PART |
Description |
Maker |
6249-12-0 6249-24-0 6249-48-0 6249-24-2 6249-12-2 |
Test Clip To Multi-Stacking Banana Plug Test Lead
|
Pomona Electronics
|
4400-094 4400-094LF |
Electrical Testing per Tusonix standard test plans and Mil-Std-202 Test Methods
|
List of Unclassifed Manufacturers
|
6171-0 6171-2 |
Test Companion Test Kit For Fluke 20 & 70 Series DMM’s
|
Pomona Electronics
|
0040.1031 0040.1032 0040.1033 0040.1034 0040.1035 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
0040.1012 0040.1013 0040.1015 0040.1011 0040.1014 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
IDT5V991A-2JG IDT5V991A-2JI IDT5V991A-5J IDT5V991A |
3.3V PROGRAMMABLE SKEW PLL CLOCK DRIVER TURBOCLOCK 5V SERIES, PLL BASED CLOCK DRIVER, 8 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), PQCC32 Scan Test Devices With 18-Bit Inverting Bus Transceivers 56-SSOP -40 to 85 Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85 From old datasheet system
|
Integrated Device Technology, Inc. IDT[Integrated Device Technology]
|
6470 |
Test Probe; Leaded Process Compatible:Yes; Peak Reflow Compatible (260 C):Yes RoHS Compliant: Yes INTERCONNECTION DEVICE SMD Microtip Test Probe Set
|
Pomona Electronics
|
V23815-S1306-M931 V23814-S1306-M931 |
Test Board PAROLI?Receiver AC/DC Test Board PAROLI Transmitter AC/DC
|
Infineon
|
16043A 16043B |
16043A 3-Terminal SMD Test Fixture 16043B 3-Terminal SMD Test Fixture
|
Agilent (Hewlett-Packard)
|
SCANPSC110FSC SCANPSC110F SCANPSC110FSCX |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE 1149.1 Support) SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) From old datasheet system
|
FAIRCHILD[Fairchild Semiconductor]
|