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Samsung Electronic
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| Part No. |
S6B0086X DS_S6B0086_R00
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| OCR Text |
...s of semiconductor devices when irradiated with light. Consequently, the users of the packages which may expose chips to external light such as COB, COG, TCP and COF must consider effective methods to block out light from reaching the IC on... |
| Description |
80CH Common/Segment Driver for Dot Matrix LCD
From old datasheet system
Mobile DDI
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| File Size |
195.14K /
38 Page |
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it Online |
Download Datasheet
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IRF[International Rectifier]
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| Part No. |
IRH7450SE
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| OCR Text |
...radiation limits of the devices irradiated to 1 x 105 Rads (Si) are identical and are presented in Table 1. The values in Table 1 will be met for either of the two low dose rate test circuits that are used. Both pre- and post-radiation perf... |
| Description |
TRANSISTOR N-CHANNEL(BVdss=500V, Rds(on)=0.51ohm, Id=11A)
TRANSISTOR N-CHANNEL(BVdss=500V Rds(on)=0.51ohm Id=11A)
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| File Size |
99.29K /
4 Page |
View
it Online |
Download Datasheet |
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Samsung Electronic
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| Part No. |
S6B0107B DS_S6B0107_R00
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| OCR Text |
...s of semiconductor devices when irradiated with light. Consequently, the users of the packages which may expose chips to external light such as COB, COG, TCP and COF must consider effective methods to block out light from reaching the IC on... |
| Description |
64CH Common Driver for Dot Matrix LCD
From old datasheet system
Mobile DDI
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| File Size |
113.73K /
27 Page |
View
it Online |
Download Datasheet |
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IRF[International Rectifier]
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| Part No. |
IRHNA8160 IRHNA7160
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| OCR Text |
...radiation limits of the devices irradiated to 1 x 105 Rads (Si) are identical and are presented in Table 1, column 1, IRHNA7160. The values in Table 1 will be met for either of the two low dose rate test circuits that are used. Both pre- an... |
| Description |
TRANSISTOR N-CHANNEL
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| File Size |
128.72K /
4 Page |
View
it Online |
Download Datasheet |
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