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				NXP Semiconductors PHILIPS[Philips Semiconductors]
Part No.	74F273A 74F273AD 74F273AN 74F273A_2
OCR Text	... operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description	From old datasheet system Octal D flip-flop
File Size	80.04K / 10 Page	View it Online	Download Datasheet

				PHILIPS[Philips Semiconductors] NXP Semiconductors
Part No.	74F27 I74F27D I74F27N N74F27D N74F27N 74F27_2
OCR Text	... operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description	From old datasheet system Triple 3-input NOR gate
File Size	70.15K / 8 Page	View it Online	Download Datasheet

				PHILIPS[Philips Semiconductors] NXP Semiconductors
Part No.	74F367 N74F367D N74F367N N74F365D N74F365N 74F368 74F365 74F366 NXPSEMICONDUCTORS-N74F365N
OCR Text	... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description	Buffers/drivers
File Size	94.71K / 10 Page	View it Online	Download Datasheet

				NXP Semiconductors PHILIPS[Philips Semiconductors]
Part No.	74F521 N74F521D N74F521N 74F521_2
OCR Text	... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description	From old datasheet system 8-bit identity comparator
File Size	79.48K / 8 Page	View it Online	Download Datasheet

				NXP Semiconductors PHILIPS[Philips Semiconductors]
Part No.	74F543 74F543DB N74F543D N74F543N 74F544 N74F544N N74F544D 74F543_544_2
OCR Text	... operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description	Octal registered transceiver, non-inverting 3-State From old datasheet system
File Size	119.41K / 16 Page	View it Online	Download Datasheet

				HOLTEK[Holtek Semiconductor Inc]
Part No.	HT9315 HT9315A HT9315AL HT9315B HT9315BL HT9315C HT9315CL HT9315D HT9315DL
OCR Text	...pecification is not implied and prolonged exposure to extreme conditions may affect device reliability. Rev. 1.20 4 October 1, 2002 HT9315 Series Electrical Characteristics Symbol VDD IDD Parameter Operating Voltage Operating ...
Description	15-Memory Tone/Pulse Dialer
File Size	301.50K / 27 Page	View it Online	Download Datasheet

				Integrated Circuit Syst... ICST[Integrated Circuit Systems]
Part No.	ICS650-05 ICS650R-05 ICS650R-05T
OCR Text	...permanent damage to the device. prolonged exposure to levels above the operating limits but below the Absolute Maximums may affect device reliability. External Components A minimum number of external components are required for proper o...
Description	HDTV Clock Synthesizer
File Size	58.81K / 4 Page	View it Online	Download Datasheet

				Integrated Circuit Syst... ICST[Integrated Circuit Systems]
Part No.	ICS650-12 ICS650R-12 ICS650R-12T ICS650R-B12
OCR Text	...permanent damage to the device. prolonged exposure to levels above the operating limits but below the Absolute Maximums may affect device reliability. External Components A minimum number of external components are required for proper o...
Description	MPEG Clock Synthesizer 的MPEG时钟合成
File Size	66.61K / 4 Page	View it Online	Download Datasheet

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