| PART |
Description |
Maker |
| M567 |
CR-15 Package Handling and Mounting Procedure
|
M/A-COM Technology Solutions, Inc.
|
| 4400-094 4400-094LF |
Electrical Testing per Tusonix standard test plans and Mil-Std-202 Test Methods
|
List of Unclassifed Manufacturers
|
| 5523 3781 |
Connector assemblies, Hooks Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
Minigrabber Test Clip Patch Cord
|
Pomona Electronics
|
| 0040.1061 0040.1062 0040.1141 0040.1142 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 0040.1012 0040.1013 0040.1015 0040.1011 0040.1014 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| C4000-VOIP C4000-IPTV C4000-VOIP-UNISTIM C4000-VOI |
T-BERD㈢/MTS-4000Multiple Services Test Platform
T-BERD?/MTS-4000Multiple Services Test Platform
T-BERD垄莽/MTS-4000Multiple Services Test Platform
|
JDS Uniphase Corporation
|
| A701 |
A701: Test slide, various cancers plus corresponding normal
A701: Test slide various cancers plus corresponding normal
A701: Test slide, various cancers plus corresponding normal
|
List of Unclassifed Manufacturers
Electronic Theatre Controls, Inc.
ETC[ETC]
|
| 32-536-11 44-536-11 |
ZIF PLCC TEST SOCKET 32PIN GOLD PLCC32, IC SOCKET
ZIF PLCC TEST SOCKET 44 PIN GOLD
|
Aries Electronics, Inc.
ARIES ELECTRONICS INC
|
| IDT5V991A-2JG IDT5V991A-2JI IDT5V991A-5J IDT5V991A |
3.3V PROGRAMMABLE SKEW PLL CLOCK DRIVER TURBOCLOCK 5V SERIES, PLL BASED CLOCK DRIVER, 8 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), PQCC32
Scan Test Devices With 18-Bit Inverting Bus Transceivers 56-SSOP -40 to 85
Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85
From old datasheet system
|
Integrated Device Technology, Inc.
IDT[Integrated Device Technology]
|
| 44242-0001 44242-0002 44242-0003 44242-0004 44242- |
Micro-Fit 3.0垄芒 Test Plugs Won隆炉t Damage Mating Contact
Micro-Fit 3.0 Test Plugs Won’t Damage Mating Contact
|
Molex Electronics Ltd.
|
| MD9765ASZ-0 |
Electrical Characteristics Test Condition (Vs= 3 . 0 V, RL= 2 . 2 k ohm, Ta=20隆?C, RH=65%)
Electrical Characteristics Test Condition (Vs= 3 . 0 V, RL= 2 . 2 k ohm, Ta=20°C, RH=65%)
|
Knowles Electronics
|
| MB3015USB-4 |
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20°C, RH=65%)
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20隆?C, RH=65%)
|
Knowles Electronics
|
