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MC101 BC857A M3851 7N60C PIC18F25 BC857A TS19370 TS19370
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For prolonged Found Datasheets File :: 3144    Search Time::3.61ms    
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    ICS601-01 ICS601G-01 ICS601G-01T ICS601M-01 ICS601M-01I ICS601M-01IT ICS601M-01T

ICST[Integrated Circuit Systems]
Part No. ICS601-01 ICS601G-01 ICS601G-01T ICS601M-01 ICS601M-01I ICS601M-01IT ICS601M-01T
OCR Text ...permanent damage to the device. prolonged exposure to levels above the operating limits but below the Absolute Maximums may affect device reliability. 2. The phase relationship between input and output can change at power up. For a fixed ph...
Description Low Phase Noise Clock Multiplier 低相位噪声时钟乘法器
5015 RR 24#16 PIN RECP
5015 RR 4#8 SKT RECP
HFBR2412THPFIBERRECEIVER

File Size 87.80K  /  5 Page

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    MK2745-21 MK2745-21S MK2745-21STR

Integrated Circuit Syst...
ICST[Integrated Circuit Systems]
Part No. MK2745-21 MK2745-21S MK2745-21STR
OCR Text ...permanent damage to the device. prolonged exposure to levels above the operating limits but below the Absolute Maximums may affect device reliability. 2. With Processor clock at 50MHz, and ACLK at 16.93MHz. External Components The MK274...
Description DVD/MPEG Clock Source

File Size 60.35K  /  4 Page

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    MK2745-24 MK2745-24S MK2745-24STR

ICST[Integrated Circuit Systems]
Part No. MK2745-24 MK2745-24S MK2745-24STR
OCR Text ...permanent damage to the device. prolonged exposure to levels above the operating limits but below the Absolute Maximums may affect device reliability. 2. With VDD=3.3V, processor clock at 60MHz, and ACLK at 12.288MHz. External Components...
Description DVD/MPEG Clock Source

File Size 62.61K  /  4 Page

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    MK74CB115 MK74CB115R MK74CB115RTR

Integrated Circuit Syst...
ICST[Integrated Circuit Systems]
Part No. MK74CB115 MK74CB115R MK74CB115RTR
OCR Text ...permanent damage to the device. prolonged exposure to levels above the operating limits but below the Absolute Maximums may affect device reliability. 2. Between any two outputs, with equal loading. 3. At VDD = 3.3 V, 70C, series terminatio...
Description 1 to 16 Buffalo?Clock Driver
1 to 16 Buffalo⑩ Clock Driver
1 to 16 Buffalo Clock Driver
1 to 16 BuffaloClock Driver

File Size 75.31K  /  5 Page

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    MK74CB163 MK74CB163R MK74CB163RTR MK74CBB163R MK74CBB163RTR

Integrated Circuit Syst...
ICST[Integrated Circuit Systems]
Part No. MK74CB163 MK74CB163R MK74CB163RTR MK74CBB163R MK74CBB163RTR
OCR Text ...permanent damage to the device. prolonged exposure to levels above the operating limits but below the Absolute Maximums may affect device reliability. 2. Between any two outputs, with equal loading, measured at VDD/2. The maximum skew betwe...
Description 1 to 16 PECL to CMOS Buffalo?Clock Driver
1 to 16 PECL to CMOS Buffalo⑩ Clock Driver
1 to 16 PECL to CMOS Buffalo Clock Driver
1 to 16 PECL to CMOS BuffaloClock Driver

File Size 75.99K  /  5 Page

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    MK74CB214 MK74CB214R MK74CB214RTR

Integrated Circuit Syst...
ICST[Integrated Circuit Systems]
Part No. MK74CB214 MK74CB214R MK74CB214RTR
OCR Text ...permanent damage to the device. prolonged exposure to levels above the operating limits but below the Absolute Maximums may affect device reliability. 2. Between any two A outputs, or any two B outputs, with equal loading. 3. Between any cl...
Description Dual 1 to 7 Buffalo?Clock Driver
Dual 1 to 7 Buffalo⑩ Clock Driver
Dual 1 to 7 Buffalo Clock Driver
Dual 1 to 7 BuffaloClock Driver

File Size 48.41K  /  4 Page

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    MK74CB217 MK74CB217R MK74CB217RTR

Integrated Circuit Syst...
ICST[Integrated Circuit Systems]
Part No. MK74CB217 MK74CB217R MK74CB217RTR
OCR Text ...permanent damage to the device. prolonged exposure to levels above the operating limits but below the Absolute Maximums may affect device reliability. 2. Between any two A outputs, or any two B outputs, with equal loading. 3. Between any cl...
Description Dual 1 to 8 Buffalo?/a> Clock Driver
Dual 1 to 8 Buffalo⑩ Clock Driver
Dual 1 to 8 Buffalo Clock Driver
Dual 1 to 8 BuffaloClock Driver

File Size 75.53K  /  5 Page

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    MK74CB218 MK74CB218R MK74CB218RTR

ICST[Integrated Circuit Systems]
Part No. MK74CB218 MK74CB218R MK74CB218RTR
OCR Text ...permanent damage to the device. prolonged exposure to levels above the operating limits but below the Absolute Maximums may affect device reliability. 2. Between any two A outputs, or any two B outputs, with equal loading. 3. Between any cl...
Description Dual 1 to 8 BuffaloClock Driver
Dual 1 to 8 Buffalo Clock Driver
Dual 1 to 8 Buffalo⑩ Clock Driver

File Size 77.40K  /  5 Page

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    MK74CB44 MK74CB44R MK74CB44RTR

ICST[Integrated Circuit Systems]
Part No. MK74CB44 MK74CB44R MK74CB44RTR
OCR Text ...permanent damage to the device. prolonged exposure to levels above the operating limits but below the Absolute Maximums may affect device reliability. 2. Within any bank of four outputs, with equal loading. 3. Between any two banks of four ...
Description Quad 1 to 4 BuffaloClock Driver
Quad 1 to 4 Buffalo⑩ Clock Driver
Quad 1 to 4 Buffalo Clock Driver
Quad 1 to 4 Buffalo?/a> Clock Driver

File Size 73.09K  /  5 Page

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    74F109 I74F109D I74F109N N74F109D N74F109N 74F109_2

NXP Semiconductors N.V.
PHILIPS[Philips Semiconductors]
Part No. 74F109 I74F109D I74F109N N74F109D N74F109N 74F109_2
OCR Text ... operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be perfor...
Description Positive J-K positive edge-triggered flip-flops F/FAST SERIES, DUAL POSITIVE EDGE TRIGGERED J-KBAR FLIP-FLOP, COMPLEMENTARY OUTPUT, PDIP16
From old datasheet system
Positive J-Knot positive edge-triggered flip-flops

File Size 85.09K  /  10 Page

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