|
|
 |
Micron Technology, Inc.
|
Part No. |
MT18LD472AG MT9LD272AG
|
OCR Text |
...st-page-mode cycle. the primary advan- tage of edo is the availability of data-out even after cas# goes back high. edo provides for cas# precharge time ( t cp) to occur without the output data going invalid. this elimination of cas# output ... |
Description |
4Meg x 72 Nonbuffered DRAM DIMMs(4M x 72无缓冲动态RAM双列直插存储器模 2Meg x 72 Nonbuffered DRAM DIMMs(2M x 72无缓冲动态RAM双列直插存储器模 2Meg × 72 Nonbuffered内存插槽00万72无缓冲动态RAM的双列直插存储器模块
|
File Size |
416.63K /
30 Page |
View
it Online |
Download Datasheet
|
|
|
 |
Micron Technology, Inc.
|
Part No. |
MT4LDT464AG MT4LDT264AG MT4LDT164AG
|
OCR Text |
...st-page-mode cycle. the primary advan- tage of edo is the availability of data-out even after cas# goes back high. edo provides for cas# precharge time ( t cp) to occur without the output data going invalid. this elimination of cas# output ... |
Description |
4 Meg x 64 Nonbuffered DRAM DIMMs(4 M x 64无缓冲动态RAM双列直插存储器模 1 Meg x 64 Nonbuffered DRAM DIMMs(1M x 64无缓冲动态RAM双列直插存储器模 1梅格× 64 Nonbuffered内存插槽00万64无缓冲动态RAM的双列直插存储器模块 2 Meg x 64 Nonbuffered DRAM DIMMs(2M x 64无缓冲动态RAM双列直插存储器模 2梅格× 64 Nonbuffered内存插槽00万64无缓冲动态RAM的双列直插存储器模块
|
File Size |
446.53K /
31 Page |
View
it Online |
Download Datasheet
|
|
|
 |
Micron Technology, Inc.
|
Part No. |
MT9LD272A
|
OCR Text |
...st-page-mode cycle. the primary advan- tage of edo is the availability of data-out even after cas# goes back high. edo provides for cas# precharge time ( t cp) to occur without the output data going invalid. this elimination of cas# output ... |
Description |
2, 4 MEG x 72 NONBUFFERED DRAM DIMMs
|
File Size |
423.00K /
30 Page |
View
it Online |
Download Datasheet
|
|
|
 |
Fairchild Semiconductor Corporation
|
Part No. |
SCANPSC110FSC
|
OCR Text |
...idrop test bus environment. the advan- tage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. each scanp... |
Description |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)
|
File Size |
276.96K /
25 Page |
View
it Online |
Download Datasheet
|
|
|
 |
Samsung Electronic
|
Part No. |
K9F3208W0A
|
OCR Text |
...rite-intensive systems can take advan- tage of the k9f3208w0a extended reliability of one million program/erase cycles by providing either ecc(error correction code) or real time mapping-out algorithm. these algorithms have been implemente... |
Description |
4M x 8Bit NAND Flash Memory Data Sheet
|
File Size |
429.91K /
23 Page |
View
it Online |
Download Datasheet
|
|
|
 |
ST Microelectronics
|
Part No. |
L6386D013TR
|
OCR Text |
...al bootstrap driver gives great advan- tages: the external fast recovery diode can be avoided (it usually has great leakage current). this structure can work only if v out is close to gnd (or lower) and in the meanwhile the lvg is on. the... |
Description |
HIGH-VOLTAGE HIGH AND LOW SIDE DRIVER
|
File Size |
150.73K /
10 Page |
View
it Online |
Download Datasheet
|
|

Price and Availability
|