| PART |
Description |
Maker |
| GSELDIRUH33PA13B20K |
ELDRS Test Report
|
International Rectifier
|
| TRIMMING-POTENTIOMETER |
SGS Test Report
|
Kingtronics International Company
|
| GET-BC-0004 |
Qualification Test Report on NE292
|
California Eastern Labs
|
| RT3070 |
USB 1T1R Test Report
|
Ralink
|
| TR0636E-20033 IT3D-300S-BGA IT3M-300S-BGA |
IT3D(M)-300S-BGA (57) Cross Sectioning TEST REPORT
|
Hirose Electric
|
| ADG417 ADG417BR ADG417BN DG419 |
LC2MOS Precision Mini-DIP Analog Switch
ECONOLINE: REC3-S_DRW(Z)/H4,H6 - Safety standards and approval: EN 60950 certified, rated for 250VAV (LVD test report)- Applied for Ul 1950 Component
LC2MOS, 5 V Precision Mini-DIP SPST Switch
|
AD[Analog Devices]
Analog Devices, Inc.
|
| 6249-12-0 6249-24-0 6249-48-0 6249-24-2 6249-12-2 |
Test Clip To Multi-Stacking Banana Plug Test Lead
|
Pomona Electronics
|
| BF995B BF995A BF995 |
ECONOLINE: RKZ - Safety standards and approvals: EN 60950 certified, rated for 250VAC (LVD test report)- Custom Solutions Available- 3kVDC & 4kVDC Isolation- UL94V-0 Package Material- Power Sharing on Output- Efficiency to 84%
N-Channel Dual Gate MOS-Fieldeffect Tetrode, Depletion Mode
From old datasheet system
N-Channel Dual Gate MOS-Fieldeffect Tetrode/ Depletion Mode
|
Vishay Intertechnology,Inc.
VISAY[Vishay Siliconix]
|
| 6171-0 6171-2 |
Test Companion Test Kit For Fluke 20 & 70 Series DMM’s
|
Pomona Electronics
|
| 0040.1061 0040.1062 0040.1141 0040.1142 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 0040.1031 0040.1032 0040.1033 0040.1034 0040.1035 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 0040.1211 0040.1212 0040.1213 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
