| PART |
Description |
Maker |
| GET-30704 |
Qualification Test Results on Si MMIC
|
CEL[California Eastern Labs]
|
| GET-30593 |
Qualification Test Report on NE681XX
|
California Eastern Labs
|
| TQ8223 |
Device Qualification
|
TriQuint Semiconductor
|
| SGA-8343X |
Reliability Qualification Report 可靠性鉴定报
|
STANFORD[Stanford Microdevices]
|
| AT25F512A |
SPI EEPROM PRODUCT QUALIFICATION
|
ATMEL Corporation
|
| SRF-1016Z SRF-2016Z SRQ-2116Z |
Reliability Qualification Report 可靠性鉴定报
|
Electronic Theatre Controls, Inc.
Stanford Microdevices
|
| KDB15N50 |
Low Gate Charge Qg results in Simple Drive Requirement Reduced rDS(ON)
|
TY Semiconductor Co., L...
|
| 4400-094 4400-094LF |
Electrical Testing per Tusonix standard test plans and Mil-Std-202 Test Methods
|
List of Unclassifed Manufacturers
|
| 0040.1061 0040.1062 0040.1141 0040.1142 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 0040.1022 0040.1023 0040.1021 40.1024-ND 0040.1151 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
| AT17LV65 |
65/128/256/512K-bit and 1/2/4M-bit FPGA Configurator EEPROM (3.3V and 5V). Obtain the qualification
|
Atmel Corp
|
