| PART |
Description |
Maker |
| 0040.1012 0040.1013 0040.1015 0040.1011 0040.1014 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| HCTS393MS HCTS393KMSR HCTS393K HCTS393HMSR HCTS393 |
Radiation Hardened Dual 4-Input NOR Gate
Test Bus Controllers 68-CPGA -55 to 125
Test Bus Controllers 68-CFP -55 to 125
Radiation Hardened Octal D-Type Flip-Flop/ Three-State/ Positive Edge Triggered
Radiation Hardened Dual 4-Stage Binary Counter
From old datasheet system
|
INTERSIL[Intersil Corporation]
|
| 4082F |
Flash Memory Cell Parametric Test System
|
Keysight Technologies
|
| L4411A |
Leading the Industry in High-Performance System Test
|
Agilent(Hewlett-Packard)
|
| US-TUVR-4428 |
IEC SYSTEM FOR MUTUAL RECOGNITION OF TEST CERTIFICATES FOR ELECTRICAL...
|
SL Power Electronics
|
| DK-14753 |
IEC SYSTEM FOR MUTUAL RECOGNITION OF TEST CERTIFICATES FOR ELECTRICAL EQUIPMENT (IECEE) CB SCHEME
|
SL Power Electronics
|
| 2SC941 2SC941-O 2SC941-R 2SC941TM 2SC941-Y 2SC942 |
TRANSISTOR SILICON NPN EPIITAXIAL TYPE 晶体管型硅npn型EPIITAXIAL
SMA MALE TO TNC MALE; 18GHz PRECISION TEST CABLE ASSEMBLY; WIDEBAND COVERAGE DC - 18 GHZ TEST CABLES. FLEXIBLE FOR EASY CONNECTION AND BEND RADIUS
NPN EPITAXIAL TYPE (HIGH/ AM/ AM HIGH FREQUENCY AMPLIFIER CONVERTER APPLICATIONS)
NPN EPITAXIAL TYPE (HIGH, AM, AM HIGH FREQUENCY AMPLIFIER CONVERTER APPLICATIONS)
From old datasheet system
|
Toshiba, Corp.
Toshiba Corporation
TOSHIBA[Toshiba Semiconductor]
|
| AD7226 AD7226BQ AD7226KN AD7226KP AD7226KR AD7226T |
-0.3, 17V; 500mW; LC2MOS quad 8-bit D/A converter. For process contol, automatic test equipment and calibration of large system parameters
|
AD[Analog Devices]
|
| 2SC982 2SC982TM E001082 |
NPN EPITAXIAL TYPE (PRINTER DRIVE/ CORE DRIVER AND LED DRIVE/ LOW FREQUENCY AMPLIFIER APPLICATIONS)
SMA MALE TO TNC MALE; 18GHz PRECISION TEST CABLE ASSEMBLY; 36 INCHES LONG. WIDEBAND COVERAGE DC - 18 GHZ TEST CABLES. FLEXIBLE FOR EASY CONNECTION
NPN EPITAXIAL TYPE (PRINTER DRIVE, CORE DRIVER AND LED DRIVE, LOW FREQUENCY AMPLIFIER APPLICATIONS)
From old datasheet system
|
Toshiba Corporation
TOSHIBA[Toshiba Semiconductor]
|
| NTE5296A NTE5240A NTE5241A NTE5242A NTE5243A NTE52 |
50 watt zener diode, -5% tolerance. Nominal zener voltage Vz = 52.0V. Zener test current Izt = 240mA.
50 watt zener diode, -5% tolerance. Nominal zener voltage Vz = 33.0V. Zener test current Izt = 380mA.
50 watt zener diode, -5% tolerance. Nominal zener voltage Vz = 180.0V. Zener test current Izt = 68mA.
50 Watt Zener Diodes ±5% Tolerance
50 Watt Zener Diodes 5% Tolerance
50 WATT ZENER DIODES 【5% TOLERANCE
Low Current Operation at 250??A???Low Reverse Leakage,Low Noise Zener Diode(250??A?・￥?????μ?μ?????°????????????μ?μ?????????a?￡°???é???o3?o???????) 50μA低电流操作，低反向漏，低噪声稳压二极管（250μA工作电流，小反向漏电流，低噪声，齐纳二极管）
50 watt zener diode, -5% tolerance. Nominal zener voltage Vz = 13.0V. Zener test current Izt = 960mA.
50 watt zener diode, -5% tolerance. Nominal zener voltage Vz = 43.0V. Zener test current Izt = 290mA.
|
NTE[NTE Electronics]
Fujitsu, Ltd.
NTE Electronics, Inc.
|
| 5951A |
Test Probe Set; Connector Type A:Replaceable-Tip Probe (1 Black/1 Red); Connector Type B:Right-Angle Banana Plug; Cable Length:4ft; Current Rating:5A; Features:2 Stainless Steel Sharp Replaceable Probe Tips RoHS Compliant: NA INTERCONNECTION DEVICE
Test Probe Set Replaceable Tip
|
Pomona Electronics
|
