR CLE tCEA CE WE tAR ALE RE tWHR I/O0~7
90h 00h Address. 1cycle
tREA
ECh Maker code Device code 75h A5h UniqueID code
K9S6408V0X : E6h K9S2808V0X : 73h K9S5608V0X : 75h
RESET
The device offers a reset feature, executed by writing FFh to the command register. When the device is in Busy state during random read, program or erase mode, the reset operation will abort these operations. The contents of memory cells being altered are no longer valid, as the data will be partially programmed or erased. The command register is cleared to wait for the next command, and the Status Register is cleared to value C0h when WP is high. Refer to Table 4 for device status after reset operation. If the device is already in reset state a new reset command will not be accepted by the command register. The R/B pin transitions to low for tRST after the Reset command is written. Reset command is not necessary for normal operation. Refer to Figure 14 below.
Figure 14. RESET Operation
tRST R/B I/O0~7
FFh
Table 4. Device Status
After Power-up Operation Mode Read 1 After Reset Waiting for next command
28
K9S5608V0C/B K9S2808V0C/B
READY/BUSY
K9S6408V0C/B
SmartMediaTM
The device has a R/B output that provides a hardware method of indicating the completion of a page program, erase and random read operations. The R/B pin is normally high but transitions to low after program or erase command is written to the command register or random read is started after address loading. It returns to high when the internal controller has finished the operation. The pin is an open-drain driver thereby allowing two or more R/B outputs to be Or-tied. Because pull-up resistor value is related to tr(R/B) and current drain during busy(ibusy) , an appropriate value can be obtained with the following reference chart(Figure 15). Its value can be determined by the following guidance.
Rp VCC
ibusy
Ready Vcc R/B open drain output 0.8V Busy 2.0V
tf GND Device
tr
Figure 15. Rp vs tr ,tf & Rp vs ibusy
@ Vcc = 3.3V, Ta = 25C , CL = 100pF
3.3 381
tr,tf [s]
1.65
200n tr 100n
96 4.2
189
1.1 0.825
2m 1m
tf
4.2
4.2
4.2
1K
2K
3K Rp(ohm)
4K
Rp value guidance
Rp(min) = VCC(Max.) - VOL(Max.) IOL + IL = 3.2V 8mA + IL
where IL is the sum of the input currents of all devices tied to the R/B pin. Rp(max) is determined by maximum permissible limit of tr
29
Ibusy [A]
300n
Ibusy
290
3m
K9S5608V0C/B K9S2808V0C/B
K9S6408V0C/B
SmartMediaTM
Data Protection & Power up Sequence
The device is designed to offer protection from any involuntary program/erase during power-transitions. An internal voltage detector disables all functions whenever Vcc is below about 2V. WP pin provides hardware protection and is recommended to be kept at VIL during power-up and power-down as shown in Figure 16. The two step command sequence for program/erase provides additional software protection.
Figure 16. AC Waveforms for Power Transition
~ 2.5V
~ 2.5V
VCC High
WP
WE
1s
30
SmartMedia Dimensions
DIMENSIONS
22 PAD SOLID STATE FLOPPY DISK CARD (3.3V) SOLID STATE PRODUCT OUTLINE
SmartMediaTM
Unit:mm
37.00.1 5.00.2
0.150.05
Index Label Area 10.00.2 Write Protect Area Contact Area (+0.1mm package body surface) 33.00.2 45.00.1 27.5 22.1(Max)
4.5(Min)
0.5mm Chamfer 4.2(Min) (3.3V Card)
8.650 7.900 6.500
0.000
0 5.
1.50.1 27.0
0.760.08
2.140 TYP 0.400 TYP
12
12.700 11
10.160
7.620
5.080
2.540
0.000
22
LVD
I/O4
I/O5
I/O6
I/O7
GND
R/B
RE
CE
vcc vSS
vcc
CLE
I/O3
I/O2
I/O1 31
I/O0
0.000
ALE
vSS
WP
2.540
WE
5.080
6.500 7.900 8.650 1
10.160
12.700
7.620

▲Up To Search▲

Price & Availability of K9S2808V0B

	To Download K9S2808V0B Datasheet File
If you can't view the Datasheet, Please click here to try to view without PDF Reader .