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28229-PCN-001-A - Test and Ship Location Change for CX28224/5/9 Inverse Multiplexing Single-Chip SDSL/HDSL Transceiver

28229-PCN-001-A_7597585.PDF Datasheet


 Full text search : Test and Ship Location Change for CX28224/5/9 Inverse Multiplexing Single-Chip SDSL/HDSL Transceiver


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PART Description Maker
F072011 Powder cores manufacturing location and 12NC change
Ferroxcube International Holding B.V.
1N974B 1N963B 1N965B 1N962B 1N970B 1N960B 1N968D 1 0.5W, silicon zener diode. Zener voltage 56V. Test current 2.2mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 30V. Test current 4.2mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 62V. Test current 2.0mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 120V. Test current 1.0mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 120V. Test current 1.0mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 75V. Test current 1.7mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 22V. Test current 5.6mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 39V. Test current 3.2mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 68V. Test current 1.8mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 160V. Test current 0.80mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 150V. Test current 0.85mA. -20% tolerance.
0.5W SILICON ZENER DIODES
Low Current Operation at 250??A???Low Reverse Leakage,Low Noise Zener Diode(250??A?・¥?????μ?μ?????°????????????μ?μ?????????a?£°???é???o3?o???????) 50μA低电流操作,低反向漏,低噪声稳压二极管(250μA工作电流,小反向漏电流,低噪声,齐纳二极管)
PC 4/ 5-ST-7,62 .5W硅稳压二极管
Low Current Operation at 250?录A茂录?Low Reverse Leakage,Low Noise Zener Diode(250?录A氓路楼盲陆?莽?碌忙碌?茫??氓掳?氓??氓??忙录?莽?碌忙碌?茫??盲陆?氓?陋氓拢掳茫??茅陆?莽潞鲁盲潞?忙??莽庐隆)
0.5W, silicon zener diode. Zener voltage 180V. Test current 0.68mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 180V. Test current 0.68mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 200V. Test current 0.65mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 150V. Test current 0.85mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 68V. Test current 1.8mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 22V. Test current 5.6mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 7.5V. Test current 16.5mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 130V. Test current 0.95mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 51V. Test current 2.5mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 62V. Test current 2.0mA. -10% tolerance.
0.5W, silicon zener diode. Zener voltage 56V. Test current 2.2mA. -20% tolerance.
0.5W, silicon zener diode. Zener voltage 47V. Test current 2.7mA. -10% tolerance.
JGD[Jinan Gude Electronic Device]
济南固锝电子器件有限公司
Jinan Gude Electronic Device Co., Ltd.
Semtech, Corp.
娴???洪??靛??ㄤ欢??????
Jinan Gude Electronic D...
5523 3781 Connector assemblies, Hooks Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
Minigrabber Test Clip Patch Cord
Pomona Electronics
0040.1031 0040.1032 0040.1033 0040.1034 0040.1035 TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
Schurter Inc.
0040.1012 0040.1013 0040.1015 0040.1011 0040.1014 TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
Schurter Inc.
EM91886 CMOS SINGLE SHIP TELEPHONE WITH LOCK, SPEAKERPHONE, HOLD MELODY AND LCD INTERFACE
ELAN Microelctronics Corp .
NTE1V300 NTE524V48 NTE524V13 NTE524V15 NTEV480 NTE Metal oxide varistor. Case diameter 23 mm. Nominal varistor voltage 390 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 150 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 23 mm. Nominal varistor voltage 270 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 216 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 240 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 470 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 23 mm. Nominal varistor voltage 750 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 18 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 24 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 39 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 56 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 68 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 33 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 27 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 22 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 270 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 470 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 430 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 390 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 240 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 216 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 171 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 56 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 120 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 150 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 100 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 82 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 68 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 47 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 33 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 39 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 27 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 24 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 22 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 8.5 mm. Nominal varistor voltage 18 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 47 V @ 1mA DC test current.
Metal Oxide Varistors (MOV) 金属氧化物压敏电阻(MOV)的
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 750 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 100 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 23 mm. Nominal varistor voltage 470 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 23 mm. Nominal varistor voltage 240 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 23 mm. Nominal varistor voltage 216 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 171 V @ 1mA DC test current.
Metal oxide varistor. Case diameter 23 mm. Nominal varistor voltage 430 V @ 1mA DC test current.
NTE[NTE Electronics]
NTE Electronics, Inc.
1300370011 130037-0011 SD-130037-006 DND8500-02 DeviceNet Micro-Change (M12), 8 Port, Micro-Change 5 Poles, Male, 2.0m (6.56 )
MOLEX Connector
Molex Electronics Ltd.
C10447 ~20° medium beam with 1.5 mm high location pins.
Ledil, Inc.
C10429 ~40° wide beam with 1.5 mm high location pins.
Ledil, Inc.
TS1100-200-EG6 TS1100-100-EG6 TS1100-50-EG6 TS1103    This change is considered a minor change which does not affect form, fit, function, quality, or reliability.
Silicon Laboratories
SI3402-B-GM SI3402-C-GM    This change is considered a minor change which does not affect form, fit, function, quality, or reliability.
Silicon Laboratories
 
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28229-PCN-001-A samsung 28229-PCN-001-A display 28229-PCN-001-A ethernet transceiver 28229-PCN-001-A Application 28229-PCN-001-A stock
 

 

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